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Optimize Power Source Integrity Under Large Load Transients - Application Note
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Application Note 2015-07-31

PDF PDF 1.37 MB
Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2015-05-29

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)

Application Note 2005-07-27

Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) - Application Note
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

Compliance Testing to the IEC/EN 61000-4-8 (AN 1319)
Electronic equipment can encounter magnetic fields at power line frequencies in a variety of places. As such, it is wise to ensure that the equipment will operate reliably when exposed to these power line frequency magnetic fields. The IEC/EN 61000-4-8 standard describes how equipment should be...

Application Note 2001-06-07

PDF PDF 307 KB
Testing Uninterruptible Power Supplies Using Keysight 6800 Series ac Power Source/Analyzers
This Product Note describes how Keysight ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

PDF PDF 430 KB
Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards (AN 1273)
Regulatory standards for AC mains phenomena are critical to maintaining the quality of ac power distribution systems. The goal of this Application Note is to provide an introduction to these standards as well as technical issues of these standards.

Application Note 2000-10-01

PDF PDF 627 KB
Increasing dc Power Supply Test System Throughput
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB
10 Hints for Using Your Power Supply to Decrease Test Time - Application Note
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12