Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

1-25 of 134

Sort:
TS-8989 System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2015-06-10

PDF PDF 2.76 MB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Application Note 2015-05-11

PDF PDF 772 KB
Using a Function/Arbitrary Waveform Generator to Generate Pulses - Application Note
A Function Generator can be a low cost alternative for creating simple pulses. This application note describes several techniques for creating pulses using a Function Generator.

Application Note 2015-02-19

Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2015-02-13

Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2014-12-17

Radar Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 6.84 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

Testing Battery Chargers with the U2722A USB Modular Source Measure Unit - Application Note
This application note shows the capabilities and benefits of utilizing the U2722A USB modular source measure unit to test battery chargers.

Application Note 2014-07-31

PDF PDF 1.33 MB
Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note
New advances in signal processing provide improvements in sweep speeds by implementing a new type of digital RBW filter in X-Series signal analyzers. This application note focuses on these new improvements.

Application Note 2014-02-11

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
RS-232 Troubleshooting - Application Note
In the course of dealing with personal computers, you may use the RS-232 serial interface. This application note will describe RS-232 at a basic level, with an orientation towards Windows®- based instrument programming.

Application Note 2013-07-31

PDF PDF 111 KB
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

PDF PDF 2.54 MB
Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

Application Note 2012-04-30

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

Switching Solutions
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

High-Performance Arbitrary Waveform Generation for RADAR and LIDAR Application
Presentation given at the Aerospace and Defense Symposium in 2009. It covers radar principles and challenges, radar test systems, and Keysight solutions.

Application Note 2010-02-17

PDF PDF 1.32 MB
Creating, Editing, Transferring Arbitrary Waveforms with Keysight U2761A Function Generator
This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions.

Application Note 2009-12-11

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

1 2 3 4 5 6 Next