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Selecting a Calibration Vendor - Application Note
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?

Notes d’application 2015-05-07

The Metrological & Financial Implications of a Clogged Fan Filter - Application Note
This article discussed the implications of having a clogged air filter and addresses solutions to helping in the prevention of clogged air filters.

Notes d’application 2015-05-07

Paperless Calibration - Application Note
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

Notes d’application 2015-05-07

PDF PDF 86 KB
Introduction to the FieldFox RF Analyzer - Application Note
Teaching Lab #1:Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Notes d’application 2015-05-05

Spectrum Analysis and the Frequency Domain - Application Note
Teaching Lab #2: Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Notes d’application 2015-05-05

Too Much Calibration? - White Paper
This paper explains the variables at work in the world of calibration - how they can be used to find the elusive balance point between cost and confidence, or "too much" and "not enough" calibration.

Notes d’application 2015-05-05

PDF PDF 569 KB
Establishing Traceability for Quantities Derived from Multiple Traceable Quantities - White Paper
Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.

Notes d’application 2015-05-05

PDF PDF 413 KB
Power Flow and Directional Couplers - Application Note
Teaching Lab #6: Power Flow and Directional Couplers University Engineering Lab Series – Lab 6

Notes d’application 2015-05-05

Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.

Notes d’application 2015-05-05

PDF PDF 290 KB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Notes d’application 2015-05-04

PDF PDF 343 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Notes d’application 2015-05-04

PDF PDF 624 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Notes d’application 2015-05-03

PDF PDF 1.38 MB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Notes d’application 2015-05-01

PDF PDF 2.46 MB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Notes d’application 2015-04-30

PDF PDF 2.75 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Notes d’application 2015-04-30

PDF PDF 521 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Notes d’application 2015-04-30

PDF PDF 552 KB
Overcome Your Test Challenges with Truevolt Series Digital Multimeters - Application Compendium
This compendium consists of six Keysight Truevolt Series digital multimeter application briefs

Notes d’application 2015-04-30

PDF PDF 4.02 MB
Keysight Tips to Prevent Unnecessary Repairs - Application Brief
Brief document to prevent instrument damage and avoid unnecessary repairs with techniques on proper grounding, cable and connector care, electro discharge precautions, transit instructions and more.

Notes d’application 2015-04-29

Transmission Lines and Reflected Signals - Application Note
Teaching Lab #3:Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Notes d’application 2015-04-29

Making Simpler DC Power Measurements with a Digital Multimeter - Application Brief
Learn what techniques are available to Truevolt Series DMM users for making simpler DC power measurements with a DMM.

Notes d’application 2015-04-29

PDF PDF 632 KB
Two-port Measurements and S-Parameters - Application Note
Teaching Lab # 5: Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Notes d’application 2015-04-29

Impedance Matching in the Laboratory - Application Note
Teaching Lab #4:Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Notes d’application 2015-04-29

Boost signals for test and measurement with the right RF and microwave amplifier - Application Note
This application note focuses on RF and microwave amplifiers that are well suited for use in test and measurement applications.

Notes d’application 2015-04-28

PDF PDF 239 KB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Notes d’application 2015-04-28

PDF PDF 2.67 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Notes d’application 2015-04-28

PDF PDF 967 KB

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