Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

By Product Category

51-75 of 2831

Sort:
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2014-08-04

PDF PDF 1.59 MB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-08-04

Spectrum Analysis and the Frequency Domain - Application Note
Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2014-08-04

PDF PDF 280 KB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-08-04

Materials Measurement: Liquid Materials - Application Brief
This application brief provides the solutions for measuring dielectric properties of liquid materials.

Application Note 2014-08-04

PDF PDF 1.24 MB
Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Application Note 2014-08-04

PDF PDF 2.52 MB
Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Methods for Characterizing and Tuning DC Inrush Current - Application Brief
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2014-08-03

Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Application Note 2014-08-03

PDF PDF 108 KB
Language of Specifications - White Paper
This paper explains some of the arcane language used in describing a product's characteristics.

Application Note 2014-08-03

PDF PDF 1.08 MB
Enhancing Measurement Performance for the Testing of Wideband MIMO Signals - White Paper
This white paper describes a method for characterization and correction of channel frequency response for BBIQ measurements over large bandwidths when using the Keysight M9703A and 89600 VSA software.

Application Note 2014-08-03

PDF PDF 1.47 MB
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application Note 2014-08-03

Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

Simplifying Multi-Channel Measurement Synchronization - Application Brief
How to set up multiple channel power measurments using the U2020 X-Series USB peak power sensors and P-Series power meter.

Application Note 2014-08-03

PDF PDF 691 KB
External Triggering 2-Way Communication Frequency & Power Sweep Measurement - Application Brief
This demonstrates the capability of an N1911A/12A P-Series power meter to perform external triggering 1-way and 2-way communication frequency and power sweep measurements.

Application Note 2014-08-03

PDF PDF 272 KB
GaAs MMIC ESD, Die Attach, and Bonding Guidelines - Technical Overview
This application note contains information on die attach methods and bonding methods for integrated circuits.

Application Note 2014-08-03

PDF PDF 327 KB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 5.52 MB
Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.

Application Note 2014-08-03

PDF PDF 3.13 MB
Improving Throughput with your Power Supply - Hints 1 through 5 – Application Brief
This application compendium consists of 1 through 5 of the 10 hints on how to improve throughput with your power supply.

Application Note 2014-08-03

Streaming, Analysis and Playback of RF Interference Signals in AD Applications - Application Note
Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications –looks at countering undesirable signals using a system based on COTS hardware and software when intentional interference is created to disrupt the operation of a victim receiver.

Application Note 2014-08-03

An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

8990B PPA - Droop Measurement - Application Note
This application brief demonstrates the ability of the 8990B PPA with windows software to perform droop measurement using its trace graph.

Application Note 2014-08-03

PDF PDF 539 KB
Using RF Recording Techniques to Resolve Interference Problems - Application Note
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Application Note 2014-08-03

PDF PDF 1.96 MB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2014-08-03

PDF PDF 6.63 MB

Previous 1 2 3 4 5 6 7 8 9 10 ... Next