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1-25 of 28

Maximizing Battery Life of IoT Smart Devices with Keysight Solutions - Application Brief
This application brief details the design and test challenges involved with maximizing the battery life of Internet of Things (IoT) smart devices, and recommends Keysight solutions to address them.

Application Note 2016-07-14

Evaluating Adaptive Fast USB Battery Charging of Mobile Devices - Application Note
To offset greater power consumption, today’s mobile devices are now incorporating larger batteries; and the consequences are it takes longer to recharge due to the marginal power delivery of USB.

Application Note 2015-09-16

Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2015-05-29

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Power Toolbox for Embedded System Design, Dynamic Current Profiling
This is the 2nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; focusing on dynamic current profiling.

Application Note 2009-12-15

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Base Station Subassemblies: Addressing DC Power Test Challenges
This application note addresses the numerous DC power-related challenges that base station providers are faced with during development and production test of their subassemblies.

Application Note 2009-11-16

Power Toolbox for Embedded System Design-Simulating Power Supply Interrupts
This is the 3nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; specifically preventing power supply interrupts

Application Note 2009-08-21

Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

Simulating Power Interruptions for DC Input Devices
This application brief describes how the Keysight N6705A DC Power Analyzer can simulate power inter-ruptions for DC input devices.

Application Note 2008-09-25

Comparing the N6700 Low-Profile and DC Power Analyzer Mainframes

Application Note 2008-01-10

Automotive ECU Transient Testing Using Captured Power System Waveforms

Application Note 2008-01-10

FPGA Circuit Design: Overcoming Power-Related Challenges

Application Note 2008-01-09

Avoid DUT Damage by Sequencing Multiple Power Inputs Off Upon a Fault Event
Having the ability to control the power supply system itself can greatly reduce the effort and complexity associated with an external shut-down control method.

Application Note 2007-12-05

Biasing Multiple Input Voltage Devices in R&D
This application brief describes using the voltage output synchronization capabilities of modular power supplies in R & D multiple bias applications.

Application Note 2007-05-07

Accelerate Vehicle Charging System Simulation with the N6705A DC Power Analyzer
This application brief describes how the Keysight N6705A DC Power Analyzer can simulate vehicle charging system power waveforms for R & D electrical component testing.

Application Note 2007-04-30

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

Powering DC-to-DC Converters Using the Keysight N6705A DC Power Analyzer
This application brief describes an example of how an R&D engineer can test DC-to-DC converters using capabilities of the N6705A DC Power Analyzer.

Application Note 2007-04-11

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Testing LCD Backlight Inverters using the Keysight N6700 Modular Power System (MPS)

Application Note 2005-12-09

N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)

Application Note 2005-07-27

Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

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