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Radar Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 6.84 MB
Uncertainty Propagation for Measurements with Multiple Output Quantities
Measurements with multiple output quantities exist in many disciplines. This paper discusses using matrix notation, which can be applied to a practical measurement uncertainty example involving complex quantities.

Analysis Tool 2014-08-20

Average Power Sensor Uncertainty Calculator Rev9
Average Power Sensor Uncertainty Calculator Rev9

Application Note 2014-08-19

XLS XLS 82 KB
Understanding Measurement Risk - White Paper
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

Application Note 2014-08-12

PDF PDF 735 KB
Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Application Note
This document describes six major factors that determine the POI value and relative amplitude: sampling rate, time-record length, windowing function, window size, overlap processing, and noise floor.

Application Note 2014-08-04

PDF PDF 2.53 MB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-08-04

Materials Measurement: Liquid Materials - Application Brief
This application brief provides the solutions for measuring dielectric properties of liquid materials.

Application Note 2014-08-04

PDF PDF 1.24 MB
Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Application Note 2014-08-04

PDF PDF 645 KB
Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-08-04

Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2014-08-04

PDF PDF 1.59 MB
Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Application Note 2014-08-04

PDF PDF 2.52 MB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

External Triggering 2-Way Communication Frequency & Power Sweep Measurement - Application Brief
This demonstrates the capability of an N1911A/12A P-Series power meter to perform external triggering 1-way and 2-way communication frequency and power sweep measurements.

Application Note 2014-08-03

PDF PDF 272 KB
Real-Time Spectrum Analysis for Troubleshooting 802.11n/ac WLAN Devices - Application Note
This application brief will explain, using specific examples, how real-time spectrum analysis can help identify interfering signals that can impact the performance of WLAN devices.

Application Note 2014-08-03

PDF PDF 2.64 MB
Simplifying Multi-Channel Measurement Synchronization - Application Brief
How to set up multiple channel power measurments using the U2020 X-Series USB peak power sensors and P-Series power meter.

Application Note 2014-08-03

PDF PDF 691 KB
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2014-08-03

PDF PDF 5.89 MB
8990B PPA - Droop Measurement - Application Note
This application brief demonstrates the ability of the 8990B PPA with windows software to perform droop measurement using its trace graph.

Application Note 2014-08-03

PDF PDF 539 KB
Methods for Characterizing and Tuning DC Inrush Current - Application Brief
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2014-08-03

Enhancing Measurement Performance for the Testing of Wideband MIMO Signals - White Paper
This white paper describes a method for characterization and correction of channel frequency response for BBIQ measurements over large bandwidths when using the Keysight M9703A and 89600 VSA software.

Application Note 2014-08-03

PDF PDF 1.47 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 1.57 MB
TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Application Note 2014-08-03

PDF PDF 324 KB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2014-08-03

PDF PDF 6.63 MB
Conquering the Multi Kilowatt Source/Sink Test Challenge - Application Note
This application note discusses how the Keysight APS N6900/N7900 DC power supplies feature integrated sourcing and sinking capability tailored for the test needs of today’s bidirectional and regenerative energy systems and devices.

Application Note 2014-08-03

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