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Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Application Note 2017-05-16

Noise and Noise Figure: Improving and Simplifying Measurements - Application Brief
Noise is present in every electronic circuit. Noise disturbances can limit the overall performance of a wireless system, making noise measurements fundamental for all transmitter/receiver components.

Application Note 2017-05-16

PDF PDF 1021 KB
Three Hints for Better Noise Figure Measurements - Application Brief
This brief provides 3 hints that will help you improve measurement uncertainty, increase yield, and lower your costs when measuring noise figure performance on your device.

Application Note 2017-05-16

Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2017-05-16

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

Low Power Wide Area Network (LPWAN) Technologies – Benefits and Test Challenges - Application Note
Low Power Wide Area Network (LPWAN) Technologies – Benefits and Test Challenges

Application Note 2017-05-11

How to Run LabVIEW Programs with Keysight PXI Instruments - Application Note
This application note demonstrates how to easily use Keysight’s PXI instruments in a LabVIEW program environment.

Application Note 2017-05-05

How to Characterize a DC-DC Converter Using a DAQ and BenchVue Software - Application Note
This application note provides an easy, step-by-step approach for measuring and plotting several characteristics of a DC-DC converter using Keysight’s 34970A/72A DAQs with BenchVue software.

Application Note 2017-05-04

Easily Test DC-DC Converters Using the Keysight DC Power Analyzer - Application Note
This application note explains how to easily carry out DC-DC converter testing using the N6705C DC Power Analyzer and MSOX2/3/4000 Series Oscilloscope and BenchVue software.

Application Note 2017-05-02

PDF PDF 1.03 MB
Decoding NFC-F Communication Based on Manchester-encoded ASK Modulation - Application Note
See step-by-step instructions on how to setup oscilloscopes to properly decode and trigger on NFC-F poller and listener communication for two specific cases.

Application Note 2017-04-28

PDF PDF 2.27 MB
Basic Oscilloscope Fundamentals - Application Note
This application note provides an overview of basic oscilloscope fundamentals. You will learn what an oscilloscope is and how to use oscilloscopes.

Application Note 2017-04-25

Eliminate Risk with Proper Calibration - Application Note

Application Note 2017-04-24

New Pulse Analysis Techniques for Radar and EW - Application Note
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2017-04-21

Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
N9041B UXA X-Series Signal Analyzer, Multi-Touch - Application Brief
This application brief explains the complexity of testing in millimeter wave and how the UXA meets those challenges.

Application Note 2017-04-17

eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note
This application note discusses how designers can use the Keysight eCall test setup to emulate the various elements of a real eCall environment comprising GPS, automobile, cellular network and PSAP.

Application Note 2017-04-12

Fundamentals of PXI Integration - Application Notes
Easily integrate PXI instruments into your test system

Application Note 2017-04-11

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2017-04-10

Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-04-10

EMI Troubleshooting: The Need for Close Field Probes - Application Note
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2017-04-03

Triggering on and Decoding the PSI5 Sensor Serial Bus - Application Note
Learn how to quickly test and debug the PSI5 automotive sensor bus by utilizing Keysight’s User-definable Manchester/NRZ Serial Trigger & Decode option on an InfiniiVision X-Series oscilloscope.

Application Note 2017-04-03

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Application Note 2017-03-30

PDF PDF 6.16 MB
Automotive FMCW Radar System Design using 3D Framework for Scenario Modeling
Automotive Radar Architects can take advantage of Keysight SystemVue’s 3D simulation framework, radar reference designs, and links to MATLAB and T&M equipment to model FMCW radar system scenarios.

Application Note 2017-03-28

M901x PXIe Chassis Power Calculator
Allows you to enter ambient air temperature, altitude, AC supply voltage, etc. and calculates the total power available to the chassis modules

Analysis Tool 2017-03-27

Simplifying the Economics of Test and Repair in Both the Factory and Depot - White Paper
This paper explores how to calculate the cost-of-test.

Application Note 2017-03-24

PDF PDF 606 KB

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