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Electronic Measurement

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Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

Application Note 2014-03-07

Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Application Note 2014-03-04

CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2014-03-03

Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
Learn about probing the hi-speed USB 2.0 serial bus and see some unique debugging tools and capabilities that can help you get your embedded designs to market faster.

Application Note 2014-03-03

Simulating Signals with the Highest Integrity – Application Brief
Learn how Trueform waveform generators allow you to accurately represent your signals without the weaknesses of DDS with this 4-page application brief.

Application Note 2014-02-28

Achieving Excellent Spectrum Analysis Results Using Innovative Noise, Image and Spur-Suppression
This application note reveals innovative techniques for dramatically reducing images and spurs using a non-preselected VSA to achieve high speed, low noise floor & excellent dynamic range.

Application Note 2014-02-27

High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-02-26

Overcoming the Challenges of Simulating Phased-Array Radar Systems
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Application Note 2014-02-26

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Application Note 2014-02-17

U2000 and U8480 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Application Note 2014-02-14

Solutions for Millimeter Wave Wireless Backhaul - Application Note
This “Solutions for Millimeter Wave Wireless Backhaul” app note gives insight into designing and testing E-band backhaul using effective network analysis, and signal generation and analysis solutions.

Application Note 2014-02-14

U2020 X-Series USB Sensor Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for U2020 X-Series.

Application Note 2014-02-14

Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note
New advances in signal processing provide improvements in sweep speeds by implementing a new type of digital RBW filter in X-Series signal analyzers. This application note focuses on these new improvements.

Application Note 2014-02-11

Download the latest AWG Application Notes
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2014-02-10

IV Characterizations of Solar Cells Using the Keysight B2900A Series of SMUs - Technical Overview
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2014-02-10

On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Application Note 2014-02-06

Generating radar pulses with maximum bandwidth – Application Brief
This app brief presents compression methods for the M8190A that provide suitably wide bandwidths applications: idle insertion, digital upconversion and DSP-based modification ensuring long playtime.

Application Note 2014-01-29

Performing a Precision ADC Evaluation Using a Low Noise DC Source - Application Note
This 6-page application note introduces the Keysight B2962A 6.5 Digit Low Noise Power Source which is suitable for the application requiring low noise power supply such as ADC Evaluation.

Application Note 2014-01-28

Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2014-01-27

Why Migrate from HP/Keysight 432A/B to Keysight N432A Thermistor Power Meter? – Application Note
Seven Reasons to Migrate from 432A/B to N432A Thermistor Power Meter.

Application Note 2014-01-24

Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Application Note 2014-01-24

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

PCI Express® 1.0 Protocol Test - Application Note
Protocol Analyzer and Exerciser for PCI Express

Application Note 2014-01-20

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