Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

1-25 of 991

Sort:
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2014-08-04

PDF PDF 1.59 MB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2014-06-02

PDF PDF 1.59 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Application Note 2014-05-07

PDF PDF 1.44 MB
Introduction to SECM and Combined AFM-SECM - Application Note

Application Note 2014-05-07

PDF PDF 962 KB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 3.67 MB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Application Note 2014-04-23

Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-04-21

Essentials of Coherent Optical Data Transmission - Application Note
The Application Note explains how complex modulated optical signals can maximize bit transfer efficiency in fiber optical data transmission.

Application Note 2014-04-02

PDF PDF 3.03 MB
Solutions for WLAN 802.11ac Manufacturing Test - Application Note
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2014-04-02

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-02-26

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2014-02-25

Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Application Note 2014-02-17

PDF PDF 2.29 MB
Mechanical Properties Measurement on Individual Composite Micro-fibers - Application Note
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Application Note 2014-02-07

PDF PDF 188 KB
High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2013-12-18

Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2013-12-18

PDF PDF 205 KB
The Handling and Bonding of Beam Lead Devices Made Easy - Application Note
Beam Lead Device handling and protection (from electrostatic discharge) is presented in this publication from 1981.

Application Note 2013-12-09

PDF PDF 4.69 MB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Application Note 2013-11-21

PDF PDF 163 KB
What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

1 2 3 4 5 6 7 8 9 10 ... Next