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Electronic Measurement

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Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

Application Note 2013-04-01

PDF PDF 476 KB
Viewing Graphical Results on a DMM Display - Application Note
The 34461A offers a way to get insight into your measurement data without transferring your data to a PC.

Application Note 2013-03-30

Making Reflection Measurements - Application Note
The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement.

Application Note 2013-03-29

A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology. The transceiver uses an on-off-keying UWB pulse modulation and is packaged in a standard QFN48L pre-molded cavity package with removable lid. The transceiver performances at 60-GHz was evaluated using the full wave 3D electromagnetic and the circuit cosimulation.

Application Note 2013-03-25

Improved AC Measurements Using Digital Multimeters - Application Note
When you use a digital multimeter to measure AC voltages, it is important to know how your DMM makes the measurements and understand your instrument's limitations.

Application Note 2013-03-22

Improving Digital Multimeter Throughput - Application Note
Whether your electronic test is in a manufacturing, design validation, or R&D environment, reducing your test time translates to lower cost and shortened product development schedules, both of which are clear benefits.

Application Note 2013-03-22

MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 5.63 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 7.99 MB
Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2013-03-19

PDF PDF 919 KB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

Application Note 2013-03-14

Making Stimulus/Response Measurements - Application Note
The N9322C basic spectrum analyzer is a dual use RF analyzer, which performs frequency-selective power analysis and component-level characterization when used with the optional tracking generator.

Application Note 2013-03-14

PDF PDF 3.88 MB
High-speed digitizer selection depends on more than banner specifications

Application Note 2013-03-13

How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2013-03-13

PDF PDF 384 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2013-03-12

PDF PDF 312 KB
Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note
With high-performance instrumentation and accessories pushing the envelope of advanced high-frequency applications, it is now more crucial than ever for engineers to select the right test accessories.

Application Note 2013-03-06

PDF PDF 1.12 MB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
Exploring Phase Noise Measurement Methods and Techniques - Application Note
This note provides a heuristic overview of phase noise fundamentals before describing the three most common measurement techniques and where they apply.

Application Note 2013-03-04

PDF PDF 1.50 MB
DVB-T and DVB-T2 Transmitter Test Challenges - Application Note
This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of transmitters for these systems.

Application Note 2013-02-27

PDF PDF 986 KB
Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

PDF PDF 623 KB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

Application Note 2013-02-19

Keysight Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-18

PDF PDF 1.29 MB
Keysight Method of Implementation (MOI) for MHL Cables Compliance Tests
Keysight Method of Implementation (MOI) for MHL Cable Compliance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-14

Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB

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