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RF SiP Design Verification Flow with Quadruple LO Down Converter SiP
This Article by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

Article 2014-07-31

PDF PDF 517 KB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2014-07-31

PDF PDF 592 KB
Matching Network Yin-Yang - Part 1
This Article by Randy Rhea covers basic matching concepts and matching network topologies, emphasizing methods for obtaining the desired performance with networks that are realizable in practice.

Article 2014-07-31

PDF PDF 567 KB
Symmetric and Asymmetric - Coupled Lines Band-Stop Filters at Ku/Ka Bands
This Article presents theory and design of coupled-line spur line band-stop filters, which are quite compact structures, lower radiation loss than conventional shunt stub and coupled-line filters.

Article 2014-07-31

PDF PDF 1.38 MB
New LDMOS Model Delivers Powerful Transistor Library - Part 1
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2014-07-31

PDF PDF 557 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 2
This Article presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2014-07-31

PDF PDF 716 KB
Designing RFID Tags Using Direct Antenna Matching
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

Article 2014-07-31

PDF PDF 1.09 MB
2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

Article 2014-05-22

PDF PDF 598 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

Article 2014-05-22

NYU Wireless e-Pulse Newsletter
NYU WIRELESS researchers have been invited to publish recent RF propagation results on 5G millimeter wave cellular communications in New York City.

Journal 2014-04-16

METIS 2020
Welcome to the EU project METIS which stands for Mobile and wireless communications Enablers for the Twenty-twenty Information Society. The main objective of the project is lay the foundation of 5G, the next generation mobile and wireless communications system.

Newsletter 2014-04-14

5G-Rethinking Wireless Infrastructure Interactive IWPC Workshop
With fourth generation LTE (4G) now beginning to be deployed widely around the world, Fifth generation (5G) mobile and wireless communication technologies are emerging into research fields.

Journal 2014-04-14

The LXI System You Didn’t Know You Were Using
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

Article 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

Article 2014-04-07

Software, Connectivity Solutions
Agilent provides software that complements and augments the measurement hardware. The hardware solutions typically come with free software utilities to help simplify instrument operation. Agilent provides software for your entire design and test cycle – from simulation up to analysis and display of the data.

Article 2014-04-07

Dayalbagh University in India develops ON-DEMAND Remote Laboratories

Article 2014-04-07

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

Article 2014-04-07

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

Article 2014-04-02

Wireless Test Sets for 4G and Beyond
An incredible amount of technology is packed into every smartphone and tablet. The list is long and getting longer: new and legacy cellular formats, multiple wireless-connectivity links, GPS capabilities, cameras, music players, Web browsers, and on and on.

Article 2014-03-14

Faculty Spotlight Articles
Interesting news on universities that are using Keysight equipment to do unique and exciting things.

Article 2014-03-03

Harbin Institute of Technology Develops Interest in EE with Remote Teaching Lab
Program generates student interest in Electrical Engineering using an interactive flash tool and allow for remote access to engineering test equipment -- so they can study electrical engineering (EE) when it’s convenient for them. The labs also provide a mechanism for professors to monitor students’ progress and track results.

Article 2014-03-03

Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-02-18

PDF PDF 8.07 MB
Overcoming the Challenges of Designing and Testing Phased-Array Radar Systems
Microwave Product Digest (MPD) featured article for January 2014 written by Dingqing Lu of Agilent Technologies.

Article 2014-01-27

Factory Test Technology License (FTTL) from Qualcomm
This FTTL License from Qualcomm granted Agilent a worldwide license to demonstrate and distribute products that leverage the Qualcomm technology for RF factory testing.

Article 2014-01-23

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