Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

51-75 of 77

Sort:
Making the Best Out of Keysight U1250A Series Handheld Digital Multimeters
In this application note, you will learn how to optimize the automatic datalogging capability, checking reference clock, and simplify electronic troubleshooting with the square wave output generator of the Keysight handheld digital multimeters.

Application Note 2008-01-30

Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Keysight L4411A Makes It Easy for ATTI to Transition Test System from VXI to LXI
Advanced Testing Technologies, Inc. (ATTI) served as a beta test site for the new L4411A 6 ½ digit 1U DMM and found it easy and fast to replace their E1412A VXI DMM with the L4411A LXI DMM in their test system. This paper describes their experience.

Application Note 2007-02-28

PDF PDF 178 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

Easy Steps to Integrate the 34405A Multimeter into a System
Application note: This application note gives you tips on how to integrate the 34405A DMM to a test system.

Application Note 2007-02-02

PDF PDF 226 KB
34410A/34411A 6 1/2 Digit High Performance Multimeters
This application note provides key insights on the functionality, performance and use of the Keysight 34410A and 34411A 6 1/2 Digit High Performance Digital Multimeters.

Application Note 2006-08-02

Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Application Note 2006-05-03

Understanding Reading Accuracy and Resolution in a 6 1/2 Digit Digital Multimeter
This application note explains the reality and the mathematics behind digital multimeter resolution and DC noise specification which directly correlate to the number of digits available from the digital multimeter at a given resolution and speed.

Application Note 2006-03-30

Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Application Note 2006-03-23

Replacing the Keysight 34401A with the New 34410A/34411A High Performance Digital Multimeters
This application note provides a high level overview of the differences between the Keysight 34401A 6 1/2 Digit Digital Multimeter and the new Keysight 34410A and 34411A 6 1/2 Digit High Performance DMMs.

Application Note 2005-11-15

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Application Note 2005-06-29

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
Direct instrument connection using LAN
If connecting directly to an instrument using LAN (rather than through a server) there are some steps that can be taken to make the initial connection faster and get you up-and-running more quickly.

Application Note 2004-11-01

Tips for Making Better AC, True RMS Measurements
Learn to make better ac measurements. Learn about ac signals and how to take advantage of features built-in to your multimeter.

Application Note 2004-05-19

Practical Tips for Optimizing Measurement Accuracy with your Digital Multimeter
This series of three application notes will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM.

Application Note 2004-05-14

9 Tips for Making Better Resistance Measurements
Nine tips for making better resistance measurements with your Keysight voltmeter.

Application Note 2003-11-18

Recognizing and Reducing Data Acquisition Switching Transients (AN 1444)
Unforeseen problems can occur when making sequential measurements with a data acquisition/switch unit or data logger. This application note can help you recognize, understand and resolve these problems associated with switching transients.

Application Note 2003-03-03

Maximizing the Life Span of Your Relays (AN 1399)
This application note tells you how to maximize your relay's potential life by selecting the right relays for the type of measurements you are making.

Application Note 2002-06-11

AC Voltage Measurement Errors in Digital Multimeters (AN 1389-3)
This application note is the third in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers ac voltage measurement errors. For an overview of system cabling errors and dc voltage measurement errors...

Application Note 2002-01-31

System Cabling Errors and DC Voltage Measurement Errors in Digital Multimeters (AN 1389-1)
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors and more.

Application Note 2002-01-31

8 Hints for Making Better RF Counter Measurements
This Brochure focuses on making better RF counter measurements by understanding the effects of counter architecture; recognizing the difference between resolution and accuracy, and scheduling calibration to match performance needs. In addition, the impact of timebase options is discussed along...

Application Note 2001-04-10

Previous 1 2 3 4 Next