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Electronic Measurement

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Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article
This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized.

Article 2012-12-01

PDF PDF 386 KB
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA

Article 2012-11-30

Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

Article 2012-11-28

PDF PDF 6.08 MB
Defining Your Calibration Requirement - White Paper
These are the steps that can be taken when actually placing an order to ensure you get a "proper" calibration.

Article 2012-11-08

PDF PDF 1.57 MB
The Ins and Outs of Microwave Signal Capture and Playback - Article Reprint
Looks at capture and playback of microwave signals and the multitude of applications in the evaluation of communications, radar and electronic warfare systems.

Article 2012-11-01

PDF PDF 758 KB
Radar, Electronic Warfare, and Electronic Intelligence Testing: Identifying Common Test Challenges
This article in Defense Technical Briefs covers common test challenges and radar basics. Radar, EW, and ELINT engineers make a variety of routine measurements. As highlighted earlier, pulse width and PRF or PRI provide important information about a radar system’s resolution and range.

Article 2012-11-01

PDF PDF 392 KB
Digital Baseband and RF Domain Integration Challenges in Radar Systems - Article Reprint
Reconfigurable radar systems employ digital technology in the form of FPGAs and DSPs.That digital technology is combined with RF technology to achieve a high level of flexibility.

Article 2012-11-01

PDF PDF 406 KB
The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

Article 2012-11-01

PDF PDF 2.44 MB
Electronic Manufacturing Test Support eNews - October 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2012-10-31

Carrying Microwave Precision Into the Field - Article Reprint
Microwave Journal, September 2012 FieldFox product feature.

Article 2012-10-22

PDF PDF 1.83 MB
Testing Interference in a Wireless Environment - Article Reprint
Identification and reduction of interference has become essential to the proper operation in all wireless systems.

Article 2012-10-22

PDF PDF 202 KB
Enabling Fast Characterization of PA Performance with Modulated Signals
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

Journal 2012-10-15

Choose the right system calibration services for your Keysight i3070/3070 In-circuit Test System
Keysight offer a range of new calibration service with and without system calibration license to use for your Keysight i3070/3070 In-circuit Test System

Case Study 2012-09-28

Article: COTS Gear Generates Multi-Emitter Test Signals
This article discusses COTS test hardware and software being used to create multi-emitter test signals using ESL design simulation software and wideband AWGs

Article 2012-09-27

Simplifying the Troubleshooting of Intercity Trains While Enhancing Worker Safety - Case Study
The Keysight Wireless Remote Connectivity Solution simplifies data logging tasks. With the free data-logging application from Keysight, the engineer can view live readings, and switch from point-to-point, or view data from up to three points simultaneously.

Case Study 2012-09-13

PDF PDF 232 KB
Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

Article 2012-08-24

PDF PDF 235 KB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

Article 2012-08-24

PDF PDF 206 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

Article 2012-08-24

PDF PDF 294 KB
Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.

Article 2012-08-24

PDF PDF 191 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

Article 2012-08-24

PDF PDF 1.04 MB
Optimize Signal/Spectrum Analyzer Throughput for High-Volume Manufacturing Test
The Microwaves & RF article discusses how to obtain the highest throughput for the analyzers used in manufacturing test by creating a test plan that accounts for speed, repeatability, and dynamic range.

Article 2012-08-20

Design, simulation and measurement automation
Link to Electronic Products and Technology article discussing the marrying of both electronic design automation (EDA) tools and processes with measurement for system level design and verification.

Article 2012-08-10

Electronic Manufacturing Test Support eNews - July 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2012-07-31

Comparing In-house and Commercial Load Solutions for Automotive Test

Article 2012-07-17

Microwave Product Digest article: New Techniques Simplify Military Frequency-Converter Characteriza
Covers the transmit and receive chains of all defense systems, ranging from EW, ECM, ESM, ELINT, and SIGINT receivers, to satellite terminals and transponders, and radar systems

Article 2012-07-13

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