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New LDMOS Model Delivers Powerful Transistor Library - Part 2
This article reprint presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

專文 2014-07-31

PDF PDF 699 KB
Design and Characterization of Discontinuous RF/Microwave Passive Components
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

專文 2014-07-31

PDF PDF 1.43 MB
Designing RFID Tags Using Direct Antenna Matching
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

專文 2014-07-31

PDF PDF 1.09 MB
Matching Network Yin-Yang - Part 1
This Article by Randy Rhea covers basic matching concepts and matching network topologies, emphasizing methods for obtaining the desired performance with networks that are realizable in practice.

專文 2014-07-31

PDF PDF 554 KB
Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

專題報導 2014-07-31

PDF PDF 155 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 1
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

專文 2014-07-31

PDF PDF 544 KB
Testing Times in the Continuing Evolution of WLAN
Wireless Design and Development, July 29, 2014 article by Yu Qian describes the evolution of WLAN standards.

專文 2014-07-29

Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

專文 2014-06-14

PDF PDF 515 KB
2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

專文 2014-05-22

PDF PDF 598 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

專文 2014-05-22

NYU Wireless e-Pulse Newsletter
NYU WIRELESS researchers have been invited to publish recent RF propagation results on 5G millimeter wave cellular communications in New York City.

期刊 2014-04-16

5G-Rethinking Wireless Infrastructure Interactive IWPC Workshop
With fourth generation LTE (4G) now beginning to be deployed widely around the world, Fifth generation (5G) mobile and wireless communication technologies are emerging into research fields.

期刊 2014-04-14

METIS 2020
Welcome to the EU project METIS which stands for Mobile and wireless communications Enablers for the Twenty-twenty Information Society. The main objective of the project is lay the foundation of 5G, the next generation mobile and wireless communications system.

新聞簡訊 2014-04-14

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

專文 2014-04-07

Dayalbagh University in India develops ON-DEMAND Remote Laboratories

專文 2014-04-07

Software, Connectivity Solutions
Agilent provides software that complements and augments the measurement hardware. The hardware solutions typically come with free software utilities to help simplify instrument operation. Agilent provides software for your entire design and test cycle – from simulation up to analysis and display of the data.

專文 2014-04-07

Agilent Measurement Journal

期刊 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

專文 2014-04-07

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

專文 2014-04-02

Wireless Test Sets for 4G and Beyond
An incredible amount of technology is packed into every smartphone and tablet. The list is long and getting longer: new and legacy cellular formats, multiple wireless-connectivity links, GPS capabilities, cameras, music players, Web browsers, and on and on.

專文 2014-03-14

Faculty Spotlight Articles
Interesting news on universities that are using Keysight equipment to do unique and exciting things.

專文 2014-03-03

Harbin Institute of Technology Develops Interest in EE with Remote Teaching Lab
Program generates student interest in Electrical Engineering using an interactive flash tool and allow for remote access to engineering test equipment -- so they can study electrical engineering (EE) when it’s convenient for them. The labs also provide a mechanism for professors to monitor students’ progress and track results.

專文 2014-03-03

Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

專文 2014-02-18

PDF PDF 3.82 MB
Overcoming the Challenges of Designing and Testing Phased-Array Radar Systems
Microwave Product Digest (MPD) featured article for January 2014 written by Dingqing Lu of Agilent Technologies.

專文 2014-01-27

Factory Test Technology License (FTTL) from Qualcomm
This FTTL License from Qualcomm granted Agilent a worldwide license to demonstrate and distribute products that leverage the Qualcomm technology for RF factory testing.

專文 2014-01-23

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