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The Keysight Panel Test and Throughput Multiplier Advantage - Technical Overview
Many have tried to emulate the Keysight Panel Test and Throughput Multiplier capabilities, yet our advantage remains in providing matchless high throughput and low total cost of ownership.

Technical Overview 2017-07-13

i3070 Inline ICT Improves Functional Test Yield of SSDs - Case Study
Find out how one customer reported first pass yield results of more than 95% with less than 0.5% false failures, after installing the i3070 Series 5 Inline ICT systems.

Case Study 2017-07-10

Automated Test / Board Test User Groups (ATUG)
These User Group meetings (ATUG) are held at various cities across the US.


Medalist i3070 Test Throughput Optimization - Application Note
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

i3070 Series 5i Inline In-Circuit Test System – Data Sheet
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

Data Sheet 2017-06-15

Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements - Flyer
This one-pager contains an overview of Keysight i3070 Upgrade Support Agreements to better preserve your investment and enhance test capabilities on your i3070.

Brochure 2017-06-05

In-circuit Test > Medalist i1000 Systems
The Keysight Medalist i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution which now comes with digital testing capabilities while maintaining its original low-cost fixture solution.

Product/Service 2017-05-25

In-circuit Test > Medalist i3070 Systems
The Medalist i3070, the next generation In-Circuit Test System, enables 20% more output with unparalleled test coverage and robustness, extending the performance of the world's most proven ICT System.

Product/Service 2017-05-25

Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

Limited Parts Agreement
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

Brochure 2017-03-28

i3070 In-Circuit Test System Onsite Agreement - Data Sheet
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

Data Sheet 2017-03-22

Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-03-10

N1125A x1149 Boundary Scan Analyzer
Electrical structural test and programming tool based on IEEE 1149.x standards for boundary scan / JTAG technology.

Product/Service 2017-03-08

x1149 Boundary Scan Solution for Blade Server Board - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-03-02

E9988EL In-Line 2-Module In-Circuit Test System; i337x, Series 5i
The E9988EL offers max 2592 nodes testing, on a slimmer footprint. Built to stringent specifications for SMEMA compatibility, it is easily integrated into existing SMT lines.

Product/Service 2017-02-16

Understanding x1149 Integrity Test - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-02-16

i3070 Log Record Format
The i3070 is an in-circuit test system that outputs text log files for each board tested. This document describes the format and syntax of these log record files in order to understand how to read the files.

Help File 2017-02-10

N1128A-001 i3070 LED Test Box
The N1128A-001 i3070 LED Test Box connects to the i3070 controller LAN to enable Keysight’s proprietary LED test on i3070.

Product/Service 2017-01-27

N1124A-003 i3070 LED Test Card
The N1124A-003 i3070 LED Test Card is a plug-in module to the Utility Card (N1807A-001) to enable Keysight’s proprietary LED test on i3070.

Product/Service 2017-01-27

System Uptime Support Services
Professional, localized uptime support and end-to-end services that address real-world manufacturing challenges.

Product/Service 2017-01-17

Learn to Balance the Performance/Cost Scale for Functional Test, Switching and Data Acquisition
Original broadcast January 10, 2017

Webcast - recorded

E9905EL 2-Module In-Circuit Test (ICT) system, i307x series 5
The E9905EL i307x Series 5 is designed on a slimmer footprint to meet the needs of most mainstream electronics manufacturers with in-circuit test requirements in a reduced size testhead.

Product/Service 2016-12-15

In-circuit Test Systems
In-circuit Test Systems - 3070 ICT

Product/Service 2016-12-14

i3070 09.01p Software Release
The Keysight i3070 In-Circuit Test Systems' software version 09.01p has been released with various enhancements and new features. Please refer to the Release Notes for details.
Previous Versions

Computer Software Current Version: 09.01p | 2016-12-02

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