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Sorting Through EM Simulators - Article Reprint
Matching an electromagnetic simulator to a particular application requires an understanding of the different simulation technologies at the heart of these software tools. Article reprint from Microwaves & RF.

Article 2012-04-01

PDF PDF 578 KB
Addressable Test Structures for MOSFET Variability Analysis
This IEEE paper presents a 4-bit addressable array-based test structure with a centre reference transistor allowing evaluation of variability in advanced technologies.

Article 2012-03-19

Defining the 4G PHY Architecture Design Challenges
EE Times design article (Part 1) on defining the 4G PHY architecture design challenges.

Journal 2011-12-05

Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.

Journal 2011-12-04

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

PDF PDF 593 KB
Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.

Article 2011-06-02

PDF PDF 1.04 MB
The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.

Article 2011-04-24

PDF PDF 1.61 MB
An Innovative and Integrated Approach to III-V Circuit Design
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

PDF PDF 360 KB
AMI models: What, why and how?
EE Times Design Article written by Sanjeev Gupta, Jose Luis Pino and Amolak Badesha of Agilent EEsof EDA.

Article 2010-10-18

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

Solving the RFIC Design for Yield and Verification Dilemma
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

How Design Software Changed the World
Microwave Jounral articles on the history of the individuals, companies and products that helped define the development of design software from 1988 to present day.

Journal 2010-07-01

Electromagnetic Interference Meets Its Match
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

Journal 2010-06-24

Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
S-parameters Without Tears
This article explains s-parameter theory and shows how to create accurate, delay-causal, and passive time-domain models by combining band-limited s-parameter data with knowledge about the physical characteristics of a component.

Journal 2010-01-25

Accelerating Advanced Node CMOS RFIC Design
Microwave Journal article by David Vye

Journal 2009-12-07

WIN Semiconductors Announces New MMIC Tool Bar Personality for ADS Process Design Kits

Newsletter 2009-10-23

X-Parameters: Commerical Implementations of the Latest Technology Enable Mainstream Applictions - Ar
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

Article 2009-10-09

PDF PDF 1.12 MB
Using a design-to-test capability for LTE MIMO
Article written for RF DesignLine by Keysight experts explains how system-level simulation helps engineers gain valuable insight into design sensitivities of LTE MIMO systems.

Case Study 2009-07-10

3D EM Simulator is Integrated with ADS to Lower the Cost of Design
With EMPro 2009, high performance time domain (FDTD) and frequency domain (FEM) EM analysis is integrated with all the other Advanced Design System (ADS) capabilities

Article 2009-06-14

PDF PDF 195.40 KB
Hit Minimum SAR With EM Software
The use of finite-difference-time-domain (FDTD) electromagnetic (EM) software can predict specific absorption rate (SAR) levels for cellular telephone antennas under different conditions.

Case Study 2009-05-19

Keysight's ADS helps SiGe Semiconductor - a Customer Success Story
A Customer Success Story by Marquis Julien (SiGe Semiconductor, Inc) on getting Silicon Germanium Bluetooth power amplifier to the market fast by using Keysight’s ADS.

Case Study 2009-04-01

PDF PDF 123 KB
Fast Multitone Analysis of RF Transceivers
This Article written by George Estep, Pete Johnson and Vladimir Veremey describes Fast Multitone analysis of RF Transceivers in detail.

Article 2009-03-24

PDF PDF 1.74 MB
Signal Integrity Simulation of PCI Express Gen 2 Channel
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.

Article 2009-03-23

PDF PDF 1.81 MB
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Keysight’s Advance Design System (ADS).

Case Study 2009-03-12

PDF PDF 196 KB

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