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Measurement of Capacitance Characteristics of Liquid Crystal Cell - Application Note
This short application note describes how to take best advantage of the 4284A's powerful features when measuring capacitance while varying an AC signal voltage applied tothe liquid crystal material under test.

Application Note 2015-06-22

81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2015-06-18

Enhance EMC Testing with Digital IF - Application Note
This application note will discuss the differences between analog and digital IF architecture and explain how digital IF enhances both compliance and precompliance measurement processes.

Application Note 2015-06-18

PDF PDF 1.10 MB
Demystifying RCRC and RC probes - Application Note
An ideal probe would provide an exact replica of a signal being probed. However, the probe becomes a part of the circuit under test, because the probe introduces probe loading to the circuit.

Application Note 2015-06-17

PDF PDF 1.56 MB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2015-06-15

Bridging the Gap from Benchtop to PXI - Application Note
This application note describes how a common software platform can facilitate efficient transfer of test methodologies used in design to their manufacturing colleagues.

Application Note 2015-06-15

Extending the Life of Test Systems that Support Long-term Programs - Application Note
As an original equipment manager (OEM), we offers efficient and effective alternatives that can extend the life of systems and ensure that the individual instruments are meeting their warranted spec.

Application Note 2015-06-12

Calibration of a Ratio Transformer - White Paper
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.

Application Note 2015-06-09

PDF PDF 735 KB
One Size Does NOT Fit All - Application Note
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Application Note 2015-06-08

Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-06-05

PDF PDF 1.43 MB
The Six Axes Of Calibration - Application Note
To help demonstrate the variances in the deliverables and value of calibration due to lack of regulation. They have been split into 6 axes. This document discusses each of these axes.

Application Note 2015-06-04

Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2015-05-29

Simplify Complex High-speed Multichannel Acquisition Systems in Big Physics Experiments-Application
This application note overview describes the use of Keysight modular products for high-speed multichannel acquisition systems in big physics experiments.

Application Note 2015-05-28

Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

Application Note 2015-05-26

PDF PDF 1.67 MB
Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Application Note 2015-05-22

Techniques for Precise Measurement Calibrations in the Field - Application Note
This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2015-05-22

Attenuation Measurement of Step Attenuators - Application Note
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.

Application Note 2015-05-20

PDF PDF 715 KB
Connector Pin Recession and its Effect on Network Analyzer Accuracy - White Paper
Outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.

Application Note 2015-05-20

PDF PDF 406 KB
Soft Touch Connectorless Logic Analyzer Probes - Application Notes

Application Note 2015-05-20

Revisiting Mismatch Uncertainty with the Rayleigh Distribution - White Paper
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

Application Note 2015-05-19

PDF PDF 932 KB
Uncertainty Analysis for Uncorrelated Input Quantities - White Paper
The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

Application Note 2015-05-19

PDF PDF 502 KB
Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2015-05-19

Techniques for Precise Cable and Antenna Measurements in the Field - Application Note
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Application Note 2015-05-15

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2015-05-15

Fully-Automatic DMM Calibration System - White Paper
Describes a fully-automatic calibration system for digtial multimeters (DMMs), including the uncertainty estimation of DC Voltage measurements.

Application Note 2015-05-15

PDF PDF 1008 KB

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