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Using Pulse-Width Modulation to Control Signals
The use of pulse-width modulation (PWM) has become an increasingly popular technique for controlling analog circuits with a digital signal.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Waveform capture, modification and playback using a function generator
Function generators are used to simulate real-world signals on a device.

Application Note 2008-10-30

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Understand Keysight 34405A DMM Operation
This application note explains the architecture of the Keysight 34405A digital multimeter and helps you better understand the 34405A DMM and thus work more effectively.

Application Note 2008-07-17

Side-by-Side Comparison: Keysight 34405A and Fluke 45 Digital Multimeter
Selection and Configuration Guides: This literature compares two benchtop products: Keysight 34405A and Fluke 45 DMM.

Application Note 2008-07-17

Migration for the Keysight 34401A to the Keysight 34405A Digital Multimeter
This application note explains how to migrate from the Keysight 34401A to the new 34405A digital multimeter.

Application Note 2008-07-17

Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Application Note 2008-04-03

Making the Best Out of Keysight U1250A Series Handheld Digital Multimeters
In this application note, you will learn how to optimize the automatic datalogging capability, checking reference clock, and simplify electronic troubleshooting with the square wave output generator of the Keysight handheld digital multimeters.

Application Note 2008-01-30

Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

Keysight L4411A Makes It Easy for ATTI to Transition Test System from VXI to LXI
Advanced Testing Technologies, Inc. (ATTI) served as a beta test site for the new L4411A 6 ½ digit 1U DMM and found it easy and fast to replace their E1412A VXI DMM with the L4411A LXI DMM in their test system. This paper describes their experience.

Application Note 2007-02-28

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Easy Steps to Integrate the 34405A Multimeter into a System
Application note: This application note gives you tips on how to integrate the 34405A DMM to a test system.

Application Note 2007-02-02

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

34410A/34411A 6 1/2 Digit High Performance Multimeters
This application note provides key insights on the functionality, performance and use of the Keysight 34410A and 34411A 6 1/2 Digit High Performance Digital Multimeters.

Application Note 2006-08-02

Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Application Note 2006-05-03

Understanding Reading Accuracy and Resolution in a 6 1/2 Digit Digital Multimeter
This application note explains the reality and the mathematics behind digital multimeter resolution and DC noise specification which directly correlate to the number of digits available from the digital multimeter at a given resolution and speed.

Application Note 2006-03-30

Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Application Note 2006-03-23

Replacing the Keysight 34401A with the New 34410A/34411A High Performance Digital Multimeters
This application note provides a high level overview of the differences between the Keysight 34401A 6 1/2 Digit Digital Multimeter and the new Keysight 34410A and 34411A 6 1/2 Digit High Performance DMMs.

Application Note 2005-11-15

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Application Note 2005-06-29

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19


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