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Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Application note
PC-based oscilloscope analysis software enables engineers to work remote from the target system and scope, and it makes sharing and analyzing data an easier experience.

Application Note 2013-09-05

PDF PDF 803 KB
DC-DC Converter Evaluation - Flyer
This 1-pager describes "Quick Bench-top Evaluation" of DC-DC converter and shows real measurement results of DC and transient tests made by B2900A series.

Application Note 2013-08-29

PDF PDF 1.04 MB
Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application brief provides key issues and recommended solutions for increasing the speed of transceiver test.

Application Note 2013-08-27

PDF PDF 1.10 MB
FieldFox Remote Viewer - Application Brief
FieldFox remote viewer is a FREE iOS app, that allows you to view and control FieldFox from your iOS device. This brief describes three configurations to setup your FieldFox to your iOS device.

Application Note 2013-08-27

PDF PDF 1.93 MB
Protect Against Power-Related DUT Damage During Test - Application Note
This application note discusses choosing a power supply with extensive integrated protection features to avoid power-related damage.

Application Note 2013-08-23

Logic Analysis Fundamentals - Application Note
Mobile device internal FPGA signals are almost exclusively parallel bus. This application note examines parallel bus measurement basics, including functional and timing verification and debug.

Application Note 2013-08-21

PDF PDF 2.04 MB
Reducing Device-Failure Risk with a Black-Box Recorder - Application Note
A Black Box recorder can give you critical insight into DUT failures and can help you develop an effective test strategy.

Application Note 2013-08-21

Load-Cell Testing in Practice - Application Note
In this application note, you will discover the advantages of using one-box source-and-measure U3606B to perform load-cell testing.

Application Note 2013-08-21

Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence

Application Note 2013-08-20

PDF PDF 192 KB
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

Application Note 2013-08-19

PDF PDF 5.48 MB
The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

Creating and Optimizing 802.11ac Signals with the M8190A AWG - Application Note
Designs for 802.11ac WLAN devices require test equipment that can provide the best reference test signals and measurements. N7617B enables this type of signals to be generated with the M8190A AWG.

Application Note 2013-08-13

PDF PDF 606 KB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application
This app note provides an outline of the techniques involved and the solutions Keysight provides for RF, baseband and system developers.

Application Note 2013-08-05

Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation - Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2013-07-30

PDF PDF 2.29 MB
Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

PDF PDF 592 KB
Improving Throughput with your Power Supply - Hints 1 through 5 – Application Brief
This application compendium consists of 1 through 5 of the 10 hints on how to improve throughput with your power supply.

Application Note 2013-07-29

Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

Merging boards on Keysight x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Oscilloscope Selection Tip 11: Probing - Application Note
Tip 11: Select an oscilloscope from a vendor that can also provide the variety of specialty probes that you may require.

Application Note 2013-07-24

PDF PDF 638 KB
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Application Note 2013-07-24

Measuring Agile Signals and Dynamic Signal Environments
Download this application note to learn real-time spectrum analysis techniques that will help you not only discover but make precise and selective measurements of complex and elusive signals.

Application Note 2013-07-23

Methods for Characterizing and Tuning DC Inrush Current - Application Brief
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2013-07-18

How to Select Your Next Oscilloscope: 12 Tips on What to Consider Before you Buy - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your specific measurement needs and budget is an important task.

Application Note 2013-07-17

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