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Multiport and Multi-site Test Optimization Techniques - Application Note
This app note gives an overview of multiport and multi-site test capabilities, how different multiport test solutions compare, and what should be considered when configuring a multi-site test station.

Application Note 2015-05-08

PDF PDF 5.29 MB
Instrument Design Validation and Recommended Calibration Policy - Application Note
Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures.

Application Note 2015-05-07

Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.

Application Note 2015-05-07

PDF PDF 864 KB
Paperless Calibration - Application Note
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

Application Note 2015-05-07

PDF PDF 86 KB
Language of Specifications - Application Note
This paper explains some of the arcane language used in describing a product's characteristics.

Application Note 2015-05-07

PDF PDF 695 KB
The Metrological & Financial Implications of a Clogged Fan Filter - Application Note
This article discussed the implications of having a clogged air filter and addresses solutions to helping in the prevention of clogged air filters.

Application Note 2015-05-07

Selecting a Calibration Vendor - Application Note
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?

Application Note 2015-05-07

RF and Universal Counter/Timers Migration Guide - Application Note
This guide highlights compatibility, key specifications, and differences between the soon to be obsolete 531xxA series to the new 53200A series of RF & Universal Frequency Counters.

Application Note 2015-05-07

PDF PDF 526 KB
Spectrum Analysis and the Frequency Domain - Application Note
Teaching Lab #2: Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2015-05-05

Power Flow and Directional Couplers - Application Note
Teaching Lab #6: Power Flow and Directional Couplers University Engineering Lab Series – Lab 6

Application Note 2015-05-05

Too Much Calibration? - White Paper
This paper explains the variables at work in the world of calibration - how they can be used to find the elusive balance point between cost and confidence, or "too much" and "not enough" calibration.

Application Note 2015-05-05

PDF PDF 569 KB
Establishing Traceability for Quantities Derived from Multiple Traceable Quantities - White Paper
Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.

Application Note 2015-05-05

PDF PDF 413 KB
Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.

Application Note 2015-05-05

PDF PDF 290 KB
Introduction to the FieldFox RF Analyzer - Application Note
Teaching Lab #1:Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2015-05-05

Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2015-05-04

PDF PDF 624 KB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2015-05-04

PDF PDF 343 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2015-05-03

PDF PDF 1.38 MB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2015-04-30

PDF PDF 521 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2015-04-30

PDF PDF 552 KB
Overcome Your Test Challenges with Truevolt Series Digital Multimeters - Application Compendium
This compendium consists of six Keysight Truevolt Series digital multimeter application briefs

Application Note 2015-04-30

PDF PDF 4.02 MB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Application Note 2015-04-30

PDF PDF 2.75 MB
Transmission Lines and Reflected Signals - Application Note
Teaching Lab #3:Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2015-04-29

Keysight Tips to Prevent Unnecessary Repairs - Application Brief
Brief document to prevent instrument damage and avoid unnecessary repairs with techniques on proper grounding, cable and connector care, electro discharge precautions, transit instructions and more.

Application Note 2015-04-29

Two-port Measurements and S-Parameters - Application Note
Teaching Lab # 5: Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2015-04-29

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