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8960 in Wireless Device Design News
Issue 2 Series 2

Newsletter 2010-08-30

8960 in Wireless Device Design News
Issue 4

Newsletter 2010-08-30

8960 in Wireless Device Design News
Issue 3 Series 2

Newsletter 2010-08-30

8960 in Wireless Device Design News
Issue 6

Newsletter 2010-08-30

Real-World Battery Drain Analysis
Go beyond Talk Time Test! Test the battery life of your data device using realistic user scenarios to ensure real-world operation meets user expectations with the 8960, 14565B and IFT software.

Feature Story 2010-08-30

8960 in Wireless Device Design News
Issue 3

Newsletter 2010-08-30

8960 in Wireless Device Design News
Issue 1 Series 2

Newsletter 2010-08-30

8960 in Wireless Device Design News
Issue 4 Series 2

Newsletter 2010-08-30

The MIMO Antenna: Unseen, Unloved, Untested!
Microwave Journal (August 2010) article (.pdf) written by Agilent’s Moray Rumney. With the shift of MIMO from theory to real world this article focuses on performance testing in real world conditions.

Article 2010-08-20

PDF PDF 693 KB
Measuring MIMO In LTE Tx And Rx Tests
Find the right combination of LTE test instruments and techniques to evaluate the performance of Long Term Evolution (LTE) components and systems under real-world conditions. A link to the MWJ article by Agilent.

Article 2010-08-18

Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

PDF PDF 175 KB
8960 in Wireless Device Design News
Issue 1

Newsletter 2010-07-28

Utilizing LAN-Based Instrumentation to Measure Total Harmonic Distortion in Remote Facilities
Agilent Measurement Journal - Issue: Six - 2008

Journal 2010-07-22

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

Solving the RFIC Design for Yield and Verification Dilemma
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

Education News
Learn how Agilent works with Universities and Academia around the world.

Article 2010-07-08

Flash Programming - Keysight Utility Card versus Deep Serial Memory Case Study
This case study compares flash programming performances of the Keysight Medalist i3070 Series 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne ICT solution.

Case Study 2010-07-07

PDF PDF 155 KB
How Design Software Changed the World
Microwave Jounral articles on the history of the individuals, companies and products that helped define the development of design software from 1988 to present day.

Journal 2010-07-01

Flash programming with the Keysight Utility Card - Successful Implementation
This case study details the successful implementation of flash programming with the Keysight utility card in the manufacturing environment.

Case Study 2010-06-28

PDF PDF 144 KB
Electromagnetic Interference Meets Its Match
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

Journal 2010-06-24

Equivalent-time-sampling scope improves accuracy of characterizing high-speed designs
Equivalent-time-sampling scope improves accuracy of characterizing high-speed designs

Newsletter 2010-06-15

Agilent Technologies Chipset Software Supports picoChip Femtocell Test

Newsletter 2010-06-10

Microwave Engineering Europe X-parameters Article

Article 2010-06-02

Access Entitled Content on our Agilent.com Customer Website
Customers who have active warranty or support agreement for their ICT, AXI or AOI test system can register for access to Printed Circuit Assembly Board Test and Inspection entitled content.

Newsletter 2010-05-31

Rehost Service for Agilent ICT, AXI and AOI systems
Rehost service is included as part of Agilent support agreement for hardware support or software subscription service.

Feature Story 2010-05-25

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