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Follow Agilent EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

MPD Article: Instantaneous Phase Measurements of Wideband Active Electronically Scanned Arrays

Article 2010-03-03

Chemical Analysis of Fuel Cells
Agilent also manufactures and sells chemical analysis instrumentation for fuel cell development, manufacturing, and servicing.

Newsletter 2010-03-02

Segmented memory
Segmented memory article

Article 2010-02-23

PDF PDF 317 KB
After office hours service request using eSMART
eSMART is a new web-based application for our customers to raise and track service requests.

Newsletter 2010-02-02

A primer on MIMO in LTE
An article in Electronic Products, written by Agilent’s Jan Whitacre, exploring the special employment of multiple-input, multiple-output radios to utilize spectrum in Long Term Evolution (LTE) systems.

Article 2010-02-01

S-parameters Without Tears
This article explains s-parameter theory and shows how to create accurate, delay-causal, and passive time-domain models by combining band-limited s-parameter data with knowledge about the physical characteristics of a component.

Journal 2010-01-25

TestSight Developer
TestSight® Developer is the most cost effective CAD conversion solution in the market for Agilent Medalist i3070 and Medalist i1000.

Feature Story 2010-01-22

Mentor Graphics Support of CAMCAD Pro - Letter
Letter: Agilent has decided to end its Reseller Contract with Mentor Graphics on Sales and Support of CAMCAD Pro to our customers. CAMCAD Pro converts CAD format to AOI, AXI and ICT input modules, and is a Mentor Graphics product.

Feature Story 2010-01-07

PDF PDF 62 KB
Tester overcomes RF problems with wireless network deployment and maintenance
Article reprinted with permission from AGL.

Article 2009-12-24

PDF PDF 2.33 MB
Characterizing Satellite Subsystems and Signals with a Versatile Wideband Measuring Receiver
Article discusses an approach that provides greater insight into how internal signal quality can affect transmitted signals.

Article 2009-12-22

Measuring Propagation Delay with a Universal Counter
Make a signal path delay measurement, understand precision available with counters and more. (Email address required)

Article 2009-12-18

Understanding the Operation and Test of a Bluetooth Enhanced Data Rate Radio
Helen Mills, Agilent Technologies, Microwave Journal

Article 2009-12-16

Accelerating Advanced Node CMOS RFIC Design
Microwave Journal article by David Vye

Journal 2009-12-07

ISO9000 certified repair centers for ICT and imaging inspection systems
ISO9000 certified repair centers for ICT and imaging inspection systems

Feature Story 2009-11-16

VNA Characterization of Cable Assemblies for Supercomputer Applications

Article 2009-11-16

PDF PDF 2.48 MB
Practical Analysis of Backplane Vias

Article 2009-11-16

PDF PDF 2.40 MB
Characterizing Non-Standard Impedance Channels with 50 Ohm In

Article 2009-11-16

PDF PDF 2.24 MB
Making Digital Flat Panels Better

Article 2009-10-27

WIN Semiconductors Announces New MMIC Tool Bar Personality for ADS Process Design Kits

Newsletter 2009-10-23

X-Parameters: Commerical Implementations of the Latest Technology Enable Mainstream Applictions - Ar
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

Article 2009-10-09

PDF PDF 1.12 MB
N2X to Support Leading Carrier Ethernet Vendors at Major Interoperability Demonstration
Agilent Offers First-to-Market Synchronization Solution to Ensure Service Quality for Ethernet Networks; Tools to Simulate, Test Ethernet Operations, Maintenance

Newsletter 2009-09-29

Test Systems Using Agilent´s USB Modular Instruments
Article published in IEEE Latin America and the Caribbean Newsletter Issue Number 63 on June 2009.

Article 2009-09-07

PDF PDF 74 KB
Agilent USB Modular Instruments – allies for educators and students
Article published in IEEE Latin America and the Caribbean Newsletter Issue Number 64 on August 2009.

Article 2009-09-07

PDF PDF 158 KB
Transforming MIMO Test With Fast, Accurate Signal Creation, Signal Analysis, and Protocol Developmen
Multiple-Input Multiple-Output (MIMO) is one of several forms of multiple antenna techniques available today designed to significantly improve communication performance.

Newsletter 2009-08-26

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