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Transient Optical Power Measurements with the N774x-Series Multiport Power Meter - Application Note
This note describes the details for making time-dependent measurements of optical power levels, for applications like testing transients and determining switching times.

Application Note 2016-08-31

PDF PDF 1.45 MB
Overcoming Crosstalk Challenges in Today’s Digital and Wireless Designs - Application Note
This application note provides insight into the challenges design engineers face with the effects of crosstalk in their designs, as well as, better tools and methods needed to analyze and debug crosstalk issues.

Application Note 2016-08-31

PDF PDF 2.16 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Application Note 2016-08-30

PDF PDF 2.89 MB
Optimized Battery Life for Battery-Powered Wireless Medical Devices - Application Note
This application notes is to describe how to measure battery life on battery-powered medical devices by using the blip WiFi Blood Pressure Monitor as actual use case.

Application Note 2016-08-26

PDF PDF 1.61 MB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2016-08-26

PDF PDF 2.44 MB
Measuring Battery Life on Battery-Powered Medical Devices - Application Note
This application notes is to describe how to measure battery life on battery-powered medical devices, consideration for battery run-down test and burden voltage impacts towards current measurement.

Application Note 2016-08-25

CX3300 Series Device Current Waveform Analyzer - Application Note
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2016-08-23

Educational Overview of RF Power Measurement and Applications - Application Note
RF power measurement is the basic for the study of RF & microwave theories. Understand how RF power meter and sensor works and its applications from the educational perspectives.

Application Note 2016-08-22

PDF PDF 4.39 MB
Overcoming RF & MW Interference Challenges in the Field - Application Note
This application note discusses practical strategies to overcome RF and microwave interference challenges in the field using real-time spectrum analysis (RTSA).

Application Note 2016-08-19

NB-IoT System Modeling: Simple Doesn’t Mean Easy
This paper presents a method for modeling and evaluating a new Narrowband Internet of Things (NB-IoT) system in a combined multi-domain simulation environment.

Application Note 2016-08-12

PDF PDF 1023 KB
Using BenchVue Test Flow to Create Test Sequences without Programming - Application Note
This document explains some of the many things you can do with the BenchVue Test Flow app, such as create sequences of setups and measurements --all without having to write a computer program.

Application Note 2016-08-11

PDF PDF 3.77 MB
Overcoming Test Challenges of USB Type-C - Application Note
This application note provides an introduction to the USB Type-C connector, the interface functions it provides, and test implications engineers face when integrating the connector into their designs.

Application Note 2016-08-10

PDF PDF 3.19 MB
IoT insights - poster
IoT insights poster.

Application Note 2016-08-03

PDF PDF 5.96 MB
Latest wireless standards - poster
Latest wireless standards poster. If you want to order a hardcopy: Order a hardcopy

Application Note 2016-08-03

PDF PDF 5.86 MB
IoT’s insights - poster
IoT’s insights poster. If you want to order a hardcopy: Order a hardcopy

Application Note 2016-08-03

PDF PDF 5.75 MB
Transitioning to a PXI Test System - Application note
This application note reviews potential hardware and software issues to consider when transitioning from a benchtop to a PXI test system.

Application Note 2016-07-20

Understanding LTE-Advanced Base Station Transmitter RF Conformance Testing - Application Note
This application note focuses on LTE-A basestation transmitter testing using the 3GPP RF conformance tests. Examples provided with MXA Signal Analyzer, multi-touch and the LTE-A measurement app.

Application Note 2016-07-19

PDF PDF 4.51 MB
Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
Maximizing Battery Life of IoT Smart Devices with Keysight Solutions - Application Brief
This application brief details the design and test challenges involved with maximizing the battery life of Internet of Things (IoT) smart devices, and recommends Keysight solutions to address them.

Application Note 2016-07-14

A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

Application Note 2016-07-13

PDF PDF 1.64 MB
Solving Test Challenges for Internet of Things-Enabled Consumer Electronics Devices
The Internet of Things is a key enabler of the smart home, and brings with it unique challenges for designers and manufacturers. Keysight has a complete portfolio to address the test challenges.

Application Note 2016-06-30

Tips for Preventing Damage to Communication Test Set - Application Brief
Popular Keysight models: E5515A/B/C/T

Application Note 2016-06-29

Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

Application Note 2016-06-28

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