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Electronic Measurement

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Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2014-12-16

PDF PDF 2.06 MB
Assurance of Calibration Results: Applying the Power of Visual Information to Improve Quality
White paper on how Keysight maintains the ongoing reliability and validity of our calibration processes to help you mitigate the risks inherent in your measurements by using control charts.

Application Note 2014-12-15

PDF PDF 267 KB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Application Note 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Application Note 2014-12-10

PDF PDF 2.33 MB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Application Note 2014-12-08

PDF PDF 742 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Application Note 2014-12-08

PDF PDF 329 KB
Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2014-12-05

PDF PDF 690 KB
Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
Scanning Microwave Microscope Mode - Application Note

Application Note 2014-12-04

PDF PDF 320 KB
Two-port Measurements and S-Parameters - Application Note
Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2014-11-21

PDF PDF 576 KB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-11-19

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2014-11-10

PDF PDF 333 KB
Generating Multi-Dimensional Signals to Test Radar/EW Systems
This application note describes how to use SystemVue to generate multi-dimensional signals for testing Radar and modern Electronic Warfare (EW) systems.

Application Note 2014-11-09

PDF PDF 3.04 MB
Preamplifiers and System Noise Figure
Learn how to reduce the noise figure of RF & MW test systems using a low noise amplifier

Application Note 2014-11-07

Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Application Note 2014-11-07

PDF PDF 166 KB
TS-8989 PXI Functional Test System - System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2014-11-06

PDF PDF 611 KB
Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-11-05

PDF PDF 925 KB
Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Impedance Matching in the Laboratory - Application Note
Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2014-10-17

PDF PDF 501 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

Application Note 2014-10-12

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2014-10-11

PDF PDF 731 KB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
Precise Evaluation of Input,Output, and Reverse Transfer Capacitances of Power Devices - White Paper
Accurate characterization of power device capacitance parameter becomes important for power circuit design. This paper introduces a solution to characterize Ciss, Coss, Crss and Rg automatically.

Application Note 2014-10-10

PDF PDF 2.49 MB

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