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MMIC Design: Speed to Market with the Lowest Cost and Highest Yield
This Article by Jack Sifri (Agilent Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB
NASA Chooses Acqiris Products from Agilent - Customer Article
The National Aeronautics & Space Administration (NASA selected Agilent Acqiris digitizers for key data acquisition requirements in advanced propulsion research.

Article 2008-05-09

PDF PDF 221 KB
Agilent Measurement Journal, Issue 5, May 2008
Finding a new path when assumptions break down is the focus in Issue 5.

Journal 2008-05-01

PDF PDF 5.96 MB
Solutions for Aerospace Avionics Testing
How to optimize test systems using LXI technology.

Étude de cas 2008-04-15

PDF PDF 664 KB
Fiber-Optically Isolated Instrumentation for Pulsed Power System Diagnostics
This document reports the development of a capability based on the use of a high bandwidth digitizer packaged in a compact configuration where the sampled data is transmitted digitally using TCP/IP network protocol.

Article 2008-04-09

PDF PDF 294 KB
Broadband FFT Spectrometer for Radio and Millimeter Astronomy Article Reprint
The core architecture, tests in the lab and first results of a Fast Fourier Transform spectrometer are described in this document

Article 2008-04-02

PDF PDF 418 KB
PC-Based Hard Disk Storage Testing Platform for Position Error Signal Generation
This paper describes a high-performance Servo control system for enhancement of spin stand Servo performance.

Article 2008-03-19

PDF PDF 726 KB
Achieving Faster, Lower-cost Testing of RFID Devices

Étude de cas 2008-03-12

PDF PDF 208 KB
T&M Environment Photoionization Aerosol Mass Spectrometer Customer Article
A new method, photoionization aerosol mass spectrometry (PIAMS), is described for real-time analysis of organic components in airborne particles below 300 nm in diameter.

Article 2008-03-07

PDF PDF 306 KB
Article reprint: Implementing Bead Probe Technology for In-Circuit Test:
A major OEM implements bead probe technology on a new design to gain test access and coverage of high-speed circuits. The experiences of a first implementation of bead probe technology are discussed here.

Article 2008-03-06

PDF PDF 1.88 MB
Article reprint: Finding Power/Ground Defects on Connectors A New Approach
This paper surveys existing tests for these defects and introduces a new solution based on Network Parameter Measurements

Article 2008-03-06

PDF PDF 199 KB
Article reprint: Impact of Quad Flat No Lead Package (QFN) on Automated X-ray Inspection (AXI)
This paper discusses lack of industry specification for QFN inspection, how AXI methodology was improved to detect QFN solder joint defect, design for inspection and future work.

Article 2008-03-06

PDF PDF 1.63 MB
Article reprint: A Bead Probe CAD Strategy for In-Circuit Test
This paper discusses the potential of using Bead Probes in Computer Aided Design (CAD) systems when getting a board ready for production.

Article 2008-03-06

PDF PDF 606 KB
Measurement of the Real Time Fill-Pattern at the Australian Synchrotron
This article describes the development, commissioning and operation of a Fill-Pattern Monitor (FPM) for the Australian Synchrotron that measures the real-time intensity distribution of the electron bunches in the storage ring.

Article 2008-03-05

PDF PDF 685 KB
Airport ground radar System uses Agilent Acqiris PCI Digitizer cards Article
Technologies and Thomas Harmon, Raytheon Electronic Systems on airport ground radar systems.

Article 2008-02-08

PDF PDF 123 KB
8960 in Wireless Device Design News article archive
Previous Issues

Bulletin d'information 2008-01-30

Advanced Design System Connected Solutions for Radar and EW Systems
This article will explain the benefits of combining a simulated ADS radar model with physical test equipment to create what is referred to as a connect solution.

Article 2008-01-28

PDF PDF 799 KB
Exploring The Test Requirements For DisplayPort Receivers
Exploring The Test Requirements For DisplayPort Receivers

Article 2008-01-28

PDF PDF 543 Bytes
Simplify DDR Validation with SI Methods

Article 2008-01-06

3GPP LTE: Introducing Single-Carrier FDMA
This article, published in issue 4 of the Agilent Measurement Journal, describes single-carrier FDMA for 3GPP LTE.

Article 2008-01-01

PDF PDF 491 KB
Productivity by Design: ADS 2008 Reduces Steps to Simulation and Verification
This Article by How-Siang Yap discusses the considerations for using ADS 2008 to double designer productivity when performing common design and development tasks.

Article 2008-01-01

PDF PDF 508 KB
Agilent Measurement Journal, Issue 4, January 2008
Agilent Measurement Journal's focus in Issue 4 is device interoperability, product quality, measurement results, and even the well-being of a nation's population.

Journal 2008-01-01

PDF PDF 2.56 MB
Agilent Ultra Wideband Digital Receivers Powered by Acqiris Signal Analyzers Solutions

Article 2007-11-19

PDF PDF 72 KB
Testing HSUPA devices
By: Jeanne Fightmaster, Agilent Technologies Published with permissions of EETimes Asia

Article 2007-11-16

PDF PDF 404 KB
The Evolution of Vectorless Test
Written by Chris Jacobsen. Published with permission from Circuits Assembly, January 2007.

Article 2007-11-08

PDF PDF 263 KB

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