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Electronic Measurement

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251-275 of 2946

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2015-02-01

Achieving Enhanced Digital Multimeter Accuracy in the Presence of Temperature Variation
Learn how to minimize your accuracy errors with the autocalibration feature in the new 34465A and 34470A Truevolt Series digital multimeters.

Application Note 2015-01-30

Simultaneous Measurements with a Digital Multimeter - Application Brief
Learn how to confidently make dual measurements and perform more analysis in less time with the Truevolt Series of digital multimeters (DMMs).

Application Note 2015-01-30

Faster Data Analysis with Graphical Digital Multimeter Measurements - Application Brief
Learn how the Truevolt Series DMMs can help you more quickly analyze your data.

Application Note 2015-01-30

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

Measuring Low Current Consumption with a Digital Multimeter - Application Brief
Learn how the new Truevolt 34465A and 34470A digital multimeters can help you measure very low currents with pico-amp resolution.

Application Note 2015-01-29

Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-28

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2015-01-28

Solutions for Implementing Envelope Tracking in Power Amplifiers Application Note
Download Your Free Copies of the Latest Power of Wireless Application Notes

Application Note 2015-01-27

Solutions for RF Power Amplifier Test Application Note
Download Your Free Copies of the Latest Power of Wireless Application Notes

Application Note 2015-01-27

Creep Activation Energy of SAC305 Using NanoIndentation - Application Note

Application Note 2015-01-27

Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2015-01-23

How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2015-01-23

Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense – Application Note
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.

Application Note 2015-01-21

SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

LTE Reference Vector
A fresh approach to Comms PHY system design challenges.

Application Note 2015-01-20

Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

ARINC 429 Eye-diagram and Pulse-shape Mask Testing – Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2015-01-15

Automated Receiver Sensitivity Measurements Using U8903B - Application Note
This note shows how the test sequencer together with the GPIB master functionality in the U8903B can be used to easily make automated Receiver Sensitivity measurements that are reliable and repeatable.

Application Note 2015-01-14

Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

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Find service centers around the world.

Application Note 2015-01-10

HV Cable Insulation Resistance Testing for Hybrid Vehicles - Application Note
Hybrid vehicle technology has grown rapidly over the last decade because of its fuel efficiency and low emissions. Today’s hybrid systems are more sophisticated than conventional engines and leverage the best operating characteristics of the combustion engine and electric motor based on driving conditions. This helps to achieve superior fuel efficiency and reduce CO2 emissions.

Application Note 2015-01-09

Component Testing Using an Oscilloscope with Integrated Waveform Generator – Application Note
This application note illustrates methods for testing components using an oscilloscope and waveform generator.

Application Note 2015-01-08

Power of Impedance Analyzer - Application Note
This application note describes the necessity of real-characteristics evaluation, and shows that the impedance analyzers only have capabilities to achieve real-characteristics.

Application Note 2015-01-07

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