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LTE Reference Vector
A fresh approach to Comms PHY system design challenges.

Application Note 2015-01-20

PDF PDF 270 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
Getting the Calibration You Need - Application Note
Calibration is the process of measuring the actual performance of an IUT using lab instruments that have significantly better performance than the IUT. Selecting the right calibration provider is key.

Application Note 2015-01-17

A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing – Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2015-01-15

PDF PDF 3.03 MB
Automated Receiver Sensitivity Measurements Using U8903B - Application Note
This note shows how the test sequencer together with the GPIB master functionality in the U8903B can be used to easily make automated Receiver Sensitivity measurements that are reliable and repeatable.

Application Note 2015-01-14

PDF PDF 1 KB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

PDF PDF 607 KB
HV Cable Insulation Resistance Testing for Hybrid Vehicles - Application Note
Hybrid vehicle technology has grown rapidly over the last decade because of its fuel efficiency and low emissions. Today’s hybrid systems are more sophisticated than conventional engines and leverage the best operating characteristics of the combustion engine and electric motor based on driving conditions. This helps to achieve superior fuel efficiency and reduce CO2 emissions.

Application Note 2015-01-09

PDF PDF 279 KB
Tips for Preventing Damage to Signal Generator - Application Brief
Popular Keysight models: E443xB, E4438C, E82x7D

Application Note 2015-01-08

Tips for Preventing Spectrum Analyzer Damage - Application Brief
Committed to your success throughout your equipment's lifetime

Application Note 2015-01-08

Tips for Preventing Damage to DCA, OSA TDR Analyzer - Application Brief
Popular Keysight models: 54754A, 86100C

Application Note 2015-01-08

Tips for Preventing Damage to Network Analyzer - Application Brief
Popular Keysight models: 8753A/B/C/D/E/ES/ET, 8754A, E5070B, E5071B, E5071C, E5061A and E5061B

Application Note 2015-01-08

Tips for Preventing Damage to Communication Test Set - Application Brief
Popular Keysight models: E5515A/B/C/T

Application Note 2015-01-08

Tips for Preventing Damage to Digital Multimeter - Application Brief
Popular Keysight models: 3458A, 34401A

Application Note 2015-01-08

Tips for Preventing Damage to Power Sensor & Meter - Application Brief
Popular Keysight models: E441x Series, E93xx Series, 848x Series

Application Note 2015-01-08

Tips for Preventing Damage to 42481A and LCR Meter - Application Brief
Keysight Model 42841A and LCR Meter

Application Note 2015-01-08

Tips for Preventing Instrument Damage - Application Brief

Application Note 2015-01-08

PDF PDF 462 KB
Component Testing Using an Oscilloscope with Integrated Waveform Generator – Application Note
This application note illustrates methods for testing components using an oscilloscope and waveform generator.

Application Note 2015-01-08

PDF PDF 3.21 MB
Power of Impedance Analyzer - Application Note
This application note describes the necessity of real-characteristics evaluation, and shows that the impedance analyzers only have capabilities to achieve real-characteristics.

Application Note 2015-01-07

PDF PDF 1.07 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2015-01-07

PDF PDF 7.95 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Application Note 2015-01-05

PDF PDF 437 KB
Single Pass KFM Study of Current Transport in Graphene and Graphene to Metal Contacts - App Note

Application Note 2014-12-30

PDF PDF 935 KB
Mechanical Characterization of Sol Gel Coatings Using a Nano Indenter G200 - Application Note
A case study on Nanomechanical Characterization of Sol Gel Coatings.

Application Note 2014-12-29

PDF PDF 1.33 MB
Mechanical Properties Measurement on Individual Composite Micro-Fibers - Application Brief
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Application Note 2014-12-29

PDF PDF 495 KB

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