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What is waveform update rate and why does it matter?
Explore this often overlooked oscilloscope performance specification to learn how to determine an oscilloscope’s update rate and what a fast update rate can mean for you.

Article 2013-06-03

Keysight and ITESM (Mexico) Collaborate to Prepare Students for Careers in Industry

Article 2013-05-27

This Lab Makes My Job Easy

Article 2013-05-27

Yellow Jackets Buzz at the Speed of Light

Article 2013-05-27

Keysight Test Equipment Hits the Ivy League

Article 2013-05-27

Celebrating 100 Years of Excellence in Engineering Education and Research

Article 2013-05-27

Artificial Retina Research at the University of Utah Provides Hope for the Blind

Article 2013-05-27

Keysight Equipment Plays an Instrumental Role in Prototype Alternative Breast Imaging Technique

Article 2013-05-27

Morgan State Strives to Make Engineering Education More Accessible

Article 2013-05-27

Popcorn and Oscilloscopes!

Article 2013-05-27

University of Hawaii using Keysight Equipment for Patient Monitoring Research

Article 2013-05-27

Students “Learn by Doing” at Cal Poly

Article 2013-05-27

Education Program Newsletter - Vol 2. June 2008
Education Program Newsletter - Vol 2. June 2008

Bulletin d'information 2013-05-07

Electronic Manufacturing Test Support eNews - April 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Bulletin d'information 2013-04-25

What is the difference between IEEE 802.11ac and 802.11ad?
Microwave & RF article, April 2013. The goal is for all IEEE 802.11 standards to be backward compatible and for 802.11ac and 802.11ad to be compatible at the medium-access-control (MAC) or data-link layer. They should differ only in physical-layer (PHY) characteristics. Read about how that goal is being attained.

Article 2013-04-23

Ensuring The Highest Quality Microwave Measurements - Article
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.

Article 2013-04-22

Incremental Redundancy in EGPRS
Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF.

Article 2013-04-02

Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology.

Article 2013-03-25

PDF PDF 429 KB
Optimize Time Gating in Spectrum Analysis
Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.

Article 2013-03-20

Turn Your Keysight Handheld Meter into a Data Logger - Case Study
Case study on how to turn Keysight Handheld Meter with U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC into a Data Logger keywords: U1177A Bluetooth Adapter, Keysight Wireless Remote Connectivity Solution, bluetooth adapter, Handheld DMM, data logger

Étude de cas 2013-03-11

PDF PDF 898 KB
Automating Communications Measurement - Article
This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software.

Article 2013-02-07

An Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms - TechBriefs Article
An article on Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms.

Article 2013-02-01

Electronic Manufacturing Test Support eNews - February 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Bulletin d'information 2013-01-31

Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.

Article 2013-01-31

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