Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

By Product Category

76-100 of 2822

Sort:
S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

Compatibility of USB Power Sensors with Keysight Instruments – Application Note
Application note on "Compatibility of USB Power Sensors with Keysight Instruments".

Application Note 2014-08-02

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2014-08-02

PDF PDF 4.04 MB
Waveform Update Rate Determines Probability of Capturing Elusive Events - Application Note
See how you can increase your odds of finding infrequent glitches with a high oscilloscope update rate.

Application Note 2014-08-02

Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2014-08-02

Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details - Application Note
The quality of your oscilloscope’s display can make a big difference in your ability to troubleshoot your designs effectively.

Application Note 2014-08-01

FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Keysight provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Evaluating Oscilloscopes to Debug Mixed-Signal Designs - Application Note
Discusses the number of channels, bandwidth, sample rates and triggering required to effectively monitor various analog and digital I/O signals in typical MCU/DSP-based embedded designs.

Application Note 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Troubleshooting VFDs with Low Pass Filter - Application Note
Technicians constantly face the challenge of obtaining accurate voltage and frequency measurement that tallies with the readings shown on the VFD control panel display. With Keysight’s handheld multimeter that is equipped with a switchable 1-kHz low pass filter, technicians do not need to guess the VFD output anymore

Application Note 2014-08-01

PDF PDF 1.74 MB
PWM Waveform Generation Using the U1252A Handheld Digital Multimeter - Application Note
This application note provides a brief overview of PWM and offers some ideas on how to use the U1252A handheld DMM to create the pulse width modulated signals.

Application Note 2014-08-01

PDF PDF 1.36 MB
Using Gamma, S-Parameter Correction, and Real Time Measurement Uncertainty (RTMU) - Application Note
This application note explain how gamma/s-parameter correction used to correct for the mismatch error between the sensor and DUT, and how real time MU new calculation implementation.

Application Note 2014-08-01

PDF PDF 2.65 MB
Find the right switching solutions for your test and measurement needs
This application note will provide an overview of the types of microwave switches available and their performance capabilities to assist you in selecting the most appropriate switch.

Application Note 2014-08-01

PDF PDF 356 KB
Ultra-Low Impedance Measurements using 2-Port Measurements
This application note explains using 2-port VNA techniques can completely eliminate the artifacts associated with contact impedance of the probes or fixturing to the DUT.

Application Note 2014-07-31

PDF PDF 4.68 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2014-07-31

Installation and Maintenance of Microwave Links
This application note describes accurate and fast frequency measurements for installation and maintenance of microwave links.

Application Note 2014-07-31

PDF PDF 364 KB
Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2014-07-31

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Solving the Challenges of Solar Array Simulation - Application Note
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

Application Note 2014-07-31

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Properly Powering On and Off Multiple Power Inputs in Embedded Designs - Application Not
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Previous 1 2 3 4 5 6 7 8 9 10 ... Next