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Momentum Overview
Overview video of Keysight Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.

Demo 2013-05-08

ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management

Press Materials 2013-05-07

N5393A PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet
Keysight Technologies N5393C PCI Express electrical performance validation and compliance software provides you with a fast and easy way to verify and debug your PCI Express designs for add-in cards and motherboard systems. The PCI Express electrical test software allows you to automatically execute PCI Express electrical checklist tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test.

Data Sheet 2013-05-07

Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2013-04-24

PDF PDF 2.02 MB
PCI Express® Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of PCI Express® Compliance Testing by using the Keysight E5071C ENA Option TDR.

Technical Overview 2013-04-24

PDF PDF 3.29 MB
MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 5.63 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 7.99 MB
Tips for Making Better Memory Measurements – Video Series
Videos that show customers how perform a comprehensive, unique and extensive analysis in less time.

Demo 2013-03-18

Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Press Materials 2013-03-12

MHL Cable Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of MHL (Mobile High-definition Link) Cable Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2013-02-22

PDF PDF 2.06 MB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Keysight Method of Implementation (MOI) for DisplayPort1.2b Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for DisplayPort 1.2b Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-18

PDF PDF 1.29 MB
DisplayPort 1.2b Cable-Connector Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of VESA DisplayPort 1.2b Cable & Connector Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2013-02-18

PDF PDF 2.26 MB
Keysight Method of Implementation (MOI) for MHL Cables Compliance Tests
Keysight Method of Implementation (MOI) for MHL Cable Compliance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-14

PDF PDF 1.76 MB
Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

Press Materials 2013-02-04

Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.

Press Materials 2013-01-29

DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
USB3.0 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of USB 3.0 cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2012-12-20

PDF PDF 2.27 MB
DDR Memory Design and Test Overview
Brief overview of Keysight solutions for DDR design and test.

Brochure 2012-12-19

PDF PDF 1.14 MB
DDR Memory Design and Test – A Better Way
Keysight offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.

Brochure 2012-12-19

PDF PDF 5.17 MB
Keysight Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2012-12-17

PDF PDF 1.82 MB
DDR Memory Overview, Development Cycle, and Challenges - Technical Overview
Thanks to improved manufacturing processes that have driven down costs, the technology of choice is now DDR SDRAM, short for Double Data Rate Synchronous Dynamic Random Access Memory.

Application Note 2012-12-14

PDF PDF 1.37 MB
Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links
Agilent introduces a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.

Press Materials 2012-11-05

Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.

Application Note 2012-11-01

PDF PDF 257 KB
Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2013, Oct. Oct. 28 & 29, at the DoubleTree by Hilton Hotel in San Jose, Calif

Press Materials 2012-10-28

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