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S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

N5412B Serial Attached SCSI-2 (SAS-2) Compliance Test Software for Infiniium 90000 Series Oscillosco
The N5412B SAS compliance test application provides a fast and easy way to test, debug and characterize your serial attached SCSI designs.

Data Sheet 2014-08-02

PDF PDF 4.08 MB
Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

Controlled Impedance Line Designer in ADS
The Controlled Impedance Line Designer in ADS enables signal integrity engineers to do pre-layout controlled impedance line design by optimizing the substrate stack up and the transmission line geometry.

Demo 2014-08-01

U7243A USB 3.0 Superspeed Electrical Performance Validation - Data Sheet
The USB 3.0 electrical test software allows you to automatically execute USB 3.0 electrical tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test

Data Sheet 2014-08-01

Practical Analysis of Backplane Vias - White Paper
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.

Case Study 2014-07-31

PDF PDF 4.57 MB
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Separating Read/Write Signals for DDR DRAM and Controller Validation - Application Note
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.

Application Note 2014-07-31

PDF PDF 805 KB
Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

High Speed Digital Design with Advanced Design System - Brochure
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.

Brochure 2014-07-31

PDF PDF 1.33 MB
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Keysight

Solution Brief 2014-04-29

10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
Certification of HDMI 2.0 Test Solution
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

HDMI Cable Testing - BitifEye
HDMI Cable Testing Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

USB Type-C Cable Testing - BitifEye
USB Type-C Cable Testing Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

Oscilloscope Probe Switching - BitifEye
Oscilloscope Probe Switching Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
ADS 2014 Dramatically Improves Design Productivity and Efficiency
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

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