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M8085A MIPI Receiver Test Solutions - Data Sheet
Datasheet for the M8085A plug in software for the M8070A Bit Error Ratio Test system software

Data Sheet 2015-10-19

PDF PDF 2.75 MB
Pulse Amplitude Modulation (PAM-4) Design and Test Solutions
View PAM-4 and PAM-N simulation, output/transmit, interconnect, and input/receive design and test solution examples.

Selection Guide 2015-10-10

Heidi Barnes Interview at PCB West 2015
Heidi Barnes talks with Sierra Circuits on signal integrity challenges when designing high-speed digital circuits on printed circuit boards (PCBs).

Demo 2015-10-08

Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

Press Materials 2015-10-08

U7236A/B 10GBASE-T and MGBASE-T Ethernet Electrical Conformance Application - Data Sheet
The U7236A 10GBASE-T Ethernet electrical conformance application for Infiniium oscilloscopes provides you with a fast and accurate way to verify and debug your 10GBASE-T Ethernet designs.

Data Sheet 2015-10-06

PAM-4 Simulation and Design of Next Generation High-Speed Digital Links
Brief overview of simulation solutions for PAM-4 electrical signaling.

Technical Overview 2015-09-17

Keysight EEsof EDA makes it easy to get back to school—at least virtually
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

Article 2015-09-11

Test Solutions for Greater Insight into Wireless Connectivity - Brochure
This WiCON brochure focuses on test solutions for WiMAXT, RFID, NFC, WLAN, Bluetooth®, UWB, ZigBee technologies.

Brochure 2015-09-01

PDF PDF 1.44 MB
Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

Press Materials 2015-08-20

Keysight EEsof EDA Premier Communications Design Software
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2015-08-19

PDF PDF 1.61 MB
PCI Express® Design and Test from Electrical to Protocol - Brochure
This brochure provides insight into how to thoroughly simulate, characterize and validate PCI Express Designs.

Brochure 2015-08-17

PDF PDF 4.78 MB
J-BERT N4903B High-Performance Serial BERT - Data Sheet
This is a data sheet discussing the Keysight Technologies J-BERT N4903B High-Performance Serial BERT.

Data Sheet 2015-08-11

DDR3 Memory Protocol Analysis and Compliance Verification – FuturePlus
Straightforward and reliable DDR3 DIMM bus analysis at 2400MT/s and DDR3 SO-DIMM analysis at 1867MT/s – FuturePlus System and Keysight

Solution Brief 2015-07-14

Challenges extend from simulation to compliance
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

Article 2015-07-08

DDR4 Protocol Analysis - FuturePlus
DDR4 Protocol Analysis from FuturePlus and Keysight.

Solution Brief 2015-06-30

DisplayPort 1.2 Link Layer Testing - FuturePlus
DisplayPort 1.2 Link Layer Testing Solution from FuturePlus and Keysight.

Solution Brief 2015-06-30

Asygn & Kalray use Keysight Simulation Tool Suite to Validate PCI Express® Gen3 Serial Links
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

Press Materials 2015-06-19

Keysight to Exhibit Latest PCI Express® Design, Test Solutions at PCI-SIG® Developers Conference
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

Press Materials 2015-06-16

One Size Does NOT Fit All - Application Note
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Application Note 2015-06-08

How to Design for Power Integrity: Finding Power Delivery Noise Problems
This video provides an understanding of how the voltage regulator module (VRM) interacts with the printed circuit board planes and decoupling capacitors within a power distribution network (PDN). A well designed PDN provides optimum system performance while a poorly matched designed PDN can result in poor system performance. In the extreme case, rogue waves can occur within the PDN generating much higher voltage noise levels than expected, potentially interfering with system performance or resulting in permanent damage. Recommendations for keeping the impedance flat are also provided.

How-To Video 2015-06-05

Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-06-05

PDF PDF 1.43 MB
Soft Touch Connectorless Logic Analyzer Probes - Application Notes

Application Note 2015-05-20

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

PDF PDF 2.22 MB
Ethernet 100BASE-TX Cable Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of 100BASE-TX Ethernet Cable Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-04-08

PDF PDF 1.90 MB
Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR

Application Note 2015-04-07

PDF PDF 2.12 MB

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