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In-circuit Test Systems - 3070 ICT

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Making Boundary Scan Easy - Article Reprint
Testing boundary scan devices no longer need be a laborious task.

Article 2016-02-03

PDF PDF 217 KB
Testing of Small Form-Factor Products - Article Reprint
Boundary scan and embedded test will need to make up for ICT gaps.

Article 2016-02-03

PDF PDF 546 KB
Automating In-Circuit Test - Article Reprint
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

Article 2016-02-02

PDF PDF 87 KB
2016 IPC APEX EXPO Conference and Exhibition
March 15 - 17, 2016; Las Vegas Convention Center

Tradeshow

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2016-01-21

PDF PDF 1.99 MB
Removing the Human Touch – It’s Time ICT Goes Fully Automated Webcast Series
2015 webcast series

Webcast

Keysight i3070 09.00px Software Release
Keysight Technologies is pleased to introduce the i3070 09.00px software release for existing i3070 series of in-circuit testers.
Previous Versions

Instrument Firmware/Software Current Version: 09.00pa | 2015-11-05

U9406A i1000D for IPTE MFT19 Handler
Keysight i1000D integrated with the MFT19 Multi-Functional Test handler. It provides flexible inline ICT automated solution from single engine ICT to a parallel or asynchronized test.

Product/Service 2015-11-04

Automated ICT Systems
With 30+ years of automated in-circuit test experiences, Keysight offers the most complete inline automated in-circuit test solutions. Including internally and externally integrated inline handlers in the smallest form factor.

Product/Service 2015-11-04

Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

Application Note 2015-10-30

PDF PDF 6.31 MB
Keysight x1149 Boundary Scan Analyzer 1.4.0.0 Software Release
Keysight Technologies is pleased to introduce the latest software release 1.4.0.0 for x1149 Boundary Scan Analyzer. This is a major release with many features and tools added to enhance your experience in the development, debug and execution of tests especially for Network Communication boards. The objective is to enable you to get the Best Coverage at Lightning Speed. At no additional cost, this release is available to all current users of the x1149. Whether you are a developer or a production support engineer, you will see new value with this release. Best coverage is achieved by increasing the support of IEEE 1149.6 capabilities and automatically adding loopback tests where possible.
Previous Versions

Computer Software Current Version: 1.4.0.0 | 2015-09-11

5DX Extended Support Plan FAQs
Extended Support Plan – 5DX Automated X-Ray Inspection

FAQ 2015-09-04

DesignCon 2015
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

Tradeshow

Barcode Strategy Considerations When Using the Keysight i3070 Inline In-circuit Test Solution
This application note highlights the different options for positioning barcode readers on Keysight i3070 inline in-circuit test solution.

Application Note 2015-08-21

PDF PDF 226 KB
E9901E 1-module In-Circuit Test (ICT) System, i327x Series 5
The E9901E offers max 1296 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

Product/Service 2015-07-29

U9402A Medalist i1000S [Discontinued]
The U9402A is an affordable in-circuit test (ICT) system that employs a vacuum type fixture and a mechanical fixture lock-down system using electrical motors.

Product/Service 2015-07-28

U9401A Medalist i1000P [Discontinued]
The U9401A is a cost effective in-circuit test (ICT) system that provides users with an affordable option which accepts a typical MDA-type fixture with cable connections.

Product/Service 2015-07-28

In-circuit Test Systems - 3070 ICT
Keysight’s Medalist Test and Inspection family includes breakthrough technologiesi3070 In-Circuit test (ICT), plus system software and services.

Product/Service 2015-07-28

“Shotgunning”, a Bad Fit for Lead-Free Test
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2015-07-14

PDF PDF 99 KB
Medalist i3070 Webex Tutorial Series
Live and recorded Webex presentations

Webcast - recorded

A Bead Probe CAD Strategy for In-Circuit Test - White Paper
IEEE article reprint discussing the potential of using bead probes in computer aided design (CAD) systems when getting a board ready for production.

Article 2015-06-08

PDF PDF 1.46 MB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2015-06-08

PDF PDF 1.86 MB
Automated Test / Board Test User Groups (ATUG)
These User Group meetings (ATUG) are held at various cities across the US.

Seminar

Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

Application Note 2015-05-26

PDF PDF 1.67 MB
Understanding the Operation and Usage of Manufacturing Execution Systems - Technical Overview
This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications

Technical Overview 2015-04-28

PDF PDF 1.81 MB

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