Here’s the page we think you wanted. See search results instead:


Contact an Expert

Technical Support

Electronic Measurement

Support by Product Model Number:

1-25 of 55

Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-10-01

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2015-07-25

Enhance EMC Testing with Digital IF - Application Note
This application note will discuss the differences between analog and digital IF architecture and explain how digital IF enhances both compliance and precompliance measurement processes.

Application Note 2015-06-18

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2015-02-01

Streamline EMC Compliance Testing with Prescan Analysis Tools - Application Note
Application note

Application Note 2014-08-01

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

Accurate Absolute and Relative Power Measurements Using the N5531S - Application Note

Application Note 2012-12-04

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Migrating Code from the 8903B to the U8903A - Application Note
This application note describes how to migrate the old commands used for HP 8903B to SCPI commands used by U8903A.

Application Note 2009-06-29

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

Fast, Easy, and Accurate Microwave Phase Noise Measurements using the E5052B with the E5053A

Application Note 2008-05-22

E5052B Signal Source Analyzer Advanced Phase Noise and Transient Measurement Techniques
This application notes describes two major advanced techniques of the SSA in phase noise measurement and transient measurement.

Application Note 2007-10-02

Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver

Application Note 2007-08-15

Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Application Note 2007-05-09

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis

Application Note 2006-04-05

Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices

Application Note 2005-11-01

Validating Transceiver FPGAs Using Advanced Calibration Techniques

Application Note 2005-04-27

Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems

Application Note 2005-04-05


1 2 3 Next