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Using Gamma, S-Parameter Correction, and Real Time Measurement Uncertainty (RTMU) - Application Note
This application note explain how gamma/s-parameter correction used to correct for the mismatch error between the sensor and DUT, and how real time MU new calculation implementation.

Application Note 2014-08-01

PDF PDF 2.65 MB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
State of the Art in EM Software for Microwave Engineers
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2014-07-31

Materials Measurement: Dielectric Materials - Application Brief
This application brief provides the solutions for measuring dielectric materials.

Application Note 2014-07-17

PDF PDF 935 KB
Materials Measurement: Phantoms - Application Brief
This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries.

Application Note 2014-07-17

PDF PDF 824 KB
Materials Measurement: Magnetic Materials - Application Brief
This application brief provides the solutions for measuring magnetic materials.

Application Note 2014-07-17

PDF PDF 1.08 MB
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

Application Note 2014-06-15

PDF PDF 40 KB
Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2014-06-13

PDF PDF 205 KB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2014-06-02

PDF PDF 1.59 MB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-05-28

IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-05-16

OFDMA Introduction and Overview for Aerospace and Defense Applications - Application Note
Provides a brief introduction to the concepts of OFDM and OFDMA, with an eye toward the special considerations and environments for A/D applications.

Application Note 2014-05-15

PDF PDF 1.56 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Introduction to SECM and Combined AFM-SECM - Application Note

Application Note 2014-05-07

PDF PDF 962 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Application Note 2014-05-07

PDF PDF 1.44 MB
ARINC 429 Mask Files and Application Note
ARINC 429 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Analysis Tool 2014-04-30

ZIP ZIP 2.05 MB
MIL-STD-1553 Mask Files and Application Note
MIL-STD-1553 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Analysis Tool 2014-04-30

ZIP ZIP 1.58 MB
Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2014-04-30

FieldFox Applications
Every piece of gear in your kit had to prove its worth. Measuring up and earning a spot is the driving idea behind FieldFox. It’s equipped to handle routine maintenance, in-depth analysis and anything in between.

Application Note 2014-04-29

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