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Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

Agilent Technologies Announces 4x4 True MIMO Evolution on EXM Wireless Test Set

Press Materials 2014-05-21

Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

New Modeling, Verification Platform for Radar, Electronic Warfare
Moving Scenarios, Beamforming Accelerate Radar System Design and Validation.

Press Materials 2014-05-21

Automatic Fixture Removal Option Enables Industry's Fastest, Easiest Non-Coaxial Device Measurement

Press Materials 2014-05-20

Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Press Materials 2014-05-08

Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Press Materials 2014-04-30

Certification of HDMI 2.0 Test Solution
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test,
The solution has the widest coverage for HDMI Physical layer compliance test. Certification was achieved with the collaborative framework of Panasonic; the solution will be used at the Panasonic Authorized Test Center, in Osaka, Japan.

Press Materials 2014-04-17

Press Release for L4400 Series LXI Switch and Control Instruments
Press Release: Agilent Technologies introduces industry's first LXI Unit in switching and control.

Press Materials 2014-04-07

Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test

Press Materials 2014-04-02

Press Releases for M8000 Series
New M8000 Series of BER Test Solutions

Press Materials 2014-03-18

Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Press Materials 2014-03-13

FieldFox All-In-One Analyzer for Precision Validation of Radar System Performance in the Field

Press Materials 2014-03-12

FieldFox Provides Complete Solution for Precision Radar Performance Validation in the Field

Press Materials 2014-03-12

Agilent Technologies Unveils New 30-Second Demo Series of User-Inspired ADS 2014 Innovations
Agilent announces the launch of a new series of 30-second demos on user-inspired innovations to its Advanced Design System 2014 software, the industry’s leading electronic design automation software for RF, microwave and signal-integrity applications.

Press Materials 2014-03-06

Agilent Software Gives Students Edge in Job Market
Design tools are getting University of Arizona engineering students certifiably ready for work in the RF and microwave industry.

Press Materials 2014-02-24

ADS 2014 Dramatically Improves Design Productivity and Efficiency
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

Agilent Technologies and FIME to Deliver Advanced Test Tools for Mobile Payments
Agilent Technologies Inc. (NYSE: A) and FIME, an advanced secure-chip testing provider, have announced an agreement to work together to deliver pioneering testing solutions to the payments and telecommunications markets.

Press Materials 2014-02-18

Agilent’s EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Press Materials 2014-02-13

Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices
Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices

Press Materials 2014-02-13

Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

Press Materials 2014-02-11

Agilent Technologies’ LinkedIn ADS User Group Tops 3,000 Members
Agilent announces that the Agilent EEsof EDA Advanced Design System (ADS) user group on LinkedIn now has over 3,000 members.

Press Materials 2014-02-03

ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

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