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Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Application Note 2015-04-28

PDF PDF 967 KB
Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

Press Materials 2015-04-28

Using a Manufacturer's Specification as a Type B Error Contribution - White Paper
Examines the implications of using a manufacturer's specification in an uncertainty analysis; and how calibration laboratories use uncertainty data in their quality systems and customer-facing documents.

Application Note 2015-04-27

PDF PDF 1.03 MB
81133A and 81134A, 3.35 GHz Pulse Pattern Generators - Data Sheet
81133A and 81134A 3.35 GHz Pulse Pattern Generators. The need for pulse and pattern generation is fundamental to any device characterization task.The ability to emulate the pulse and pattern conditions to which the device will be subjected is essential.This emulation should include both typical and worst case conditions.Such accurate emulation requires superlative signal integrity and timing performance along with full control over parameters that allow specific worst case testing.

Data Sheet 2015-04-27

PDF PDF 1.60 MB
Isolating Frequency Measurement Error and Sourcing Frequency by Robert Leiby
When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.

Application Note 2015-04-27

PDF PDF 3.09 MB
Measuring Dielectric Properties using Keysight's Materials Measurement Solutions - Brochure
Quick guide for Keysight materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2015-04-27

PDF PDF 1.66 MB
89600 VSA Software Help Documentation
89600 VSA software web viewable documentation Version 19.50.

Help File 2015-04-27

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2015-04-27

Keysight Technologies Oscilloscopefor Industry Standards - Poster
See how Keysight oscilloscopes are engineered for fast, technology-specific insights with this poster showing supported industry standard measurements and their compatible Keysight oscilloscopes.

Selection Guide 2015-04-27

PDF PDF 4.15 MB
86100A/B/C/D Infiniium DCA Programmer's Guide
86100A/B/C/D Infiniium DCA Programmer's Guide for legacy UI. For FlexDCA use 86100D Online Help.

Programming and Syntax Guide 2015-04-27

PDF PDF 1.97 MB
Characterizing Coils in Wireless Charging Systems Using the E4980A/AL LCR Meter - Application Note
This note describes how Keysight E4980A/AL Precision LCR meters are suitable for characterizing the coils which is the most commonly used component in the wireless charging system.

Application Note 2015-04-26

PDF PDF 418 KB
89600 VSA and 89600 WLA Software Revision History
Software version 19.50 (April 2015)

Release Notes 2015-04-24

PDF PDF 159 KB
M9391A PXIe Vector Signal Analyzer and M9381A PXIe Vector Signal Generator - Programming Guide
This programming guide is intended for individuals who write and run programs to control test-and measurement instruments. Specifically, in this programming guide, you will learn how to use Visual Studio 2008 with the .NET Framework to write IVI-COM Console Applications in Visual C#. Knowledge of Visual Studio 2008 with the .NET Framework and knowledge of the programming syntax for Visual C# is required.

Programming and Syntax Guide 2015-04-24

PDF PDF 4.43 MB
M9391A PXIe Vector Signal Analyzer 1 MHz to 3 GHz or 6 GHz Soft Front Panel - Help File
(Extract this zipped file to a local drive.) Help system for the M9391A PXIe Vector Signal Analyzer Soft Front Panel (SFP). Includes product introduction, tour of the SFP UI, how-to procedures (connect to instruments and modules, check instrument status, conduct a self-test, conduct an operational check, perform alignments, reset to factory settings, and view and clear error conditions.)

Help File 2015-04-24

ZIP ZIP 26.10 MB
M9381A PXIe VSG and M9380A CW Source LabVIEW Driver Reference
(Extract this zipped file to a local drive.) Reference documentation for the M9381A PXIe Vector Signal Generator LabVIEW driver. Includes detailed API documentation of all driver functions.

Help File 2015-04-24

ZIP ZIP 4.66 MB
M9391A PXIe Vector Signal Analyzer LabVIEW - Help File
(Extract this zipped file to a local drive.) Help system for the M9391A PXIe Vector Signal Analyzer LabVIEW driver. Includes detailed API documentation of all driver functions.

Help File 2015-04-24

ZIP ZIP 6.24 MB
M9380A Soft Front Panel Help System
(Extract this zipped file to a local drive.) Help system for the M9380A PXIe CW Source Soft Front Panel (SFP). Includes product introduction, tour of the SFP UI, how-to procedures (self test, operational check, updates to software, hardware and firmware, etc.), and troubleshooting.

Help File 2015-04-24

ZIP ZIP 25.84 MB
Getting the Calibration You Need - Application Note
Calibration is the process of measuring the actual performance of an IUT using lab instruments that have significantly better performance than the IUT. Selecting the right calibration provider is key.

Application Note 2015-04-24

Calibration Process Innovation Using Non-Required Guard Banded Testing by Richard Ogg
Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.

Application Note 2015-04-24

PDF PDF 258 KB
M9381A Soft Front Panel Help System
(Extract this zipped file to a local drive.) Help system for the M9381A PXIe Vector Signal Generator Soft Front Panel (SFP). Includes product introduction, tour of the SFP UI, how-to procedures (self test, operational check, updates to software, hardware and firmware, etc.), and troubleshooting.

Help File 2015-04-24

ZIP ZIP 40.25 MB
M9300A LabVIEW Driver Reference
(Extract this zipped file to a local drive.) Reference documentation for the M9300A PXIe Frequency Reference IVI driver. Includes detailed API documentation of all driver functions.

Help File 2015-04-24

ZIP ZIP 3.04 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

PDF PDF 2.22 MB
Qualitative Assessment on the Effects of Damage Connectors & Interfaces in Fiber Optic Measurements
To qualify or predict the effects of damaged fiber optic connectors or optical interfaces, a qualitative assessment can ensure that these connectors are kept in a condition of optimum performance.

Application Note 2015-04-24

PDF PDF 3.18 MB
M9300A Soft Front Panel Help System
(Extract this zipped file to a local drive.) Help system for the M9300A PXIe Frequency Reference Soft Front Panel (SFP). Includes product introduction, tour of the SFP UI, how-to procedures (self test, operational check, updates to software, hardware and firmware, etc.), and troubleshooting.

Help File 2015-04-24

ZIP ZIP 24.30 MB
M9380A and M9381A SCPI Reference
(Extract this zipped file to a local drive.) Reference documentation for the M9380A CW Source and M9381 VSG SCPI interface. Includes detailed API documentation of all functions.

Help File 2015-04-24

ZIP ZIP 26.29 MB

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