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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-05-28

Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-05-16

Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Introduction to SECM and Combined AFM-SECM - Application Note

Application Note 2014-05-07

PDF PDF 962 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Application Note 2014-05-07

PDF PDF 1.44 MB
Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Application Note 2014-05-05

PDF PDF 1.48 MB
Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2014-04-30

ARINC 429 Mask Files and Application Note
ARINC 429 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Analysis Tool 2014-04-30

ZIP ZIP 2.05 MB
MIL-STD-1553 Mask Files and Application Note
MIL-STD-1553 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Analysis Tool 2014-04-30

ZIP ZIP 1.58 MB
Finding the Cause of an Infrequent Glitch Using the InfiniiVision 6000 X-Series - Application Note
This application note is a supplement to “Finding the coupling signal that causes the glitch”a built-in and automatic demonstration on the Keysight InfiniiVision 6000 X-series.

Application Note 2014-04-29

PDF PDF 1.92 MB
FieldFox Applications
Every piece of gear in your kit had to prove its worth. Measuring up and earning a spot is the driving idea behind FieldFox. It’s equipped to handle routine maintenance, in-depth analysis and anything in between.

Application Note 2014-04-29

Characterizing CAN Bus Arbitration - Application note
This app note will explain the CAN non-destructive bit-wise arbitration process. The InfiniiVision 4000 and 6000 X-Series oscilloscopes show examples of triggering and decoding those messages.

Application Note 2014-04-28

PDF PDF 1.23 MB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 3.67 MB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Application Note 2014-04-23

High-Speed Broadband Spectroscopy Measurements Advance Molecular Research - Application Note
This application note describes how Keysight’s data conversion technology enables highly accurate rotational spectroscopy for the generation of a precise library of reference spectra.

Application Note 2014-04-23

PDF PDF 1.71 MB
Triggering on Infrequent Anomalies and Complex Signals using InfiniiScan Zone - Application Note
Learn how Keysight's exclusive InfiniiScan Zone touch trigger helps you trigger on infrequent anomalies and complex signals with ease.

Application Note 2014-04-21

ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using a Keysight 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2014-04-21

PDF PDF 2.40 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-04-21

Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details - Application Note
The quality of your oscilloscope’s display can make a big difference in your ability to troubleshoot your designs effectively.

Application Note 2014-04-21

Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB

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