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Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Application Note
This document describes six major factors that determine the POI value and relative amplitude: sampling rate, time-record length, windowing function, window size, overlap processing, and noise floor.

Application Note 2014-08-04

PDF PDF 2.53 MB
Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Application Note 2014-08-04

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-08-04

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-08-03

Conquering the Multi Kilowatt Source/Sink Test Challenge - Application Note
This application note discusses how the Keysight APS N6900/N7900 DC power supplies feature integrated sourcing and sinking capability tailored for the test needs of today’s bidirectional and regenerative energy systems and devices.

Application Note 2014-08-03

Real-Time Spectrum Analysis for Troubleshooting 802.11n/ac WLAN Devices - Application Note
This application brief will explain, using specific examples, how real-time spectrum analysis can help identify interfering signals that can impact the performance of WLAN devices.

Application Note 2014-08-03

PDF PDF 2.64 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 1.57 MB
Solutions for Emerging 4G and WLAN Communications Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2014-08-03

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Application Note 2014-08-03

Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 5.52 MB
TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Application Note 2014-08-03

PDF PDF 324 KB
Simplifying Multi-Channel Measurement Synchronization - Application Brief
How to set up multiple channel power measurments using the U2020 X-Series USB peak power sensors and P-Series power meter.

Application Note 2014-08-03

PDF PDF 691 KB
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application Note 2014-08-03

Using RF Recording Techniques to Resolve Interference Problems - Application Note
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Application Note 2014-08-03

PDF PDF 1.96 MB
Enhancing Measurement Performance for the Testing of Wideband MIMO Signals - White Paper
This white paper describes a method for characterization and correction of channel frequency response for BBIQ measurements over large bandwidths when using the Keysight M9703A and 89600 VSA software.

Application Note 2014-08-03

PDF PDF 1.47 MB
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

8990B PPA - Droop Measurement - Application Note
This application brief demonstrates the ability of the 8990B PPA with windows software to perform droop measurement using its trace graph.

Application Note 2014-08-03

PDF PDF 539 KB
Streaming, Analysis and Playback of RF Interference Signals in AD Applications - Application Note
Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications –looks at countering undesirable signals using a system based on COTS hardware and software when intentional interference is created to disrupt the operation of a victim receiver.

Application Note 2014-08-03

FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Application Note 2014-08-03

PDF PDF 860 KB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

Methods for Characterizing and Tuning DC Inrush Current - Application Brief
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2014-08-03

Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2014-08-03

PDF PDF 5.89 MB
GaAs MMIC ESD, Die Attach, and Bonding Guidelines - Technical Overview
This application note contains information on die attach methods and bonding methods for integrated circuits.

Application Note 2014-08-03

PDF PDF 327 KB
Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Application Note 2014-08-03

PDF PDF 108 KB

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