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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.

Application Note 2013-04-29

PDF PDF 1.32 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2013-04-24

PDF PDF 2.02 MB
Overvoltage Protection in Power Supplies - Application Note
This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications

Application Note 2013-04-18

PDF PDF 832 KB
Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
How to Read Your DC Power Supply's Data Sheet - Application Note
Understanding how to sort through key power supply specifications in a data sheet can simplify product selection.

Application Note 2013-04-16

High-speed digitizer modules capture details from single-shot events

Application Note 2013-04-16

Signal processing can reduce data bandwidth through peak detection

Application Note 2013-04-16

High-speed ADC chipsets set the pace in real-time monitoring and control

Application Note 2013-04-16

Radar Distance Test to Airborne Planes - Application Note
Keysight pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Tensile Testing of Fibers using Keysight T150 UTM Quasi-static Tensile Test
The Keysight T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers

Application Note 2013-04-08

PDF PDF 188 KB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design & Test - Application Note
This solution brief will show Keysight Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.

Application Note 2013-04-05

PDF PDF 748 KB
Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.

Application Note 2013-04-03

Oscilloscope Selection Tip 8: Serial Bus Applications - Application Note
Tip 8: Select a scope that can trigger on and decode serial buses to help you debug your designs faster.

Application Note 2013-04-02

PDF PDF 881 KB
Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Keysight’s broad range of ESL applications, design functions and product areas.

Application Note 2013-04-02

Oscilloscope Selection Tip 3: Acquisition Memory
Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution.

Application Note 2013-04-02

Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

Application Note 2013-04-01

PDF PDF 476 KB
Viewing Graphical Results on a DMM Display - Application Note
The 34461A offers a way to get insight into your measurement data without transferring your data to a PC.

Application Note 2013-03-30

Making Reflection Measurements - Application Note
The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement.

Application Note 2013-03-29

Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2013-03-28

PDF PDF 8.17 MB
Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.

Application Note 2013-03-27

PDF PDF 1.48 MB
Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note
One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms.

Application Note 2013-03-27

PDF PDF 1.67 MB
A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology. The transceiver uses an on-off-keying UWB pulse modulation and is packaged in a standard QFN48L pre-molded cavity package with removable lid. The transceiver performances at 60-GHz was evaluated using the full wave 3D electromagnetic and the circuit cosimulation.

Application Note 2013-03-25

Improved AC Measurements Using Digital Multimeters - Application Note
When you use a digital multimeter to measure AC voltages, it is important to know how your DMM makes the measurements and understand your instrument's limitations.

Application Note 2013-03-22

Improving Digital Multimeter Throughput - Application Note
Whether your electronic test is in a manufacturing, design validation, or R&D environment, reducing your test time translates to lower cost and shortened product development schedules, both of which are clear benefits.

Application Note 2013-03-22

MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 5.63 MB

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