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Overcoming LTE-Advanced Test Challenges - Inter-Band Carrier Aggregation
This video will explain one of the major test challenges of demodulating the multiple component carriers simultaneously since the frequency band separation in inter-band aggregation is wider than the IF BW of any commercially available signal analyzer. Watch how Keysight addresses this test challenge with the 89600 VSA software along with dual X-Series signal analyzers or N7109A multi-channel signal analyzer.

How-To Video 2012-07-15

Deep Memory and Raw Data Views Give Unprecedented Insight into Demanding CSI-2/DSI Designs

Press Materials 2012-06-12

W1714 SystemVue AMI Modeling Kit / W1713 SystemVue SerDes Model Library
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

Data Sheet 2012-05-21

Agilent Technologies’ Advanced Design System Selected by ADATA to Speed Product Development
ADATA Technology Co., a provider of complete memory solutions in Taipei, Taiwan, has selected ADS software for developing memory modules for the high-speed digital market.

Press Materials 2012-05-15

Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

PDF PDF 6.46 MB
Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

Press Materials 2012-05-01

Test Solution Overview for SATA Cable Assembly & Phy Tx/Rx Impedance Compliance Tests
This describes how to use the Keysight E5071C ENA Network Analyzer Option TDR to make the measurements required per the Serial ATA specification rev 3.1 for cable assemblies.

Technical Overview 2012-04-23

PDF PDF 2.99 MB
N4880A Reference Clock Multiplier Data Sheet
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Data Sheet 2012-04-16

PDF PDF 3.31 MB
Oscilloscope Considerations for Multilane MIPI M-PHY Transmitter Validation
To help improve your electrical validation, there are a few considerations in choosing the oscilloscope to validate your multilane M-PHY designs.

Application Note 2012-04-09

PDF PDF 1.10 MB
Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.

Application Note 2012-04-06

PDF PDF 3.21 MB
LTE Digital and Analog Vector Modulation Debug
Watch this video to learn how to debug and validate the vector signal path in an LTE radio. A common analysis environment allows for both digital and analog/RF teams to evaluate the quality of key LTE signals. Both digital and analog signals are processed by the 89600 Vector Signal Analyzer (VSA) software where the constellation diagram, spectral content, and error vector magnitude can be observed and compared to SystemVue simulation results.

Demo 2012-03-27

USB 3.0 Protocol Testing with Active Error Insertion Application Note
Speed up design and verification of USB designs using the U4612A Jammer

Application Note 2012-03-19

PDF PDF 3.51 MB
Ethernet Controller Demo
Gain direct control of your ethernet controller by watching this short demo video.

Demo 2012-03-15

S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note
Discusses using de-embedding tools to gain virtual access to difficult measurement points

Application Note 2012-03-11

42 Mbps DC-HSDPA Throughput with the 8960
This video is a demonstration of the new E5515E measuring the maximum 42 Mbps throughput of a DC-HSDPA device in an environment that closely simulates real-world conditions

Demo 2012-03-05

MIMO OTA Two-Stage Method Using PXT and PXB
This video is a demonstration of testing the MIMO OTA performance of an LTE device using the two-stage method with Keysight Technologies' N5106A PXB and E6621A PXT. This method is efficient and cost-effective and can be used for multiple stages of test including design verification testing of antennas or devices on a lab bench. 3GPP and CTIA are currently evaluating this method to be added to LTE conformance testing.

Demo 2012-03-05

S-parameter Series: S-parameter Requirements for Oscilloscope De-Embedding Applications
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters

Application Note 2012-03-02

S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

MIPI M-PHY Automated Tx Test Demo
Watch a Keysight engineering expert demonstrate the new MIPI transmitter solution that is designed to perform MIPI M-Phy measurements automatically to help save you time. This demo uses a M-Phy Gear2 devices from Cosmic Circuits.

Demo 2012-02-21

Anticipate Multi-Standard Radio (MSR) Performance with Keysight SystemVue
As mobility carriers embrace 4G LTE technology, new equipment must co-exist with older 2G/3G standards. Multi-Standard Radio (MSR) testing characterizes these interactions, and is supported by a variety of Keysight test products. Keysight SystemVue, a system-level modeling environment for communications physical layer, enables R&D engineers to anticipate these interactions, achieve more robust system designs, then connect to Test to validate simulated performance using real hardware.

Demo 2012-02-18

6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
Maximizing DDR BGA probe Bandwidth for Superior Signal Fidelity
The use of BGA probes for probing DDR DRAM is becoming more popular and almost a requirement as memory design gets more complex and compact and data rate gets higher. DDR3 and DDR4 data rate is increasing from 800MT/s to possibly 3200MT/s.

Application Note 2012-01-31

PDF PDF 1.40 MB
Keysight EEsof EDA High Speed Digital Design Flow
This video shows the high speed digital design flow from Keysight that helps you cut through the challenges of today's multi-gigabit standards.

Demo 2012-01-31

Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note
Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Keysight's line of performance network analyzers (PNAs) focused on Software.

Application Note 2012-01-19

Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

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