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Pb-Free’s Impacts on Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, January 2005.

Article 2005-12-05

PDF PDF 75 KB
Pb-Free PCB Finishes for ICT - New solders can mean new finishes. How to decide which is best.
Written by Stig Oresjo and Chris Jacobsen, Agilent Technologies. Article published in Circuits Assembly, September 2005.

Article 2005-12-05

PDF PDF 88 KB
Overcoming Lower Wetting Forces of Lead-Free Alloys
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, March 2005.

Article 2005-12-05

PDF PDF 77 KB
Shotgunning: Not for Pb-Free - A proper test approach can reduce scrap from random repair methods.
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, November 2005.

Article 2005-12-05

PDF PDF 57 KB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2005-12-01

PDF PDF 57 KB
Guidelines for Successful Simulation Setup
This Article by Wilfredo Rivas-Torres presents a review of the choices an engineer must make to obtain successful results from circuit simulation.

Article 2005-12-01

PDF PDF 637 KB
Power Amplifier Design Speed-Up Techniques
This Article presents how to speed up Power Amplifier Design by fast source-pull, real-time load-pull and accurate measurement-based behavioural models.

Article 2005-11-01

PDF PDF 1.71 MB
PCB Pulse v3n3

Newsletter 2005-10-28

PDF PDF 575 KB
Selcom Evaluates Keysight 5DX and BGA Open Outlier Technology
Case study of Selcom success in detecting BGA opens using Keysight 5DX and oval pad designs

Case Study 2005-10-27

PDF PDF 319 KB
Fault Detective Case Study #1 Presentation
4 slide presentation that summarizes Keysight employing its test optimization software to improve the quality and yield of its RF printed circuit assemblies.

Case Study 2005-09-26

PDF PDF 72 KB
Digital Predistortion Linearizes Wireless Power Amplifiers
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

Article 2005-09-01

PDF PDF 1.75 MB
Designing Filters Efficiently Using Simulation Tools
This Article by Anurag Bhargava presents two bandpass filter (BPF) examples that were simulated using circuit and EM simulators. It also details the comparison of the simulated and measured results.

Article 2005-09-01

PDF PDF 2.17 MB
Be generous with tests (Slösa med testerna)
Written by Stig Oresjo, Agilent Technologies. This article discusses the use of AOI for success in lead-free since the lead-free process is less forgiving, than tin-lead. Note that the article is in Swedish.

Article 2005-08-31

4 reasons to choose Agilent support
PCB PULSE ARTICLE: There are many reasons to choose Agilent Support Solutions after the warranty period ends on your Agilent test system. Here are four important ones.

Feature Story 2005-06-27

CAMCAD V4.5 designed by users
PCB PULSE ARTICLE: CAMCAD V4.5, the newest release of RSI's popular data preparation and analysis software, includes 74 customer-driven enhancements.

Feature Story 2005-06-27

Agilent visits your neighborhood
PCB PULSE ARTICLE: Agilent technical experts are on the road and may be visiting a location near you.

Feature Story 2005-06-27

AXI characterizes lead-free processes
Processes and alloys must be fully characterized if you're transitioning to lead-free manufacturing. Agilent's automated X-ray inspection (AXI) technology is up to the task.

Feature Story 2005-06-27

VEE Pro Used to Characterize Materials
Using an automated test setup written in VEE Pro, ONERA (France) characterizes EM absorption and reflection of space-defense material.

Case Study 2005-05-09

PDF PDF 591 KB
VEE Pro Used to Automate Tests of Climactic Chambers
Using VEE Pro, ISSeP (Belgium) developed an automated system to characterize climatic chambers, incubators and refrigeration devices.

Case Study 2005-05-09

PDF PDF 238 KB
ScanWorks Now on Medalist ICT Systems
PCB PULSE ARTICLE: ScanWorks has long been a boundary-scan option on the Agilent 3070. Today it's available across the entire Agilent Medalist in-circuit test (ICT) family, including the new i5000 platform.

Feature Story 2005-04-18

Six Paths to Success with SP50
PCB PULSE ARTICLE: The SP50 is designed specifically to increase real-world success for electronics manufacturers. The latest software proves the point.

Feature Story 2005-04-18

Simple Steps for 3070 Codeword-to-License Conversion
PCB PULSE ARTICLE: Agilent has transitioned from a codeword-only to license-based model for software activation. Here's what you need to know to make the conversion.

Feature Story 2005-04-18

AOI at Home in a Lead-Free World
PCB PULSE ARTICLE: Lead-free manufacturing means new defect types. AOI and SPI are a particularly good fit for detecting and preventing defects in a lead-free world.

Feature Story 2005-04-18

60 Improvements in 60 Seconds
PCB PULSE ARTICLE: Take a minute to install 4.10 on your SJ50 and you’ll get over 60 user-inspired improvements.

Feature Story 2005-04-18

CAMCAD Buzz
PCB PULSE ARTICLE: Some important changes are in the air with RSI's CAMCAD Professional software. Here’s an overview.

Feature Story 2005-04-18

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