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Spectrum Analysis and the Frequency Domain - Application Note
Teaching Lab #2: Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2015-05-05

The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2015-05-04

PDF PDF 343 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2015-05-04

PDF PDF 624 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2015-05-03

PDF PDF 1.38 MB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2015-04-30

PDF PDF 552 KB
Overcome Your Test Challenges with Truevolt Series Digital Multimeters - Application Compendium
This compendium consists of six Keysight Truevolt Series digital multimeter application briefs

Application Note 2015-04-30

PDF PDF 4.02 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2015-04-30

PDF PDF 521 KB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Application Note 2015-04-30

PDF PDF 2.75 MB
Impedance Matching in the Laboratory - Application Note
Teaching Lab #4:Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2015-04-29

Making Simpler DC Power Measurements with a Digital Multimeter - Application Brief
Learn what techniques are available to Truevolt Series DMM users for making simpler DC power measurements with a DMM.

Application Note 2015-04-29

PDF PDF 632 KB
Keysight Tips to Prevent Unnecessary Repairs - Application Brief
Brief document to prevent instrument damage and avoid unnecessary repairs with techniques on proper grounding, cable and connector care, electro discharge precautions, transit instructions and more.

Application Note 2015-04-29

Two-port Measurements and S-Parameters - Application Note
Teaching Lab # 5: Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2015-04-29

Transmission Lines and Reflected Signals - Application Note
Teaching Lab #3:Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2015-04-29

Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Application Note 2015-04-28

PDF PDF 2.67 MB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

Application Note 2015-04-28

PDF PDF 4.95 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Application Note 2015-04-28

PDF PDF 967 KB
Boost signals for test and measurement with the right RF and microwave amplifier - Application Note
This application note focuses on RF and microwave amplifiers that are well suited for use in test and measurement applications.

Application Note 2015-04-28

Isolating Frequency Measurement Error and Sourcing Frequency by Robert Leiby
When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.

Application Note 2015-04-27

PDF PDF 3.09 MB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2015-04-27

Using a Manufacturer's Specification as a Type B Error Contribution - White Paper
Examines the implications of using a manufacturer's specification in an uncertainty analysis; and how calibration laboratories use uncertainty data in their quality systems and customer-facing documents.

Application Note 2015-04-27

PDF PDF 1.03 MB
Characterizing Coils in Wireless Charging Systems Using the E4980A/AL LCR Meter - Application Note
This note describes how Keysight E4980A/AL Precision LCR meters are suitable for characterizing the coils which is the most commonly used component in the wireless charging system.

Application Note 2015-04-26

PDF PDF 418 KB
Calibration Process Innovation Using Non-Required Guard Banded Testing by Richard Ogg
Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.

Application Note 2015-04-24

PDF PDF 258 KB
Getting the Calibration You Need - Application Note
Calibration is the process of measuring the actual performance of an IUT using lab instruments that have significantly better performance than the IUT. Selecting the right calibration provider is key.

Application Note 2015-04-24

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

PDF PDF 2.22 MB

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