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In-circuit Test Systems - 3070 ICT

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Boundary Scan Webcast Series
Live and on-demand webcasts

Webcast

Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast
Live broadcast November 13, 2014; 9am PT / 12pm ET

Webcast

Common DFT guidelines for implementing boundary scan on limited access boards webcast
Original broadcast September 11, 2014

Webcast - recorded

Testing DDR on limited access boards using boundary scan silicon nails
Live broadcast October 30, 2014; 9am PT / 12pm ET

Webcast

Best practices in implementing boundary scan on limited access boards
Live broadcast December 18, 2014; 9am PT / 12pm ET

Webcast

Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains
Live broadcast October 9, 2014; 9am PT / 12pm ET

Webcast

Extending boundary scan tests to improve test coverage of limited access boards webcast
Live broadcast September 25, 2014; 9am PT / 12pm ET

Webcast

Testing limited access SSD boards with boundary scan and external instruments webcast
Live broadcast December 4, 2014; 9am PT / 12pm ET

Webcast

N1125A x1149 Boundary Scan Analyzer
Electrical structural test and programming tool based on IEEE 1149.x standards for boundary scan / JTAG technology.

Product/Service 2014-08-20

Medalist i1000D Small Foot Print In-Circuit Test - Technical Overview
The Keysight Medalist i1000D is now fully automated with in-line capabilities. It is the smallest foot print in-circuit tester for PCBA lines.

Technical Overview 2014-08-03

The World’s Highest Pin Count In-Circuit Test Solutions - Brochure
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2014-08-03

PDF PDF 249 KB
Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

PDF PDF 195 KB
Keysight Medalist i3070 In-Circuit Test System Onsite Calibration Service
This flyer explains why calibration is one of the critical factors that will help maintain the accuracy and repeatability of your Medalist i3070 ICT system.

Brochure 2014-07-31

PDF PDF 54 KB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Maximize Your Keysight AXI Coverage with Flexible Pricing - Brochure
This flyer describes the different support options Keysight AXI users can select from to ensure peace of mind for covering the support needs of their 5DX and x6000 investments.

Brochure 2014-07-31

PDF PDF 141 KB
Keysight i3070 Inline PLC Software Release
Keysight i3070 Inline PLC Software Release
Previous Versions

Instrument Firmware/Software Current Version: 1.46 | 2014-07-01

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Automated Test / Board Test User Groups (ATUG)
These User Group meetings (ATUG) are held at various cities across the US.

Seminar

Medalist i3070 Webex Tutorial Series
Live and recorded Webex presentations

Webcast - recorded

Boundary Scan for Testing On-Board DDRs Webcast
Original broadcast October 22, 2013

Webcast - recorded

Medalist i3070 Series 5i inline ICT system help
Keysight's Medalist i3070 Series 5i Inline In- Circuit Test (ICT) system is designed to bring all the industry- leading ICT technologies into a fully automated manufacturing line.

Help File 2014-05-02

PDF PDF 19.86 MB
Medalist i3070 Series 5i inline ICT system uncrating instructions
Medalist i3070 Series 5i inline ICT system uncrating procedure

Quick Start Guide 2014-05-02

PDF PDF 742 KB
Keysight TS-5400 Series II Developers Training
This class is an introduction to TestExec SL and the TS5400 series library’s. Topics covered include hardware and software architecture, built in diagnostic routines and hands on use of the TS5400 series platform.

Classroom Training

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