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Phase Noise of PLL Functional Blocks in 0.35 μm SiGe Technology - Simulation Results
This brief Article presents results obtained from simulation for the phase noise in a PLL used for a 6.525 GHz fixed frequency source circuit. The simulation was done by using Agilent's ADS.

Article 2006-12-01

PDF PDF 178 KB
Efficere Technologies Develops World Class Test Fixtures
Read about Efficere’s design success using Keysight’s PLTS software, E8364B PNA and N1930A test set

Case Study 2006-11-29

PDF PDF 297 KB
Textron Systems has developed improved ATE Systems using the N6700 Modular Power System

Case Study 2006-11-21

PDF PDF 223 KB
Complete RFIC Design Flow Targeting Next Generation Wireless Front-ends
This Article (by Jurgen Hartung Cadence Design Systems) presents a complete design flow that is crucial for a successful implementation of next generation wireless front-ends.

Article 2006-11-01

PDF PDF 218 KB
Flexible Software-Defined Test Instruments
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.

Article 2006-11-01

PDF PDF 1.95 MB
Agilent Technologies Logic Analyzers Introduces Deepest Memory

Feature Story 2006-11-01

PDF PDF 26 KB
Addressing the new challenges of MIMO wireless LAN manufacturing test
Article reprint from RF Design. New test equipment and techniques can keep the testing costs within the range of that for 802.11a/g systems.

Article 2006-10-01

PDF PDF 1.18 MB
Systematic Troubleshooting of HSDPA Mobile Data Throughput
The aim of this paper is to introduce mobile development engineers to factors impacting data throughput caused by actual customer connections of the mobile device.

Article 2006-09-28

HTML HTML 27 KB
Design Analysis: The Importance of EDA Post Processing
This Article by Andy Howard covers features and capabilities of a post processor that are present in a world-class EDA software package, and also includes many examples.

Article 2006-09-25

PDF PDF 2.21 MB
Test Sets Refine Handset Entertainment
Gaming and multimedia applications challenge testing to be more accurate, consistent, and capable of being reproduced among vendors. Wireless Systems article March 2004. Jan Schiefer.

Article 2006-09-22

Coverage Increased on Through-Hole Components Using PTH2 Algorithm
The 5DX Automated X-ray Inspection plated through hole algorithm, PTH2, provides an increase in accuracy along with repeatability for heavily shaded devices.

Newsletter 2006-09-08

EE Times: Reducing the cost of cellphone testing
With the explosive growth of worldwide mobile phone subscribers in emerging markets such as China and India, all manufacturers feel extreme pressure to reduce costs. Read more in this EE Times article from Sept. 2006 by Agilent employee Dan Aubertin.

Feature Story 2006-09-01

Characterization and Modeling of Bond Wires for High-Frequency Applications
This Article presents a technique to compensate the bond-wire interconnect between two microstrip circuits to give return and insertion loss performance up to 50 GHz using circuit spacing’s/layouts.

Article 2006-09-01

PDF PDF 384 KB
Quick ACPR Analysis Performs Necessary PA Simulations
This article describes a fast method of simulating Adjacent Channel Power Ratio (ACPR) versus input (or output) power level, based on a swept 1-tone harmonic balance simulation.

Journal 2006-07-01

Agilent Technologies, Inc. introduces Industry’s Most Advanced Fixed Configuration Logic Analyzers

Feature Story 2006-05-31

PDF PDF 27 KB
Logic Analysis Application Suite targets High-Speed FPGA, Wireless and Multilane Serial Applications

Feature Story 2006-05-31

PDF PDF 27 KB
10 Good Reasons to Use LXI
10 Reasons to Switch to LXI is the second in a series of notes that will help you make the transition to LXI. This note describes 10 key attributes that make LXI a good choice for your next test system.

Article 2006-04-01

PDF PDF 1.22 MB
Matching Network Yin-Yang - Part 2
This Article by Randy Rhea covers transmission line matching networks, plus a discussion of characteristics of the load affects matching bandwidth and the choice of network topologies.

Article 2006-04-01

PDF PDF 346 KB
Using S-Parameter Data Effectively
This Article by Wilfredo Rivas-Torres focuses on how to incorporate Sparameters in the design process using a CAD approach.

Article 2006-03-30

PDF PDF 144 KB
Matching Network Yin-Yang - Part 1
This Article by Randy Rhea covers basic matching concepts and matching network topologies, emphasizing methods for obtaining the desired performance with networks that are realizable in practice.

Article 2006-03-01

PDF PDF 540 KB
Symmetric and Asymmetric - Coupled Lines Band-Stop Filters at Ku/Ka Bands
This Article presents theory and design of coupled-line spur line band-stop filters, which are quite compact structures, lower radiation loss than conventional shunt stub and coupled-line filters.

Article 2006-03-01

PDF PDF 1.34 MB
Agilent Technologies Logic Analyzers and FuturePlus Systems team up

Feature Story 2006-02-21

PDF PDF 25 KB
CO-DESIGNS’ EDA Vendors guidelines for IC-PACKAGE Designers for effective work
This Article describes CO-DESIGNS’ EDA vendors guidelines for IC and PACKAGE designers on how to work effectively together.

Article 2006-02-02

PDF PDF 257 KB
Overcoming Lower Wetting Forces of Lead-Free Alloys
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, March 2005.

Article 2005-12-05

PDF PDF 77 KB
Putting Pb-Free to the Test - Why AOI and SPI are vital to upfront process control and verification.
Written by Stig Oresjo, Thorsten Niermeyer & Stacy Johnson, Agilent Technologies. Article published in Circuits Assembly, May 2005.

Article 2005-12-05

PDF PDF 74 KB

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