Here’s the page we think you wanted. See search results instead:

 

Sprechen Sie mit einem Experten

Technischer Support

Electronic Measurement

Support by Product Model Number:

Refine the List

Alle detailierte Suchkriterien entfernen

By Industry/Technology

By Type of Content

Nach Produkt Kategorie

401-425 of 770

Sort:
Volumetric Paste Measurement using Solder Paste Inspection (SPI)
Written by : Jeff Bishop, Product Marketing Engineer, Agilent Technologies. The online recording discusses the techniques used for 3D paste analysis, accuracy of the measurements, and how these tools can be integrated into production affectively.

Feature Story 2009-01-20

The Fifth Harmonic: Tradeoffs Between Sampling and Real-Time Oscilloscopes
When determining the required system bandwidth some vendors will use a “fifth harmonic” rule of thumb; however it is important to understand typical conditions at the receiver to accurately determine the amount of bandwidth you will need.

Article 2009-01-19

Offering Merges Design and Test
Agilent featured in Wireless Systems Design magazine article

Article 2009-01-16

Improving DQPSK Receiver Design for Satcom Apps
Reprint of technical article in Comms Design, 1/2003

Article 2009-01-16

What Every RF Engineer Should Know: Power Amplifiers
Feature story by Janine Love.

Article 2009-01-12

Using Base Station and MIMO Channel Emulators for Mobile WiMAX Devices
This article describes how a channel emulator can be used to characterize the performance of a MIMO receiver. The testing was done in stages of increasing complexity, namely testing under AWGN conditions, MIMO testing with known static channels, and finally testing with channels chosen to represent “real world” behavior.

Article 2009-01-11

PDF PDF 1.37 MB
Concepts of Orthogonal Frequency Domain Modulation (OFDM)

Article 2009-01-07

Eye-Diagram Analysis Speeds DDR SDRAM Validation

Article 2009-01-06

Validating the Physical and Protocol Layers in DDR Memory Interfaces

Article 2009-01-06

Is the 5th Harmonic Still Useful for Predicting Data Signal Bandwidth?
This article, published in High Frequency Electronics, compares using the 5th harmonic to using the system rise/fall times to determine the required bandwidth for your system. The article begins on page 18.

Article 2009-01-01

Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed

Article 2009-01-01

What Every RF Engineer Should Know: OFDM & WiMax
Feature story by Janine Love.

Case Study 2008-12-27

In-Circuit Test Channel Partner Interview Series: Masterpiece Engineering
This article is the third in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features Masterpiece Engineering, from a programming house perspective.

Feature Story 2008-12-16

PDF PDF 106 KB
The Value Of Traceable S-Parameter Characterization Of Electro-Optical Components'

Article 2008-12-01

Article - The Evolution of Optical Transceiver Test

Article 2008-12-01

An Overview of WiMAX™ Radiated Performance Test Requirements
Published with kind permission of Communications Today

Article 2008-12-01

PDF PDF 292 KB
Boundary-Scan Testing of Power/Ground Pins
This paper describes how traditional Boundary Scan usage can be expanded to include testing of open defects on power and ground pins. Reprinted with kind permission from IEEE.

Article 2008-11-26

PDF PDF 238 KB
Creating High-Performance SDR Architectures
How to co-design RF architectures together with baseband signal processing to create high performance and flexible SDR architectures that can achieve the critical performance specifications necessary in the operational environment.

Article 2008-11-25

PDF PDF 806 KB
Expert Advice: The Importance of Average vs. Peak Performance in Cellular Wireless
The average efficiency of the cell remains much lower than the peaks. November 2008 article by Moray Rumney linked with permission by Microwave Journal.

Article 2008-11-17

Gathers Thought Leaders in International Bead Probe Technology User Group
by Ted T. Turner, Co-Gen Marketing

Feature Story 2008-11-11

PDF PDF 97 KB
Validating IPTV Service Quality Under Realistic Multiplay Network Conditions

Case Study 2008-10-20

PDF PDF 236 KB
Agilent Update, Jack France, Agilent Technologies

Feature Story 2008-10-09

PDF PDF 9.48 MB
Combine techniques to reduce ICT cost complexity
THis article describes how Cover-Extend Technology combines boundary scan and VTEP vectorless test techniques to help manufacturers reduce costs and complexity in their In-Circuit Test strategy

Article 2008-09-25

In-Circuit Test Channel Partner Interview Series: Everett Charles Technologies (ECT)
This article is the second in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features Everett Charles Technologies (ECT), from a programming house perspective.

Feature Story 2008-09-23

PDF PDF 93 KB
IMT-Advanced: 4G Wireless Takes Shape in an Olympic Year
An article, published in Issue 6 of the Agilent Measurement Journal, authored by our lead technologist.

Article 2008-09-01

PDF PDF 372 KB

Previous ... 11 12 13 14 15 16 17 18 19 20 ... Next