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Discovering ADS
A collection of Keysight EEsof EDA ADS video demonstrations and tutorials

Demo 2014-10-28

Keysight to Demonstrate Hardware and Electronic Design Automation Software Solutions at EPEPS 2014
Keysight Technologies announces it will demonstrate its latest hardware and electronic design automation software solution releases at EPEPS 2014, Embassy Suites Portland, Portland, Oregon, Oct. 26-29. Keysight is a silver-level sponsor of the event.

Press Materials 2014-10-23

Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Design Challenges in DDR4 - The Keysight DDR Bus Simulator
This video is about design challenges in DDR4 and in particular the DDR Bus Simulator, which is a new Keysight EEsof EDA simulation tool for DDR4 and beyond.

Demo 2014-10-16

Keysight Technologies Demonstrates Simulation, Debug, Validation and Test Solutions at MemCon
Keysight announces it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15.

Press Materials 2014-10-13

MIPI™ Phy S-Param & Impedance Conformance Test - Test Solution Overview Using the ENA Option TDR

Technical Overview 2014-10-10

PDF PDF 3.58 MB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
HDMI Cable Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of High-Definition Multimedia Interface (HDMI) Cable Assembly Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-10-10

PDF PDF 3.59 MB
DDR Memory Test Solutions Overview
This video provides an overview of Keysight's DDR Memory test solutions, from simulation, transmitter compliance, protocol, and probing solutions.

Demo 2014-10-03

DDR Compliance Integration with Advanced Design System
The W2351EP DDR4 Compliance Test Bench helps solve the problem of simulation-measurement correlation.

Demo 2014-10-03

Keysight Introduces DDR Bus Simulator to Solve the Bit-Error-Rate Contour Simulation Challenge
Keysight Technologies introduces the DDR Bus Simulator; the industry’s first tool to generate accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification.

Press Materials 2014-09-30

High Speed Digital Design and Simulation Videos on YouTube
Keysight EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.

Demo 2014-08-06

Quick Start for Signal Integrity Design Using Advanced Design System (ADS) – Technical Overview
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

Technical Overview 2014-08-04

Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-08-04

PDF PDF 8.20 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-08-04

PDF PDF 1.88 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-08-04

PDF PDF 1.18 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-08-04

PDF PDF 2.84 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-08-04

PDF PDF 715 KB
Keysight EEsof EDA Customer Support - Brochure
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2014-08-03

PDF PDF 175 KB
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

EDA Support Services - Flyer
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2014-08-03

PDF PDF 454 KB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

RF and Microwave Industry-Ready Student Certification Program - Brochure
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

Brochure 2014-08-03

PDF PDF 562 KB
Keysight EEsof EDA Software and Modular Solutions for Universities
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2014-08-03

PDF PDF 1.44 MB
S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

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