Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

By Product Category

1-25 of 2802

Sort:
Uncertainty Propagation for Measurements with Multiple Output Quantities
Measurements with multiple output quantities exist in many disciplines. This paper discusses using matrix notation, which can be applied to a practical measurement uncertainty example involving complex quantities.

Analysis Tool 2014-08-20

PDF PDF 591 KB
Average Power Sensor Uncertainty Calculator Rev9
Average Power Sensor Uncertainty Calculator Rev9

Application Note 2014-08-19

XLS XLS 82 KB
Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-08-04

PDF PDF 925 KB
Materials Measurement: Liquid Materials - Application Brief
This application brief provides the solutions for measuring dielectric properties of liquid materials.

Application Note 2014-08-04

PDF PDF 1.24 MB
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2014-08-04

PDF PDF 1.59 MB
Streaming, Analysis and Playback of RF Interference Signals in AD Applications - Application Note
Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications –looks at countering undesirable signals using a system based on COTS hardware and software when intentional interference is created to disrupt the operation of a victim receiver.

Application Note 2014-08-03

Using RF Recording Techniques to Resolve Interference Problems - Application Note
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Application Note 2014-08-03

PDF PDF 1.96 MB
Using Gamma, S-Parameter Correction, and Real Time Measurement Uncertainty (RTMU) - Application Note
This application note explain how gamma/s-parameter correction used to correct for the mismatch error between the sensor and DUT, and how real time MU new calculation implementation.

Application Note 2014-08-01

PDF PDF 2.65 MB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Materials Measurement: Phantoms - Application Brief
This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries.

Application Note 2014-07-17

PDF PDF 824 KB
Materials Measurement: Magnetic Materials - Application Brief
This application brief provides the solutions for measuring magnetic materials.

Application Note 2014-07-17

PDF PDF 1.08 MB
Materials Measurement: Dielectric Materials - Application Brief
This application brief provides the solutions for measuring dielectric materials.

Application Note 2014-07-17

PDF PDF 935 KB
Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Application Note 2014-06-30

PDF PDF 530 KB
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-06-24

PDF PDF 290 KB
E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

Application Note 2014-06-15

PDF PDF 40 KB
Spectrum Analysis and the Frequency Domain - Application Note
Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2014-06-13

PDF PDF 252 KB
Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2014-06-13

PDF PDF 205 KB
Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-06-06

PDF PDF 353 KB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2014-06-02

PDF PDF 1.59 MB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-05-28

IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

1 2 3 4 5 6 7 8 9 10 ... Next