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Electronic Measurement

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Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2014-08-01

Troubleshooting VFDs with Low Pass Filter - Application Note
Technicians constantly face the challenge of obtaining accurate voltage and frequency measurement that tallies with the readings shown on the VFD control panel display. With Keysight’s handheld multimeter that is equipped with a switchable 1-kHz low pass filter, technicians do not need to guess the VFD output anymore

Application Note 2014-08-01

PDF PDF 1.74 MB
MIL-STD 1553 Eye-diagram Mask Testing – Application Note
Learn about how eye-diagram testing can be performed on differential MIL-STD 1553 signals using an oscilloscope.

Application Note 2014-08-01

PDF PDF 2.92 MB
Uncertainty Analysis for Uncorrelated Input Quantities - White Paper
The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

Application Note 2014-08-01

PDF PDF 1.64 MB
Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Improving Radar Performance by Optimizing Overall Signal-to-Noise Ratio
Better noise-figure measurements enhance characterization of excess noise in receivers.

Application Note 2014-08-01

Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Two-Way Radio Testing with Keysight U8903A Audio Analyzer - Application Note
This application note highlights how you can use the Keysight U8903A audio analyzer to guarantee the audio quality of your design for you to use audio as a competitive advantage.

Application Note 2014-07-31

PDF PDF 1.77 MB
Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2014-07-31

PDF PDF 531 KB
Three Easy Steps to Create Your Own Notch Filter for the U8903A Audio Analyzer Using the VEE
Three Easy Steps to Create Your Own Notch Filter for the U8903A audio analyzer using the Keysight Vee software application note

Application Note 2014-07-31

PDF PDF 1.77 MB
Installation and Maintenance of Microwave Links
This application note describes accurate and fast frequency measurements for installation and maintenance of microwave links.

Application Note 2014-07-31

PDF PDF 364 KB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2014-07-31

Understanding Oscilloscope Frequency Response & Its Effect on Rise-Time Accuracy - Application Note
In this application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Quantitative Mechanical Measurements at the Nano-Scale Using the DCMII - Application Note

Application Note 2014-07-31

PDF PDF 545 KB
Generating Complex ECG Patterns with an Arbitrary Waveform Generator
Generating complex ECG patterns with an arbitrary waveform generator.

Application Note 2014-07-31

PDF PDF 936 KB
8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2014-07-31

State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Solving the Challenges of Solar Array Simulation - Application Note
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

Application Note 2014-07-31

Ultra-Low Impedance Measurements using 2-Port Measurements
This application note explains using 2-port VNA techniques can completely eliminate the artifacts associated with contact impedance of the probes or fixturing to the DUT.

Application Note 2014-07-31

PDF PDF 4.68 MB
Transferring Arbitrary Waveform Data to the 33200A Family of Function/Arbitrary Waveform Generators
This application note will review three methods of transferring arbitrary waveform data to 33200A Function/Arbitrary Waveform Generators: front panel, Keysight IntuiLink Waveform Editor, and programming.

Application Note 2014-07-31

3rd Order 1900MHz Low Noise Amplifier using Infineon SiGe BFP620 Transistor
This Application Note is based directly on a design documented in the Infineon’s AN 60. This detailed application information is provided in support of the “SiGe BFP620 Amp” e.g. shipped with the S/W.

Application Note 2014-07-31

PDF PDF 1.09 MB

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