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126-150 / 684

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Automating Communications Measurement - Article
This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software.

專文 2013-02-07

An Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms - TechBriefs Article
An article on Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms.

專文 2013-02-01

Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.

專文 2013-01-31

Electronic Manufacturing Test Support eNews - February 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

新聞簡訊 2013-01-31

Asahi Kaesei Microdevices Corporation Develops High-End, Low-Noise Process
AKM to develop the highest low-noise process by using Keysight's state of the art 1/f noise measurement system.

案例研究 2013-01-09

Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

專文 2013-01-09

安捷倫的教育新聞
安捷倫的教育新聞

專題報導 2012-12-10

Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification
With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection.

專題報導 2012-12-06

PDF PDF 105 KB
Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article
This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized.

專文 2012-12-01

PDF PDF 386 KB
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA

專文 2012-11-30

Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

專文 2012-11-28

PDF PDF 6.08 MB
The Ins and Outs of Microwave Signal Capture and Playback - Article Reprint
Looks at capture and playback of microwave signals and the multitude of applications in the evaluation of communications, radar and electronic warfare systems.

專文 2012-11-01

PDF PDF 758 KB
Digital Baseband and RF Domain Integration Challenges in Radar Systems - Article Reprint
Reconfigurable radar systems employ digital technology in the form of FPGAs and DSPs.That digital technology is combined with RF technology to achieve a high level of flexibility.

專文 2012-11-01

PDF PDF 406 KB
The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

專文 2012-11-01

PDF PDF 2.44 MB
Electronic Manufacturing Test Support eNews - October 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

新聞簡訊 2012-10-31

Carrying Microwave Precision Into the Field - Article Reprint
Microwave Journal, September 2012 FieldFox product feature.

專文 2012-10-22

PDF PDF 1.83 MB
Testing Interference in a Wireless Environment - Article Reprint
Identification and reduction of interference has become essential to the proper operation in all wireless systems.

專文 2012-10-22

PDF PDF 202 KB
Enabling Fast Characterization of PA Performance with Modulated Signals
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

期刊 2012-10-15

Choose the right system calibration services for your Keysight i3070/3070 In-circuit Test System
Keysight offer a range of new calibration service with and without system calibration license to use for your Keysight i3070/3070 In-circuit Test System

案例研究 2012-09-28

Article: COTS Gear Generates Multi-Emitter Test Signals
This article discusses COTS test hardware and software being used to create multi-emitter test signals using ESL design simulation software and wideband AWGs

專文 2012-09-27

Simplifying the Troubleshooting of Intercity Trains While Enhancing Worker Safety - Case Study
The Keysight Wireless Remote Connectivity Solution simplifies data logging tasks. With the free data-logging application from Keysight, the engineer can view live readings, and switch from point-to-point, or view data from up to three points simultaneously.

案例研究 2012-09-13

PDF PDF 232 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

專文 2012-08-24

PDF PDF 301 KB
Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.

專文 2012-08-24

PDF PDF 266 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

專文 2012-08-24

PDF PDF 1.04 MB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

專文 2012-08-24

PDF PDF 152 KB

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