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Electronic Measurement

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Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Master Your MIPI M-PHY Receiver Tests - Application Brief
Validating MIPI M-PHY spec conformance of ASICs and modules with a focus on high-speed jitter tolerance test.

Application Note 2014-04-17

PDF PDF 2.49 MB
Selecting the Right Scope for Protocol Analysis Applications - Application Note
When evaluating a new oscilloscope that will include serial protocol applications you should consider the six questions discussed in this application note.

Application Note 2014-04-17

PDF PDF 6.25 MB
Evaluating Current Probe Technologies for Low-Power Measurements - Application Note
This application note will evaluate oscilloscope current probes for their usefulness in making low power measurements and demonstrate a type of probe available from Keysight.

Application Note 2014-04-16

PDF PDF 5.20 MB
Evaluating Oscilloscopes for Low-Power Measurements - Application Note
The Infiniium 9000 Series oscilloscope is three instruments in one: scope, logic analyzer, and protocol analyzer, and it offers the widest range of debug and compliance application software.

Application Note 2014-04-16

U3606B versus U3606A Digital Multimeter|DC Power Supply - Application Note
In the test and measurement world, we need a source to do testing on device under test (DUT) and most frequently being used is the power supply. And for the power measurement we need a multimeter.

Application Note 2014-04-15

PDF PDF 784 KB
Evaluating Oscilloscope Signal Integrity - Application Note
This application note articulates key signal integrity attributes and uses Keysight Infiniium S-Series oscilloscopes for examples in the 500 MHz to 8 GHz bandwidth ranges.

Application Note 2014-04-15

Physical Layer Testing of the USB 2.0 Serial Bus - Application Note
This application note discussed measurement requirements for the USB 2.0 serial bus and how both Keysight’s 6000 X-Series and Infiniium Series oscilloscopes address those challenges.

Application Note 2014-04-11

Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

Signal generation enables cost-effective testing

Application Note 2014-04-07

Solutions for WLAN 802.11ac Manufacturing Test - Application Note
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2014-04-02

Essentials of Coherent Optical Data Transmission - Application Note
The Application Note explains how complex modulated optical signals can maximize bit transfer efficiency in fiber optical data transmission.

Application Note 2014-04-02

PDF PDF 3.03 MB
Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2014-03-26

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Average Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2014-03-25

XLS XLS 82 KB
Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Layout of Calibration Certificates And Measurement Reports - Application Note
Keysight has recently instituted some minor changes on calibration certificates. This lit piece explains the rationale for these changes.

Application Note 2014-03-20

PDF PDF 473 KB
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
Preventive Maintenance Test with Insulation Resistance Test - Application Note
This application note describes factors that affect insulation resistance, various insulation resistance test methods, and provides guidelines for selecting the appropriate test for the application.

Application Note 2014-03-20

Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-03-18

Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Application Note 2014-03-18

Automotive Serial Bus Testing - Application Note
This application note will show examples of characterizing the performance of various automotive serial buses using Keysight oscilloscopes and provide a summary of recommended probing solutions.

Application Note 2014-03-17

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Jitter Analysis Using Keysight's InfiniiVision 6000 X-Series and Infiniium Series - Application Note
A discussion of various display formats used to view jitter including horizontal waveform histograms, TIE histograms, TIE trend waveforms, and jitter spectrum waveforms.

Application Note 2014-03-12

Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

Application Note 2014-03-07

PDF PDF 3.73 MB

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