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Improving Radar Performance by Optimizing Overall Signal-to-Noise Ratio
Better noise-figure measurements enhance characterization of excess noise in receivers.

Application Note 2014-08-01

Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2014-08-01

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Keysight provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2014-08-01

Revisiting Mismatch Uncertainty with the Rayleigh Distribution - White Paper
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

Application Note 2014-08-01

PDF PDF 1.17 MB
Understanding Oscilloscope Frequency Response & Its Effect on Rise-Time Accuracy - Application Note
In this application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

Ultra-Low Impedance Measurements using 2-Port Measurements
This application note explains using 2-port VNA techniques can completely eliminate the artifacts associated with contact impedance of the probes or fixturing to the DUT.

Application Note 2014-07-31

PDF PDF 4.68 MB
Transferring Arbitrary Waveform Data to the 33200A Family of Function/Arbitrary Waveform Generators
This application note will review three methods of transferring arbitrary waveform data to 33200A Function/Arbitrary Waveform Generators: front panel, Keysight IntuiLink Waveform Editor, and programming.

Application Note 2014-07-31

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Improved Methods for Measuring Distortion in Broadband Devices - Application Note
This paper illustrates that, in broadband commercial and defense systems, it is more important than ever to characterize them for non-linearity. It is also important to understand the mechanisms that create these non-linearities and the characteristics of the waveforms that cause them. We focus on the primary tests used to determine the level of a system’s distortion products and how they result in Intermodulation Distortion (IMD) and Intermodulation Distortion Noise (IMDN). Looking at the method to evaluate the effect of IMD in a communication system under real data traffic conditions, Noise Power Ratio (NPR), we see measures of the IMD as a function of data traffic conditions in a wideband or multi-channel communications channel.

Application Note 2014-07-31

PDF PDF 2.17 MB
Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2014-07-31

Generating Complex ECG Patterns with an Arbitrary Waveform Generator
Generating complex ECG patterns with an arbitrary waveform generator.

Application Note 2014-07-31

PDF PDF 936 KB
Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2014-07-31

PDF PDF 531 KB
Solving the Challenges of Solar Array Simulation - Application Note
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

Application Note 2014-07-31

Imaging and Testing Dry and Hydrated Mouse Lung Endothelial Cells with a Nanoindenter
Review of new test method to scan and indent cells in liquid.

Application Note 2014-07-31

PDF PDF 339 KB
Testing Battery Chargers with the U2722A USB Modular Source Measure Unit - Application Note
This application note shows the capabilities and benefits of utilizing the U2722A USB modular source measure unit to test battery chargers.

Application Note 2014-07-31

PDF PDF 1.33 MB
Understanding and Using Offset in InfiniiMax Active Probes - Application Note
This application note explains how offset is applied in the Keysight InfiniiMax Active Probes and how to use offset for various applications

Application Note 2014-07-31

Tango Achieves Extreme Bandwidth and Channel Density Scope Systems - Application Note
Tango software is used to time synchronize multiple 90000 Q-Series oscilloscopes into one high bandwidth and high channel density measurement system.

Application Note 2014-07-31

PDF PDF 931 KB
Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

3rd Order 1900MHz Low Noise Amplifier using Infineon SiGe BFP620 Transistor
This Application Note is based directly on a design documented in the Infineon’s AN 60. This detailed application information is provided in support of the “SiGe BFP620 Amp” e.g. shipped with the S/W.

Application Note 2014-07-31

PDF PDF 1.09 MB
Quantitative Mechanical Measurements at the Nano-Scale Using the DCMII - Application Note

Application Note 2014-07-31

PDF PDF 545 KB
Three Easy Steps to Create Your Own Notch Filter for the U8903A Audio Analyzer Using the VEE
Three Easy Steps to Create Your Own Notch Filter for the U8903A audio analyzer using the Keysight Vee software application note

Application Note 2014-07-31

PDF PDF 1.77 MB

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