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Using Software Defined Instruments to Address the Mixed-Signal Test Challenges of Today’s Software
Link to a NASA Tech Brief article which states to ensure successful operation of SDR designs requires use of modern instruments capable of bridging the digital-analog divide, while also addressing any challenges stemming from use of the SDR technology itself

Article 2012-02-01

Electronic Manufacturing Test Support eNews - January 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2012-01-31

Practical Digital Wireless Signals
Learn the intricacies and tradeoffs in signal selection and design with this practical guide book from Earl McCune.

Journal 2011-12-06

Defining the 4G PHY Architecture Design Challenges
EE Times design article (Part 1) on defining the 4G PHY architecture design challenges.

Journal 2011-12-05

Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.

Journal 2011-12-04

Article: Case study - Threat simulation for multi-port radar and electronic warfare systems
Case Study

Case Study 2011-11-30

High-Speed Data Throughput Test
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

Feature Story 2011-11-29

802.11ac Wireless LAN: what’s new and the impact on design and test
EE times article by Agilent’s Mirin Lew describing the 802.11ac, the technical challenges and comparisons to earlier technologies.

Article 2011-11-09

Microwaves & RF article: Enhancing Analysis Of Spurious Emissions
Enhancing analysis of spurious emissions shows that understanding the test instrument and measured signal can impact speed and accuracy.

Article 2011-11-07

Defect Coverage of Boundary-Scan Tests - Article Reprint
This paper discusses the potential and challenges with some defects when using the "PCOLA/SOQ" metric model in boundary scan test coverage.

Article 2011-11-04

PDF PDF 245 KB
Test Coverage: What Does It Mean when a Board Test Passes? - Article Reprint
Defining board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage. This paper explores an alternative 'defect universe' to better depict test coverage.

Article 2011-10-27

PDF PDF 89 KB
A New Probing Technique for High-Speed/High-Density Printed Circuit Boards - Article Reprint
This paper discusses how in-circuit test access can be maintained, even on highly dense gigabit logic boards.

Article 2011-10-24

PDF PDF 341 KB
LTE-Advanced…Already?
Article reprint from OSP magazine detailing the additional changes LTE-Advanced brings to the Network already working to implement 3GPP LTE.

Article 2011-09-01

PDF PDF 695 KB
A Primer on Test Options - Article Reprint
This paper discusses why ICT remains the best option for high-volume electronics manufacturing, with its flexibility to provide a myriad of test options to meet different manufacturing needs.

Article 2011-08-08

PDF PDF 269 KB
Successful ICT Boundary Scan Implementation - Article Reprint
This paper details eight steps which can help you get the best possible boundary scan test coverage with your i3070 in-circuit tester.

Article 2011-08-08

PDF PDF 111 KB
ICT Boundary Scan Development Steps - Article Reprint
This paper discusses how test point access and good data can make a big difference in the success of your boundary scan test. Best practises for boundary scan test development are also highlighted.

Article 2011-08-08

PDF PDF 411 KB
LED Measurement Options at ICT - Article Reprint
This paper reviews current methods and constraints of LED color testing methodologies.

Article 2011-08-08

PDF PDF 306 KB
Ultra-wideband radar system design article in EE Times

Feature Story 2011-07-27

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

PDF PDF 593 KB
LTE-Advanced testing: What to expect
Even as the first deployments of LTE capture widespread public attention, the LTE standard is evolving. In December 2010, LTE-Advanced was introduced in Release 10 of the 3GPP specifications.

Article 2011-06-30

PXI High Speed Data Throughput Fundamentals
Abstract: PXI High Speed Data Throughput Fundamentals

Article 2011-06-15

PDF PDF 311 KB
Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.

Article 2011-06-02

PDF PDF 1.04 MB
Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine

Article 2011-05-02

The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.

Article 2011-04-24

PDF PDF 1.61 MB
Multichannel scopes enable MIMO RF testing
This article discusses troubleshooting techniques with time-coherent multichannel scopes and 89600 VSA software to gain insight into error mechanisms affecting their hardware EVM performance and system-level RF transmitter performance budgets.

Article 2011-04-12

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