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Electronic Measurement

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Keysight Technologies announces expanded TRX module and EXM wireless test set enhancements
Keysight Technologies Announces Expanded TRX Module and EXM Wireless Test Set Enhancements

Press Materials 2014-10-01

UXM wireless test set expands functional test capabilities, delivers greater RF design confidence

Press Materials 2014-10-01

M8195A 65GSa/s AWG – Press Release
Introduces 65-GSa/s High-Speed Arbitrary Waveform Generator

Press Materials 2014-09-12

Keysight’s EXF One-Box Tester Scales with Volume Growth, Lowers Cost of Test in Femtocell Mfg

Press Materials 2014-09-10

UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development
UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development

Press Materials 2014-08-04

Certification of HDMI 2.0 Test Solution
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices
Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices

Press Materials 2014-02-13

Agilent’s EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Press Materials 2014-02-13

Agilent Technologies Introduces HDMI 2.0 Compliance Test Software for Transmitters and Receivers
Agilent Technologies Inc. (NYSE: A) today introduced two compliance test software packages for physical-layer testing of devices that use the new High-Definition Multimedia Interface (HDMI) 2.0 specification.

Press Materials 2014-01-14

Agilent Extends the Reach of Signal Generators and Analyzers

Press Materials 2013-09-04

Press Releases for N4877A
Press Releases for N4877A

Press Materials 2013-07-16

Press Releases for M8061A
Press Releases for M8061A

Press Materials 2013-07-16

Press Releases for N4903B
Press Releases for N4903B

Press Materials 2013-07-16

Press Releases for N5990A
Press Releases for N5990A

Press Materials 2013-07-04

Agilent Technologies and Percello joint press release
Agilent Technologies Supports Percello's Femtocell SoCs Test with Chipset Software

Press Materials 2013-05-31

Press Releases for 81250
Press Releases for 81250

Press Materials 2013-05-09

Press Releases for N4917A
Press Releases for N4917A

Press Materials 2013-05-06

Press Releases for N4916B
Press Releases for N4916B

Press Materials 2013-05-06

Press Releases for N4916A
Press Releases for N4916A

Press Materials 2013-05-06

Press Releases for N2101B
Press Releases for N2101B

Press Materials 2013-05-06

Press Releases for N4876A
Press Releases for N4876A

Press Materials 2013-05-06

Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs

Press Materials 2013-04-24

Agilent Technologies Updates Reference-Class Multiwavelength Meter
Extended Recalibration Intervals Reduce Downtime and Cost of Ownership

Press Materials 2013-04-24

Introduces High-Sensitivity Multiport Optical Power Meters
Meters Combine Highest Optical Performance and Large Data Storage in Compact Platform

Press Materials 2013-04-24

Press Releases for N4960A
Press Releases for N4960A

Press Materials 2013-03-14

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