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Rehost Service for Keysight ICT, AXI and AOI systems
Rehost service is included as part of Keysight support agreement for hardware support or software subscription service.

专访 2016-11-10

Integrating Multiple Technology Devices onto Laminate-Based MCMs Using an Integrated Design Flow
An overview of a fully-integrated design flow is used to demonstrate a viable solution for the assembly and design optimization of multiple RF MCM products.

专访 2016-10-24

E Pluribus Unum: An Integrated Design Flow for Phased Arrays
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

专访 2016-07-20

Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

专访 2015-10-28

Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

专访 2014-07-31

PDF PDF 155 KB
PCBA 测试领域获奖里程碑

专访 2013-10-09

安捷伦教育领域新闻
安捷伦教育领域新闻

专访 2012-12-10

Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification
With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection.

专访 2012-12-06

PDF PDF 105 KB
安捷伦仪器为世界级电气工程教学实验室提供动力

专访 2012-07-16

爆米花和示波器!

专访 2012-07-16

NASA Tech Brief Article: Software Defined Instruments Address Mixed-Signal Test Challenges of Today
Software Defined Instruments Address Mixed-Signal Test Challenges of Today.

专访 2012-07-13

实验室使我的工作变得简单

专访 2012-07-11

Agilent PCBA Test Award-winning Milestones

专访 2012-03-26

High-Speed Data Throughput Test
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

专访 2011-11-29

Ultra-wideband radar system design article in EE Times

专访 2011-07-27

Wideband Radar + SATCOM Measurements
Growing trends in SATCOM and radar systems in the A/D market.

专访 2011-01-12

8PSK Modulation Accuracy Measurement Graphics

专访 2010-10-12

Defining a New Methodology for Radar System Design
Article from Microwave Product Digest, October 2010, discussing the use of analysis suites for the design of advanced digital signal processing techniques.

专访 2010-10-01

Real-World Battery Drain Analysis
Go beyond Talk Time Test! Test the battery life of your data device using realistic user scenarios to ensure real-world operation meets user expectations with the 8960, 14565B and IFT software.

专访 2010-08-30

教育新闻
教育新闻

专访 2010-07-08

Boundary Scan / JTAG
This article explains what boundary scan is and the role of the Joint Test Action Group, more commonly known as JTAG.

专访 2010-04-21

Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3

专访 2010-03-09

TestSight Developer
TestSight® Developer is the most cost effective CAD conversion solution in the market for Agilent Medalist i3070 and Medalist i1000.

专访 2010-01-22

Mentor Graphics Support of CAMCAD Pro - Letter
Letter: Agilent has decided to end its Reseller Contract with Mentor Graphics on Sales and Support of CAMCAD Pro to our customers. CAMCAD Pro converts CAD format to AOI, AXI and ICT input modules, and is a Mentor Graphics product.

专访 2010-01-07

PDF PDF 62 KB
New Solutions Put Wireless To The Test
Pulbished with kind permission of Mobile Dev & Design

专访 2009-06-11

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