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Real-Time Spectrum Analysis for Troubleshooting 802.11n/ac WLAN Devices - Application Note
This application brief will explain, using specific examples, how real-time spectrum analysis can help identify interfering signals that can impact the performance of WLAN devices.

Application Note 2014-08-03

PDF PDF 2.64 MB
Simplifying Multi-Channel Measurement Synchronization - Application Brief
How to set up multiple channel power measurments using the U2020 X-Series USB peak power sensors and P-Series power meter.

Application Note 2014-08-03

PDF PDF 691 KB
Language of Specifications - White Paper
This paper explains some of the arcane language used in describing a product's characteristics.

Application Note 2014-08-03

PDF PDF 1.08 MB
FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Application Note 2014-08-03

PDF PDF 860 KB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2014-08-03

PDF PDF 6.63 MB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 1.57 MB
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2014-08-03

PDF PDF 5.89 MB
Methods for Characterizing and Tuning DC Inrush Current - Application Brief
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2014-08-03

External Triggering 2-Way Communication Frequency & Power Sweep Measurement - Application Brief
This demonstrates the capability of an N1911A/12A P-Series power meter to perform external triggering 1-way and 2-way communication frequency and power sweep measurements.

Application Note 2014-08-03

PDF PDF 272 KB
Using RF Recording Techniques to Resolve Interference Problems - Application Note
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Application Note 2014-08-03

PDF PDF 1.96 MB
8990B PPA - Droop Measurement - Application Note
This application brief demonstrates the ability of the 8990B PPA with windows software to perform droop measurement using its trace graph.

Application Note 2014-08-03

PDF PDF 539 KB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Application Note 2014-08-03

PDF PDF 2.19 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 5.52 MB
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application Note 2014-08-03

Accelerate Program Development using Command Expert with MATLAB - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with MATLAB.

Application Note 2014-08-02

PDF PDF 5.98 MB
Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2014-08-02

SINAD measurements Using the Keysight U8903A Audio Analyzer - Application Note
This document covers the use of the Keysight U8903A audio analyzer in characterizing radio receiver sensitivity by means of measuring SINAD, an audio quality value that is usually used to specify the RF sensitivity.

Application Note 2014-08-02

PDF PDF 1.95 MB
Oscilloscopes in Education Training students how to effectively use scopes
The InfiniiVision 2000 & 3000 X-Series oscilloscopes can be configured with a built-in function generator and education training kit to help EE students learn how to use an oscilloscope effectively

Application Note 2014-08-02

Accelerate Program Development using Command Expert with Keysight VEE Pro - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with VEE Pro.

Application Note 2014-08-02

PDF PDF 1.53 MB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Application Note 2014-08-02

PDF PDF 692 KB
Using Command Expert with Microsoft Excel - Application Note
Keysight Command Expert is a FREE software tool that provides fast and easy instrument control in many PC application environments. This application note details the integration with Microsoft Excel.

Application Note 2014-08-02

PDF PDF 4.30 MB
Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2014-08-02

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2014-08-02

PDF PDF 724 KB
GS-8800 Conformance System Measurement Uncertainty - Application Note
This application note explains how measurement uncertainty (MU) affects GS-8800 system measurements and demonstrates how MU is derived for the conformance test system.

Application Note 2014-08-02

PDF PDF 209 KB

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