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Agilent Technologies Releases Official SATA Revision 3.0 Test Procedures

Dossier de presse 2009-10-21

Agilent Technologies Introduces Its Highest-Resolution VME/VXS Digitizer for Defense Market

Dossier de presse 2009-10-20

Agilent Technologies' New Channel Simulator Mode Determines Ultralow Bit-Error-Rate in Seconds
Announcing the new statistical mode for the ADS signal integrity Channel Simulator.

Dossier de presse 2009-10-19

Agilent Technologies' Momentum Electromagnetic Simulator Qualified for High-Frequency Designs in TSM

Dossier de presse 2009-10-12

Agilent Technologies' SystemVue 2009.08 Unlocks RF-DSP Co-design, Custom Flow for Model-Based Design

Dossier de presse 2009-10-05

Agilent Technologies Expands Infiniium 9000 Series Lineup with 600-MHz Oscilloscopes
First Mixed-Signal Scope Supporting MIPI and SATA Applications

Dossier de presse 2009-10-01

Agilent Technologies Announces MMIC Tool Bar Personality for United Monolithic Semiconductors’ pHEMT

Dossier de presse 2009-09-30

Agilent Introduces Flexible, Low-Cost Signal Analyzers for Essential RF Measurements

Dossier de presse 2009-09-30

Agilent Introduces High-Performance Signal Analyzer for Advanced RF and Microwave Applications

Dossier de presse 2009-09-28

Agilent Technologies' Genesys Software Speeds Sennheiser's High-End Audio Receiver Development

Dossier de presse 2009-09-25

Test Solutions Support March 2009 LTE Standards
Compliance with the March 2009 release of the 3GPP Long Term Evolution (LTE) standard.

Dossier de presse 2009-09-22

Agilent Technologies Announces X-FAB’s Worldwide Adoption of IC-CAP Device Modeling Platform

Dossier de presse 2009-09-22

Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test
At the 2009 European Microwave Conference.

Dossier de presse 2009-09-22

New 3GPP LTE Baseband Exploration Library Enables Throughput Verification for Developers
LTE baseband exploration library for the SystemVue 2009 design platform.

Dossier de presse 2009-09-16

Agilent Technologies Offers Most Accurate Transceiver Characterization Solution
J-BERT Provides Complete Jitter Tolerance Characterization for Multi-Gigabit/s Digital Serial Interfaces up to 14.2 Gb/s

Dossier de presse 2009-09-14

PNA-X Press Releases

Dossier de presse 2009-09-09

PNA-L Press Releases

Dossier de presse 2009-09-09

N5264A Press Releases

Dossier de presse 2009-09-09

PNA Series Press Releases

Dossier de presse 2009-09-09

Agilent Technologies Serial ATA Backgrounder - Thorough Characterization and Validation of Serial AT

Dossier de presse 2009-09-09

NVNA Press Releases

Dossier de presse 2009-09-09

ENA Press Releases

Dossier de presse 2009-09-09

Agilent Technologies Broadens SAS, SATA Test Portfolio through Partnership with SerialTek

Dossier de presse 2009-09-09

Agilent Technologies Equipment Used to Test First Mobile WiMAX Forum®-Certified Products in China La

Dossier de presse 2009-08-31

X-parameters News
Press Releases related to Agilent's X-parameters

Dossier de presse 2009-08-21

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