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Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

应用说明 2015-03-24

PDF PDF 1.52 MB
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

文章 2015-03-24

N9079A & W9079A TD-SCDMA X-Series Measurement Application - Technical Overview
The N9079A & W9079A X-Series measurement application adds one-button, standard-based power and modulation analysis for the design and manufacturing of TD-SCDMA devices.

技术总览 2015-03-24

PDF PDF 2.91 MB
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication Applications

新闻资料 2015-03-24

Press Releases | About Keysight
Keysight news and resources - Press Releases

新闻资料 2015-03-24

Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

应用说明 2015-03-24

PDF PDF 9.75 MB
Extended Service Period Solutions - Brochure
Keysight offers a variety of service and replacement options for thousands of older, critical instruments, including trade-ins, premium used equipment, and Extended Service Period Repair and Cal.

手册 2015-03-24

PDF PDF 525 KB
E4982A LCR Meter 1 MHz to 3 GHz - Data Sheet
This literature is a data sheet of the E4982A. It describes the technical specifications of the E4982A.

产品资料 2015-03-24

PDF PDF 777 KB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

应用说明 2015-03-24

PDF PDF 644 KB
33391C Microwave Insulator (Bead) Assembly - Data Sheet
This data sheet describes the 33391C Microwave Insulator Assembly. It includes product features, description and technical specifications as well as mechanical drawings and SWR chart.

产品资料 2015-03-23

PDF PDF 236 KB
Extended Service Period Solution
Keysight’s knowledge and expertise provide three key benefits when it comes to per-incident services on products beyond their end-of-support date.

手册 2015-03-23

PDF PDF 505 KB
7500 STM Scanner - Data Sheet

产品资料 2015-03-23

PDF PDF 104 KB
E5071C-TDR Application Software Revision History

发布说明 2015-03-23

PDF PDF 98 KB
E8257D PSG Microwave Analog Signal Generator - Data Sheet
This datasheet includes information on the E8257D PSG RF Analog Signal Generator.

产品资料 2015-03-23

PDF PDF 3.92 MB
SATA Stimulus Remote Setup Guide
This document describes the steps to setup the stimulus remotely for the N5411B SATA6G Compliance Test Software.

基本演示 2015-03-23

PDF PDF 485 KB
Measure Parasitic Capacitance and Inductance Using TDR - White Paper
Time-domain reflectometry (TDR) is commonly used as a convenient method of determining the characteristic impedance of a transmission line or quantifiying reflections caused by discontinuities along or at the termination of a transmission line. TDR can also be used to measure quantities such as the input capacitiance of a voltage probe, the inductance of a jumper wire, the end-to-end capacitance of a resistor, or the effective loading of a PCI card.

技术总览 2015-03-23

PDF PDF 1.58 MB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

应用说明 2015-03-23

PDF PDF 5.80 MB
SAS-3 Stimulus Remote Setup Guide
This document describes the steps to setup the stimulus remotely for the N5412D SAS-3 Compliance Test Software.

基本演示 2015-03-23

PDF PDF 360 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

应用说明 2015-03-22

PDF PDF 1.02 MB
Probing Solutions for Logic Analyzers - Data Sheet
A total overview of the probing solutions for logic analyzer applications. In addition, technical information is provided to help the customer understand how these probes are deployed.

产品资料 2015-03-20

Signal Studio for Custom Modulation for N7608B Online Documentation (.chm file)
Downloadable online documentation that includes technical overview, release notes, tutorials, installation information, and more.

帮助文件 2015-03-20

Technical Support Documents & Examples
A database of technical support documents, solutions, and examples written by support engineers.

参考指南 2015-03-20

Keysight 89600 VSA Software Supports Standard-Compliant Modulation Analysis of DOCSIS 3.1
Keysight Technologies, Inc. today announced a new option for its industry-leading 89600 VSA software, enabling standard-compliant downstream modulation analysis of version 3.1 of the Data Over Cable Service Interface Specification (DOCSIS 3.1). Option BHM provides decoding of physical-layer link channel (PLC) information and measurements of modulation error ratio (MER) and bit error rate (BER).

新闻资料 2015-03-20

Windows 7 Upgrade Kits for 16800 Series, 16901A and 16902B Logic Analyzers - Data Sheet
Windows 7 upgrade kit options are available to replace an existing Intel 915GUX motherboard or Adlink M880 motherboard with an Adlink M890 motherboard and supply a new imaged HDD or SSD.

产品资料 2015-03-20

PDF PDF 186 KB
B2900A Series Precision Source/Measure Unit - Brochure
This brochure introduces the superior performance and rapid measurement results of the B2900A series precision source/measure unit.

手册 2015-03-20

PDF PDF 1.68 MB

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