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Electronic Warfare Signal Generation: Technologies and Methods - Application Note
This application note provides an overview of multi-emitter simulations. Vital to accurate testing, however, when performed with large, custom test systems in the verification stage, problems can remain undiscovered until later in the design phase. Leading to delays, design rework, and solutions that are not well-optimized.

Application Note 2014-10-02

Generating a Waveform with Many Points – Application Brief
Learn how Trueform waveform generators can help you output long or complex waveforms using a number of unique features not found in other commercially available solutions with this 4-page application brief.

Application Note 2014-10-02

Be More Efficient Designing and Using your Arbitrary Waveforms – Application Brief
Learn how Trueform generators can help you reuse, re-sort or trigger your arb waveforms to build a whole new signal with this 4-page application brief.

Application Note 2014-10-02

Using Wider, Deeper Views to Characterize Complex Systems and Environments - Application Note
This application note provides an overview of signal-identification techniques for monitoring electronic warfare (EW) scenarios and outlines several analysis options that support typical requirements in dynamic range and bandwidth.

Application Note 2014-10-02

Creating a Differential Signal with a Waveform Generator – Application Brief
Learn how Trueform waveform generators can be used to help you create differential signals, while also reducing your development cost with this 4-page application brief.

Application Note 2014-10-02

Using a Waveform Generator to Generate a Pseudo Random Binary Sequence (PRBS) Signal – App Brief
PRBS signals are commonly used to test networks. Trueform waveform generators can easily generate CCITT standard PRBS signals. With less than 1 ps of jitter, see why Trueform is the ideal answer for your test needs with this 4-page application brief.

Application Note 2014-10-02

Measuring High Impedance Sources Using the U8903B Audio Analyzer - Application Note
Considerations for measuring high impedance sources. A method of using an impedance matching attenuator to overcome high impedance measurement problems is described. Methods for aligning matching attenuator and compensating for its loss are shown alongside the ease with which frequency response measurements can be made.

Application Note 2014-09-30

PDF PDF 937 KB
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-09-24

PDF PDF 2.34 MB
Solutions for RF Power Amplifier Test - Application Note
This “Solutions for RF Power Amplifier Test” app note gives insight into making faster, repeatable RF power amplifier tests with envelope tracking and digital pre-distortion.

Application Note 2014-09-23

Get app notes for digital multilevel signalizing techniques and high-speed coherent optical -AppNote
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2014-09-22

Achieving Fast and Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range for Wireless
This application note explains how to obtain a wide power measurement range on the lower power level. This is important for chipsets designed to handle a wider power range to support higher data throughput and wider coverage area

Application Note 2014-09-09

Making Fast Pass/Fail Testing with Keysight N9320B Spectrum Analyzer - Application Note
This application note describes the advanced window limit feature in the N9320B spectrum analyzer and demonstrates how to use it to easily make the Pass/Fail determination on measurement results.

Application Note 2014-09-08

Automatic Audio Test for Design Verification and Production using the Keysight U8903B Audio Analyzer
U8903B’s Test Sequence Application (TSA) function provides an easy way for automatic audio test. Users are not required to familiar with any PC language or programming tools.

Application Note 2014-09-05

Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Application Note 2014-09-04

PDF PDF 1.43 MB
Reducing Device-Failure Risk with a Black-Box Recorder - Application Note
A Black Box recorder can give you critical insight into DUT failures and can help you develop an effective test strategy.

Application Note 2014-09-04

LTE-Advanced: Technology and Test Challenges 3GPP Releases 10, 11, 12 and Beyond - Application Note
This application note summarizes the ITU requirements for 4G and the 3GPP requirements for LTE-Advanced, including the expected timeline. Key solution proposals for LTE-Advanced are also presented with a look at Release 10 and beyond. Lastly anticipated design and test challenges are addressed.

Application Note 2014-09-01

VI emulation mode of programmable output resistance function
This application note describes how to use the VI emulation mode of programmable output resistance function featured in B2961A/62A with some application examples.

Application Note 2014-08-31

PDF PDF 1.19 MB
Constant mode of programmable output resistance function
This application note describes how to use the constant mode of programmable output resistance function featured in B2961A/62A with some application examples.

Application Note 2014-08-31

PDF PDF 904 KB
Understanding the SystemVue To ADS Simulation Bridge - Application Note
This application note shows how RF designers using Advanced Design System (ADS), as well as system architects and DSP developers using SystemVue, can co-simulate for greater functionality and cross-platform debug and verification.

Application Note 2014-08-31

PDF PDF 1.95 MB
Connecting Data Acquisition Systems to a Wireless Network - Application Brief
Learn how you can configure and take advantage of the latest router technology with either the 34972A DAQ system or any LXI instrument.

Application Note 2014-08-30

PDF PDF 659 KB
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR

Application Note 2014-08-28

PDF PDF 1.99 MB
Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-08-27

Designing Automated Tests Using Powerful Digital Acquisition Systems - Application Brief
Learn how the 34970A/34972A DAQ system offers the versatility and powerful functionality you need to solve your most pressing test challenges.

Application Note 2014-08-27

PDF PDF 351 KB
Solutions for Implementing Envelope Tracking in Power Amplifiers - Application Note
This “Solutions for Implementing Envelope Tracking in PAs” app note gives insight into fast and efficient configuration and test of ET systems from R&D to design verification and into production.

Application Note 2014-08-22

Quickly Identify Thermal Measurement Points For Data Acquisition - Application Brief
Temperature monitoring is a process that traditionally involves an amount of guess work. Learn how a thermal imaging camera can be used to quickly and easily identify temperature problem areas.

Application Note 2014-08-22

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