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Scanning Microwave Microscope Mode - Application Note

Application Note 2014-12-04

PDF PDF 320 KB
How to Select Your Next Oscilloscope: 12 Tips on What to Consider Before you Buy - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your specific measurement needs and budget is an important task.

Application Note 2014-11-26

Two-port Measurements and S-Parameters - Application Note
Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2014-11-21

PDF PDF 576 KB
Triggering on Infrequent Anomalies and Complex Signals using InfiniiScan Zone - Application Note
Learn how Keysight's exclusive InfiniiScan Zone touch trigger helps you trigger on infrequent anomalies and complex signals with ease.

Application Note 2014-11-21

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-11-19

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2014-11-10

PDF PDF 333 KB
Generating Multi-Dimensional Signals to Test Radar/EW Systems
This application note describes how to use SystemVue to generate multi-dimensional signals for testing Radar and modern Electronic Warfare (EW) systems.

Application Note 2014-11-09

PDF PDF 3.04 MB
Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Application Note 2014-11-07

PDF PDF 166 KB
Preamplifiers and System Noise Figure
Learn how to reduce the noise figure of RF & MW test systems using a low noise amplifier

Application Note 2014-11-07

TS-8989 PXI Functional Test System - System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2014-11-06

PDF PDF 611 KB
Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-11-05

PDF PDF 925 KB
Using Oscilloscope Time-Gated FFTs for Time Correlated Mixed Domain Analysis - Application Note
When debugging in both the time and frequency domain, time correlation between these signals is important and challenging. See how time-gated FFT’s provide insight into time and frequency signals.

Application Note 2014-11-03

PDF PDF 626 KB
Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Impedance Matching in the Laboratory - Application Note
Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2014-10-17

PDF PDF 501 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

Application Note 2014-10-12

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2014-10-11

PDF PDF 731 KB
Precise Evaluation of Input,Output, and Reverse Transfer Capacitances of Power Devices - White Paper
Accurate characterization of power device capacitance parameter becomes important for power circuit design. This paper introduces a solution to characterize Ciss, Coss, Crss and Rg automatically.

Application Note 2014-10-10

PDF PDF 2.49 MB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
Transmission Lines and Reflected Signals - Application Note
Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2014-10-09

PDF PDF 596 KB
Electronic Warfare Signal Generation: Technologies and Methods - Application Note
This application note provides an overview of multi-emitter simulations. Vital to accurate testing, however, when performed with large, custom test systems in the verification stage, problems can remain undiscovered until later in the design phase. Leading to delays, design rework, and solutions that are not well-optimized.

Application Note 2014-10-02

Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.

Application Note 2014-10-02

PDF PDF 963 KB
Analysis of a transmission mode scanning microwave microscope for subsurface imaging at nanoscale
APPLIED PHYSICS LETTERS 105, 133112 (2014) - EMPro is used to characterize a SMM, a tool for calibrated capacitance measurements and dopant profiling in the semiconductor industry, as well as for many other diverse applications in biology, medicine and materials science.

Application Note 2014-10-02

Generating a Waveform with Many Points – Application Brief
Learn how Trueform waveform generators can help you output long or complex waveforms using a number of unique features not found in other commercially available solutions with this 4-page application brief.

Application Note 2014-10-02

Using Wider, Deeper Views to Characterize Complex Systems and Environments - Application Note
This application note provides an overview of signal-identification techniques for monitoring electronic warfare (EW) scenarios and outlines several analysis options that support typical requirements in dynamic range and bandwidth.

Application Note 2014-10-02

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