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Layout of Calibration Certificates And Measurement Reports - Application Note
Keysight has recently instituted some minor changes on calibration certificates. This lit piece explains the rationale for these changes.

Application Note 2014-03-20

PDF PDF 473 KB
Preventive Maintenance Test with Insulation Resistance Test - Application Note
This application note describes factors that affect insulation resistance, various insulation resistance test methods, and provides guidelines for selecting the appropriate test for the application.

Application Note 2014-03-20

Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Application Note 2014-03-18

Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-03-18

Automotive Serial Bus Testing - Application Note
This application note will show examples of characterizing the performance of various automotive serial buses using Keysight oscilloscopes and provide a summary of recommended probing solutions.

Application Note 2014-03-17

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-03-17

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Jitter Analysis Using Keysight's InfiniiVision 6000 X-Series and Infiniium Series - Application Note
A discussion of various display formats used to view jitter including horizontal waveform histograms, TIE histograms, TIE trend waveforms, and jitter spectrum waveforms.

Application Note 2014-03-12

Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

Application Note 2014-03-07

PDF PDF 3.73 MB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-03-04

Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Application Note 2014-03-04

PDF PDF 1.10 MB
CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2014-03-03

PDF PDF 2.63 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
Learn about probing the hi-speed USB 2.0 serial bus and see some unique debugging tools and capabilities that can help you get your embedded designs to market faster.

Application Note 2014-03-03

Creating a Differential Signal with a Waveform Generator – Application Brief
Learn how Trueform waveform generators can be used to help you create differential signals, while also reducing your development cost with this 4-page application brief.

Application Note 2014-02-28

Effortlessly Couple or Synchronize Two Signals on a Waveform Generator – Application Brief
Learn how Trueform waveform generators make it easy to couple the amplitude or frequency between channels with this 4-page application brief. You can even have both channels output the same signal.

Application Note 2014-02-28

Generating a Waveform with Many Points – Application Brief
Learn how Trueform waveform generators can help you output long or complex waveforms using a number of unique features not found in other commercially available solutions with this 4-page application brief.

Application Note 2014-02-28

Be More Efficient Designing and Using your Arbitrary Waveforms – Application Brief
Learn how Trueform generators can help you reuse, re-sort or trigger your arb waveforms to build a whole new signal with this 4-page application brief.

Application Note 2014-02-28

Simulating Signals with the Highest Integrity – Application Brief
Learn how Trueform waveform generators allow you to accurately represent your signals without the weaknesses of DDS with this 4-page application brief.

Application Note 2014-02-28

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-02-26

Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2014-02-25

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Application Note 2014-02-17

PDF PDF 2.29 MB
Solutions for Millimeter Wave Wireless Backhaul - Application Note
This “Solutions for Millimeter Wave Wireless Backhaul” app note gives insight into designing and testing E-band backhaul using effective network analysis, and signal generation and analysis solutions.

Application Note 2014-02-14

U2020 X-Series USB Sensor Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for U2020 X-Series.

Application Note 2014-02-14

XLS XLS 22 KB

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