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Agilent Technologies Wins Informa LTE North America Award
Moray Rumney, the lead technologist specializing in LTE at Agilent, has won the Informa LTE North America 2010 award for individual contribution to LTE development.

보도자료 2010-11-17

Digital Pre-Distortion and Hardware Verification using SystemVue
This application note reviews DPD concepts, modeling and extraction techniques, and direct interaction with test equipment to help you improve 4G/LTE component performance by up to 20dB.

어플리케이션 노트 2010-10-25

PDF PDF 2.08 MB
Agilent Technologies and Nomor Research GmbH Generate LTE Uplink Inter-cell Interference Signals
Agilent Technologies Inc. (NYSE: A) and Nomor Research GmbH today announced the availability of a simple, cost-effective method for generating realistic LTE uplink inter-cell interference signals using Agilent's MXG signal generators.

보도자료 2010-10-22

P-시리즈 파워 미터 실시간 원격 제어 비디오 데모
데모 비디오는 실제 어플리케이션 신호를 통해 P-시리즈 파워 미터 및 센서의 특징 및 기능을 보여줍니다. 이들 비디오는 Keysight VEE 런타임 프로그램을 작동하면서 P-시리즈의 다기능 연결을 사용하여 실시간 원격 제어를 위해 파워 미터를 제어하는 과정을 보여줍니다.

기본 데모 2010-10-19

8PSK Modulation Accuracy Measurement Graphics

특집 기사 2010-10-12

Agilent Technologies Now Supports Real-Time Fading with PXB and Wireless Communications Test Set
Agilent Technologies Inc. (NYSE: A) today introduced a real-time 2G/3G fading solution that features a direct digital connection between the N5106A PXB baseband generator and channel emulator and E5515C 8960 wireless communications test set.

보도자료 2010-09-28

YouTube Video: LTE Master and System Information Block Recovery
This is a demonstration of how the master information block and system information blocks can be recovered from the LTE downlink signal using the Keysight 89600 VSA signal analysis software.(YouTube video, 5:53min)

기본 데모 2010-09-24

LTE eNB Closed-loop Conformance Testing
This is a demonstration of how the Keysight N5106A PXB baseband generator and channel emulator, N7624B Signal Studio for LTE software, and N5182A MXG signal generator are configured for eNB closed-loop conformance test. (8.27min)

기본 데모 2010-09-24

Accounting for Antenna and MIMO Channel Effects Using SystemVue
This application note helps MIMO architects and system verifiers predict the effects of propagation and physical imperfections of 8x8 MIMO antennas on 4G system performance, before hardware prototypes are av.

어플리케이션 노트 2010-09-24

YouTube video: LTE 5MHz Downlink signal demonstrated on a Keysight VSA 89600
View an LTE downlink signal then watch it being demodulated and decoded for further analysis. (YouTube video, 5 min)

기본 데모 2010-09-24

Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.

보도자료 2010-09-15

Agilent Technologies Launches Measurement Applications, Expands LTE Leadership
Agilent Technologies Inc. (NYSE: A) today introduced eight new measurement applications for its PXA X-Series signal analyzer.

보도자료 2010-09-01

Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User
Agilent Technologies Inc. (NYSE: A) today announced the PXT Wireless Communications Test Set, a powerful, common hardware test platform for use across the LTE development lifecycle.

보도자료 2010-09-01

The MIMO Antenna: Unseen, Unloved, Untested!
Microwave Journal (August 2010) article (.pdf) written by Agilent’s Moray Rumney. With the shift of MIMO from theory to real world this article focuses on performance testing in real world conditions.

기사 2010-08-20

PDF PDF 693 KB
Measuring MIMO In LTE Tx And Rx Tests
Find the right combination of LTE test instruments and techniques to evaluate the performance of Long Term Evolution (LTE) components and systems under real-world conditions. A link to the MWJ article by Agilent.

기사 2010-08-18

Designing and Testing 3GPP W-CDMA Base Stations (Including Femtocells) - Application Note
W-CDMA is one of several wideband digital cellular technologies competing for the third-generation (3G) cellular market.

어플리케이션 노트 2010-08-01

Solutions for MIMO RF Test and Debug
Ensuring Quick and Accurate Four-Channel, Phase-Coherent MIMO Measurements

어플리케이션 노트 2010-07-14

PDF PDF 300 KB
Test your Femtocells Today
This photo card includes the key measurements required for femtocell designs as well as Keysight's portfolio of design and test solutions for femtocell technology.

브로셔 2010-07-01

PDF PDF 1.69 MB
E-UTRA Base Station Transmit ON/OFF Power Measurement
This application note describes the LTE TDD E-UTRA base station transmit ON/OFF power measurement-also known as the power-versus-time measurement- as provided in the N9082A LTE TDD measurement app.

어플리케이션 노트 2010-06-22

Agilent Technologies Supports Percello's Femtocell SoCs Test with Chipset Software
Agilent Technologies Inc. (NYSE: A) announced its N7309A chipset software now supports high-volume manufacturing test for Percello's Aquilo Femtocell System-on-a-Chip (SoC) product line.

보도자료 2010-06-16

Agilent Technologies Chipset Software Supports picoChip Femtocell Test
Agilent Technologies Inc. (NYSE: A) and picoChip today announced a high-volume manufacturing test solution for 3G femtocell products.

보도자료 2010-06-08

Solutions for Testing LTE FDD and TDD Performance
Ensuring Simpler, More Cost-Effective Conformance Testing of LTE Base Stations

어플리케이션 노트 2010-05-17

Solutions for Memory Effects in Microwave Components
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.

어플리케이션 노트 2010-05-13

Agilent Technologies Partners with Innowireless on LTE Test Solutions
Agilent Technologies Inc. (NYSE: A) today announced it has formed a strategic partnership with Innowireless Co., Ltd. to enhance the rapid development of LTE wireless test platforms.

보도자료 2010-05-05

Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010
Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010

보도자료 2010-05-04

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