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Electronic Measurement

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Connecting Data Acquisition Systems to a Wireless Network - Application Brief
Learn how you can configure and take advantage of the latest router technology with either the 34972A DAQ system or any LXI instrument.

Application Note 2014-08-30

PDF PDF 659 KB
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR

Application Note 2014-08-28

PDF PDF 1.99 MB
Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-08-27

Designing Automated Tests Using Powerful Digital Acquisition Systems - Application Brief
Learn how the 34970A/34972A DAQ system offers the versatility and powerful functionality you need to solve your most pressing test challenges.

Application Note 2014-08-27

PDF PDF 351 KB
Stiffness Mapping: a Dynamic Imaging Technique - Application Note
Review of stiffness mapping methods using a dynamic imaging.

Application Note 2014-08-22

PDF PDF 587 KB
Quickly Identify Thermal Measurement Points For Data Acquisition - Application Brief
Temperature monitoring is a process that traditionally involves an amount of guess work. Learn how a thermal imaging camera can be used to quickly and easily identify temperature problem areas.

Application Note 2014-08-22

Radar Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 6.84 MB
Solutions for Implementing Envelope Tracking in Power Amplifiers - Application Note
This “Solutions for Implementing Envelope Tracking in PAs” app note gives insight into fast and efficient configuration and test of ET systems from R&D to design verification and into production.

Application Note 2014-08-22

Average Power Sensor Uncertainty Calculator Rev9
Average Power Sensor Uncertainty Calculator Rev9

Application Note 2014-08-19

XLS XLS 82 KB
Understanding Measurement Risk - White Paper
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

Application Note 2014-08-12

PDF PDF 735 KB
Analyzing Frequency Stability in the Frequency and Time Domains - Application Note
Describes both methods with an emphasis on practical, cost-effective solutions. For those who are new to the time-domain perspective, two proven frequency-to-time conversion methods are also presented.

Application Note 2014-08-11

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Application Note
This document describes six major factors that determine the POI value and relative amplitude: sampling rate, time-record length, windowing function, window size, overlap processing, and noise floor.

Application Note 2014-08-04

PDF PDF 2.53 MB
Achieving Accurate E-band Power Measurement with Keysight E8486A Waveguide Power Sensors
E-band spectrum application has been gaining more application interests in the recent years. E8486A addresses the requirement for accurate RF power measurement in the mm-wave applications.

Application Note 2014-08-04

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-08-04

Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Application Note 2014-08-04

PDF PDF 2.52 MB
Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2014-08-04

PDF PDF 1.59 MB
Materials Measurement: Liquid Materials - Application Brief
This application brief provides the solutions for measuring dielectric properties of liquid materials.

Application Note 2014-08-04

PDF PDF 1.24 MB
Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Application Note 2014-08-04

Streaming, Analysis and Playback of RF Interference Signals in AD Applications - Application Note
Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications –looks at countering undesirable signals using a system based on COTS hardware and software when intentional interference is created to disrupt the operation of a victim receiver.

Application Note 2014-08-03

TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Application Note 2014-08-03

PDF PDF 324 KB
Using RF Recording Techniques to Resolve Interference Problems - Application Note
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Application Note 2014-08-03

PDF PDF 1.96 MB
Conquering the Multi Kilowatt Source/Sink Test Challenge - Application Note
This application note discusses how the Keysight APS N6900/N7900 DC power supplies feature integrated sourcing and sinking capability tailored for the test needs of today’s bidirectional and regenerative energy systems and devices.

Application Note 2014-08-03

8990B PPA - Droop Measurement - Application Note
This application brief demonstrates the ability of the 8990B PPA with windows software to perform droop measurement using its trace graph.

Application Note 2014-08-03

PDF PDF 539 KB

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