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Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2014-08-02

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2014-08-02

PDF PDF 4.04 MB
Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2014-08-02

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2014-08-02

PDF PDF 724 KB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Application Note 2014-08-02

PDF PDF 692 KB
Business Considerations of Equipment Refresh in a Calibration Laboratory by Richard Ogg
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.

Application Note 2014-08-01

Find the right switching solutions for your test and measurement needs
This application note will provide an overview of the types of microwave switches available and their performance capabilities to assist you in selecting the most appropriate switch.

Application Note 2014-08-01

PDF PDF 356 KB
Revisiting Mismatch Uncertainty with the Rayleigh Distribution - White Paper
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

Application Note 2014-08-01

PDF PDF 1.17 MB
Evaluating Oscilloscopes to Debug Mixed-Signal Designs - Application Note
Discusses the number of channels, bandwidth, sample rates and triggering required to effectively monitor various analog and digital I/O signals in typical MCU/DSP-based embedded designs.

Application Note 2014-08-01

Troubleshooting VFDs with Low Pass Filter - Application Note
Technicians constantly face the challenge of obtaining accurate voltage and frequency measurement that tallies with the readings shown on the VFD control panel display. With Keysight’s handheld multimeter that is equipped with a switchable 1-kHz low pass filter, technicians do not need to guess the VFD output anymore

Application Note 2014-08-01

PDF PDF 1.74 MB
Oscilloscopes in Aerospace/Defense Debugging ARINC 429 Serial Buses - Flyer
Keysight’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.

Application Note 2014-08-01

Using Gamma, S-Parameter Correction, and Real Time Measurement Uncertainty (RTMU) - Application Note
This application note explain how gamma/s-parameter correction used to correct for the mismatch error between the sensor and DUT, and how real time MU new calculation implementation.

Application Note 2014-08-01

PDF PDF 2.65 MB
Uncertainty Analysis for Uncorrelated Input Quantities - White Paper
The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

Application Note 2014-08-01

PDF PDF 1.64 MB
FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Keysight provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2014-08-01

PWM Waveform Generation Using the U1252A Handheld Digital Multimeter - Application Note
This application note provides a brief overview of PWM and offers some ideas on how to use the U1252A handheld DMM to create the pulse width modulated signals.

Application Note 2014-08-01

PDF PDF 1.36 MB
Improving Radar Performance by Optimizing Overall Signal-to-Noise Ratio
Better noise-figure measurements enhance characterization of excess noise in receivers.

Application Note 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2014-08-01

Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense Applications
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.

Application Note 2014-08-01

Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details - Application Note
The quality of your oscilloscope’s display can make a big difference in your ability to troubleshoot your designs effectively.

Application Note 2014-08-01

Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Time Sidelobe Measurements to see Performance of Compressed-Pulse Radars - Application Note
This application brief defines problems seen in measurements of compressed-pulse radars, describes the time sidelobe method, and outlines uses of this approach.

Application Note 2014-08-01

PDF PDF 445 KB
Generating Complex ECG Patterns with an Arbitrary Waveform Generator
Generating complex ECG patterns with an arbitrary waveform generator.

Application Note 2014-07-31

PDF PDF 936 KB

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