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Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Notes d’application 2014-08-04

PDF PDF 2.52 MB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Notes d’application 2014-08-04

Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Notes d’application 2014-08-04

PDF PDF 645 KB
Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Notes d’application 2014-08-04

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Notes d’application 2014-08-04

PDF PDF 360 KB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Notes d’application 2014-08-04

GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Notes d’application 2014-08-04

PDF PDF 1.59 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Notes d’application 2014-08-03

PDF PDF 1.57 MB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Notes d’application 2014-08-03

Solutions for Emerging 4G and WLAN Communications Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Notes d’application 2014-08-03

Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Notes d’application 2014-08-03

PDF PDF 5.52 MB
FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Notes d’application 2014-08-03

PDF PDF 860 KB
Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Notes d’application 2014-08-03

PDF PDF 108 KB
Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.

Notes d’application 2014-08-03

PDF PDF 3.13 MB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Notes d’application 2014-08-03

PDF PDF 2.19 MB
8990B PPA - Droop Measurement - Application Note
This application brief demonstrates the ability of the 8990B PPA with windows software to perform droop measurement using its trace graph.

Notes d’application 2014-08-03

PDF PDF 539 KB
Simplifying Multi-Channel Measurement Synchronization - Application Brief
How to set up multiple channel power measurments using the U2020 X-Series USB peak power sensors and P-Series power meter.

Notes d’application 2014-08-03

PDF PDF 691 KB
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Notes d’application 2014-08-03

Conquering the Multi Kilowatt Source/Sink Test Challenge - Application Note
This application note discusses how the Keysight APS N6900/N7900 DC power supplies feature integrated sourcing and sinking capability tailored for the test needs of today’s bidirectional and regenerative energy systems and devices.

Notes d’application 2014-08-03

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Notes d’application 2014-08-03

Streaming, Analysis and Playback of RF Interference Signals in AD Applications - Application Note
Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications –looks at countering undesirable signals using a system based on COTS hardware and software when intentional interference is created to disrupt the operation of a victim receiver.

Notes d’application 2014-08-03

TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Notes d’application 2014-08-03

PDF PDF 324 KB
GaAs MMIC ESD, Die Attach, and Bonding Guidelines - Technical Overview
This application note contains information on die attach methods and bonding methods for integrated circuits.

Notes d’application 2014-08-03

PDF PDF 327 KB
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Notes d’application 2014-08-03

External Triggering 2-Way Communication Frequency & Power Sweep Measurement - Application Brief
This demonstrates the capability of an N1911A/12A P-Series power meter to perform external triggering 1-way and 2-way communication frequency and power sweep measurements.

Notes d’application 2014-08-03

PDF PDF 272 KB

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