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Electronic Measurement

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Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2014-07-31

Testing Battery Chargers with the U2722A USB Modular Source Measure Unit - Application Note
This application note shows the capabilities and benefits of utilizing the U2722A USB modular source measure unit to test battery chargers.

Application Note 2014-07-31

PDF PDF 1.33 MB
Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Understanding Oscilloscope Frequency Response and Its Effect on Rise-Time Accuracy - Application Not
In this Application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

Properly Powering On and Off Multiple Power Inputs in Embedded Designs - Application Not
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2014-07-31

PDF PDF 531 KB
Ultra-Low Impedance Measurements using 2-Port Measurements
This application note explains using 2-port VNA techniques can completely eliminate the artifacts associated with contact impedance of the probes or fixturing to the DUT.

Application Note 2014-07-31

PDF PDF 4.68 MB
Generating Complex ECG Patterns with an Arbitrary Waveform Generator
Generating complex ECG patterns with an arbitrary waveform generator.

Application Note 2014-07-31

PDF PDF 936 KB
Three Easy Steps to Create Your Own Notch Filter for the U8903A Audio Analyzer Using the VEE
Three Easy Steps to Create Your Own Notch Filter for the U8903A audio analyzer using the Keysight Vee software application note

Application Note 2014-07-31

PDF PDF 1.77 MB
Two-Way Radio Testing with Keysight U8903A Audio Analyzer - Application Note
This application note highlights how you can use the Keysight U8903A audio analyzer to guarantee the audio quality of your design for you to use audio as a competitive advantage.

Application Note 2014-07-31

PDF PDF 1.77 MB
Materials Measurement: Phantoms - Application Brief
This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries.

Application Note 2014-07-17

PDF PDF 824 KB
Materials Measurement: Dielectric Materials - Application Brief
This application brief provides the solutions for measuring dielectric materials.

Application Note 2014-07-17

PDF PDF 935 KB
Materials Measurement: Magnetic Materials - Application Brief
This application brief provides the solutions for measuring magnetic materials.

Application Note 2014-07-17

PDF PDF 1.08 MB
Selecting Best Device for Power Circuit Design Through Gate Charge Characterization - White Paper
The gate charge (Qg) parameter becomes more important for reducing power loss of devices working under high frequency switching. This article proposes a new and innovative Qg measurement technique.

Application Note 2014-07-03

PDF PDF 343 KB
M9018A PXIe Chassis Power Calculator
Allows you to enter ambient air temperature, AC supply voltage, etc. and calculates the total power available to the chassis modules.

Analysis Tool 2014-07-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Evaluation of Bearing Materials Using Nano-Scale Wear Testing - Application Note
This is a study of miniature ball bearings made of steel, polytetrafluoroethylene (PTFE) reinforced with graphite, and polyether ether ketone (PEEK) are evaluated by means of nano-indentation and nano- wear testing

Application Note 2014-06-20

PDF PDF 1.08 MB
E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

Application Note 2014-06-15

PDF PDF 40 KB
Introduction to the FieldFox RF Analyzer - Application Note
Teaching Lab #1:Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2014-06-13

PDF PDF 205 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB

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