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Press Releases | About Keysight
Keysight news and resources - Press Releases

Press Materials 2015-03-24

Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

Application Note 2015-03-24

PDF PDF 9.75 MB
N9071A and W9071A GSM/EDGE/EVO X-Series Measurement Application - Technical Overview
An overview of the GSM/EDGE/EVO (N/W9071A) X-Series measurement applications.

Technical Overview 2015-03-24

PDF PDF 3.94 MB
MIPI Design & Test - Brochure
Brochure shows how to anticipate design challenges with Keysight MIPI test solutions that promotes hardware and software standardization in mobile designs.

Brochure 2015-03-24

PDF PDF 6.16 MB
U2040XA Series Power Sensors with BenchVue Software Power Meter Application - Demo Guide
This demonstration guide explains how some of the most frequently-made measurements obtained using the Keysight Technologies, Inc. U2040XA Series power sensors can be analyzed using the Keysight BenchVue software Power Meter App.

Demo 2015-03-23

PDF PDF 2.99 MB
Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses - Brochure
Keysight's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

Application Note 2015-03-23

Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Application Note 2015-03-23

PDF PDF 5.80 MB
B2961A/B2962A 6.5 Digit Low Noise Power Source - Brochure
This document describes the benefits of using the B2961A/62A for precision low noise voltage/current sourcing with 6.5 digit, 100 nV/10 fA resolution.

Brochure 2015-03-23

PDF PDF 1.23 MB
Measure Parasitic Capacitance and Inductance Using TDR - White Paper
Time-domain reflectometry (TDR) is commonly used as a convenient method of determining the characteristic impedance of a transmission line or quantifiying reflections caused by discontinuities along or at the termination of a transmission line. TDR can also be used to measure quantities such as the input capacitiance of a voltage probe, the inductance of a jumper wire, the end-to-end capacitance of a resistor, or the effective loading of a PCI card.

Technical Overview 2015-03-23

PDF PDF 1.58 MB
E8257D PSG Microwave Analog Signal Generator - Data Sheet
This datasheet includes information on the E8257D PSG RF Analog Signal Generator.

Data Sheet 2015-03-23

PDF PDF 3.92 MB
Top 5 Reasons FieldFox is the Ideal Tool for Testing MW Cables and Cable Subsystems - Flyer
This two page flyer highlights the top 5 reasons FieldFox is ideal for testing microwave cables and cable subsystems in the field.

Brochure 2015-03-23

PDF PDF 1.52 MB
Extended Service Period Solution
Keysight’s knowledge and expertise provide three key benefits when it comes to per-incident services on products beyond their end-of-support date.

Brochure 2015-03-23

PDF PDF 505 KB
7500 STM Scanner - Data Sheet

Data Sheet 2015-03-23

PDF PDF 104 KB
E5071C-TDR Application Software Revision History

Release Notes 2015-03-23

PDF PDF 98 KB
33391C Microwave Insulator (Bead) Assembly - Data Sheet
This data sheet describes the 33391C Microwave Insulator Assembly. It includes product features, description and technical specifications as well as mechanical drawings and SWR chart.

Data Sheet 2015-03-23

PDF PDF 236 KB
SATA Stimulus Remote Setup Guide
This document describes the steps to setup the stimulus remotely for the N5411B SATA6G Compliance Test Software.

Demo 2015-03-23

PDF PDF 485 KB
SAS-3 Stimulus Remote Setup Guide
This document describes the steps to setup the stimulus remotely for the N5412D SAS-3 Compliance Test Software.

Demo 2015-03-23

PDF PDF 360 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Application Note 2015-03-22

PDF PDF 1.02 MB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Data Sheet 2015-03-22

B2900A Series Precision Source/Measure Unit - Brochure
This brochure introduces the superior performance and rapid measurement results of the B2900A series precision source/measure unit.

Brochure 2015-03-20

PDF PDF 1.68 MB
M8190A Arbitrary Waveform Generator - Configuration Guide
This document provides support to customers and field engineers when configuring the M8190A Arbitrary Waveform Generator for purchase.

Configuration Guide 2015-03-20

Technical Support Documents & Examples
A database of technical support documents, solutions, and examples written by support engineers.

Reference Guide 2015-03-20

Probing Solutions for Logic Analyzers - Data Sheet
A total overview of the probing solutions for logic analyzer applications. In addition, technical information is provided to help the customer understand how these probes are deployed.

Data Sheet 2015-03-20

E4982A LCR Meter, 1 MHz to 3 GHz - Configuration Guide
This configuration guide describes standard configurations, options, accessories and upgrades information for the E4982A RF LCR Meter.

Configuration Guide 2015-03-20

Signal Studio for Custom Modulation for N7608B Online Documentation (.chm file)
Downloadable online documentation that includes technical overview, release notes, tutorials, installation information, and more.

Help File 2015-03-20

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