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E Pluribus Unum: An Integrated Design Flow for Phased Arrays
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

특집 기사 2016-07-20

Follow Keysight EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

뉴스레터 2016-07-14

ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Keysight Technologies highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

저널 2016-07-14

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

뉴스레터 2016-07-01

What is jitter?
Understand jitter basics and how to measure and then eliminate jitter from your designs.

기사 2016-06-19

Jitter Glossary
Key terms that will help you understand and tackle jitter in your designs.

기사 2016-06-15

Phased array beamforming software design, test, and measurement kit introduced by Keysight
Military & Aerospace Electronics article introduces the W1720EP phased array radar beamforming kit add-on software simulation personality for the SystemVue 2016.08 design and test and measurement environment.

기사 2016-06-13

Solving Mobile Radar Measurement Challenges
This Microwave Journal article examines an alternative simulation method that allows for better cross-domain modeling in a single framework, to capture the complete effects of modern radar system performance.

기사 2016-06-13

Integrated, Turnkey Modeling and Measurement Systems - Article Reprint
This article first appeared in the March 2016 edition of Microwave Journal

기사 2016-05-26

PDF PDF 4.70 MB
MWJ Article: Eye on 802.11ax: What It Is and How to Overcome the Design & Test Challenges It Creates
Wireless access to data has become an everyday necessity for both consumers and enterprises. In the last 30 years alone, unfettered access to information has transformed entire industries, fueling growth, productivity and profits.

기사 2016-05-20

University of Notre Dame Strikes a Balance Between Research and Teaching

기사 2016-05-15

Paving The Way For 5G Realization and mmWave Communication Systems – Article Reprint
This article Paving The Way For 5G Realization and mmWave Communication Systems first appeared in the April 2016 edition of Microwave Journal. Reprinted with kind permission from Microwave Journal.

기사 2016-05-03

PDF PDF 2.90 MB
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

기사 2016-03-31

PDF PDF 644 KB
The PDN Bandini Mountain and Other Things I Didn’t Know I Didn’t Know
"In engineering, it's what you don't know you don't know that can ruin your day and keep you awake at nights." From Bert Simonovich's practical design notes.

저널 2016-03-30

Solving Electronics Design Challenges of an Aerospace System with EDA Tools
Microwave Product Digest featured article on solving electronics design challenges of an aerospace system using EDA tools.

기사 2016-03-22

Practical, Efficient and Safe Power Device Thermal Characterization with B1506A - Article Reprint
The B1506A has standard solution for power device thermal test and offers fast and safe solution to customers. This white paper reports the actual implementation of thermal test with B1506A.

기사 2016-03-18

PDF PDF 616 KB
Stay ALERT – Don’t Get Hurt

기사 2016-03-03

Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

기사 2016-03-03

Phase Locked Loop Noise Transfer Functions - By Peter Delos
High Frequency Electronics article that describes the derivation of noise transfer functions and some key points for phase locked loop noise analysis is provided along with a simulation and measured example.

기사 2016-02-18

Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

기사 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

기사 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

기사 2016-02-16

PDF PDF 409 KB
ABCs of Writing a Custom Boundary Scan Test - Article Reprint
This article provides sample vectors and code for expanding test coverage with boundary scan.

기사 2016-02-12

PDF PDF 472 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

기사 2016-02-12

PDF PDF 178 KB
Tester for Hire - Article Reprint
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

기사 2016-02-09

PDF PDF 381 KB

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