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Join Keysight at EuMW 2017
EuMW 2017 is coming soon

研讨会

Tutorials in Signal Integrity - Webcast Library
Upcoming, live webcasts and past, on-demand webcasts.

网上直播

USB Type-C Physical Layer Design Webcast
Live broadcast November 9, 2017; 10am PT / 1pm ET

网上直播 -- 已存档的

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

研讨会演示 2017-08-14

Join Keysight Technologies at MWC Americas 2017
MWC Americas September 12-14, 2017; San Francisco, CA

展览会

The New Re-centering Solution in MBP 2017 Update 1
A preview of the up-coming new re-centering function for re-centering an existing model to a new specification, with fully customizable device targets definition and scaling graph visualization.

研讨会演示 2017-08-10

PDF PDF 1.39 MB
How to Extract BSIM4 DC Model
Model Builder Program(MBP) 2017 improves the model extraction process through the use of special utilities and scripting. This new, improved modeling process will be demonstrated on a BSIM4 transistor.

研讨会演示 2017-08-10

PDF PDF 955 KB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

研讨会演示 2017-08-10

PDF PDF 2.41 MB
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

研讨会演示 2017-08-10

PDF PDF 1.44 MB
Python-driven Table Generation in Automated Device Model Validation
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

研讨会演示 2017-08-10

PDF PDF 2.41 MB
Be Prepared for Next Generation MIPI Physical Layer Design and Evaluation Webcast
Live broadcast August 24, 2017; 10am PT / 1pm ET

网上直播

What's New in Keysight Technologies' Device Modeling Portfolio 2017
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

研讨会演示 2017-08-10

PDF PDF 3.19 MB
RF and Microwave Measurement Insights
Hotspots RF English

研讨会

Keysight EEsof EDA Training Course Calendar EUROPE
Scheduled Keysight EEsof courses for EMEAI

课堂培训

HF/Mikro­wellen­-Messungen
Hotspots RF German main event

研讨会

是德科技 EEsof EDA 客户培训和服务
是德科技 EDA 客户培训和服务简介。

培训资料 2017-08-08

Design and Simulation of 5G 28-GHz Phased Array Transceiver Webcast
August 3, 2017

网上直播 -- 已存档的

Join Keysight at ECOC 2017
Join Keysight at ECOC 2017

研讨会

Les mesures de dispositifs pour l’Internet des objets (IoT)
Hotspots IoT FRENCH Main Event

研讨会

Messungen an IoT-Produkten (Internet of Things)
Hotspots IoT German Main Event

研讨会

IoT Devices Measurement Insights
Hotspots IoT ENGLISH Main event

研讨会

Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

网上直播

Design and Simulation of 5G 28-GHz Phased Array Transceiver Slides
Slides from the August 3, 2017 webcast

研讨会演示 2017-08-03

PDF PDF 8.17 MB
Digitale Messungen
Hotspots Digital German main event

研讨会

Kalibrierung und die Qual der Wahl
Hotspots Services GERMAN Main Event

研讨会

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